Phase, elemental and chemical analysis
In studying planetary processes and makeup of the Earth, geologists routinely analyze the composition and molecular structure of rock and mineral samples. Long having been central tools in geological research, X-ray analytical techniques have become more powerful with small spot excitation, mapping, and standardless quantitative analysis. X-ray fluorescence (XRF) is the key technique for characterizing the element composition of geological materials. The latest generation of wavelength dispersive XRF instrumentation employs a small analyzing area and an XY-stage to automatically make multiple measurements of a sample to produce a chemical composition map. X-ray diffraction (XRD) is employed to quantitatively measure phase composition. Rietveld analysis of X-ray diffraction data is now recognized as the most powerful method available for quantitative crystalline phase analysis. Rigaku technology and expertise provide a number of unique solutions for these determinations.
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
A microfocus single crystal X-ray diffractometer configured with an HPC direct detection X-ray detector and either one or two microfocus X-ray sources.
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
A benchtop single crystal X-ray diffractometer with the latest technology HPC X-ray detector, ideal for self-service crystallography.
An upgradeable single crystal X-ray diffractometer for structural analysis of small molecule samples
A high performance single crystal rotating anode X-ray diffractometer with a low noise direct detection HPC X-ray detector.
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
User-inspired data collection and data processing software for small molecule and protein crystallography
Automated tool for performing in situ crystallography experiments on existing X-ray diffractometers
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High power, tube above, sequential WDXRF spectrometer
New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
High-speed, stationary sample microtomography of large samples
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
Compact, highly sensitive X-ray detector for single crystal applications
High-resolution benchtop microtomography of large samples
A bespoke single crystal X-ray diffractometer with custom enclosure and the flexibility to utilize both ports of a rotating anode X-ray source.