Skip to main content
ZSX Primus IV𝒾
Features
Assisted measurement and analysis support: ZSX Guidance
Automated analysis settings features enhanced third-generation SQX analysis software
ZSX Guidance software
Built-in XRF expertise handles sophisticated settings. Available application packages enable turn-key operations.
Intuitive software programmable for everyday analysis using sample trays
Sample ID settings for each tray (facilitates easy copy-and-paste for efficient measurement setup).
Improved accuracy of liquid sample analysis
Correction of geometry effect caused by geometry of liquid sample cups.
High-speed, high-precision measurements
Efficiency of the new drive sequence decreases instrument overhead time
Unique functionality
The tube-below optics enables convenient functionality, including new sample film corrections.

In addition to the application notes listed below, these new documents are available for request:

Tube-below sequential wavelength dispersive X-Ray fluorescence spectrometer

Uncompromised X-ray analysis of liquids, alloys, and plated metals

The tube-below high-performance model enables uncompromised analysis of samples such as liquids, alloys, and plated metals. Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus IV𝒾 WDXRF spectrometer features a 30 micron Be tube window, the thinnest standard tube window in the industry, for exceptional light element (low-Z) detection limits.

Vacuum (partition) system for analyzing liquids

Because the spectrometer chamber is always under vacuum, the change from vacuum atmosphere to helium atmosphere is completed in less than two minutes. Furthermore, the consumption of helium gas is significantly reduced compared to models where the spectrometer chamber must also be purged.

Improved throughput

Improved mechanics minimize the analysis dead time. For example, a 16-element sequential quantitative measurement time improved from 348 seconds to 287 seconds, representing an 18% increase in efficiency. 

D-MCA high-speed analysis

The Digital Multi-Channel Analyzer (D-MCA) system facilitates high-speed digital processing for high count rates for improved analytical precision and increased throughput speeds.

Optical system not easily impacted by sample surface height variations

An uneven sample surface causes variations in the distance between the sample and the X-ray tube. These differences can lead to changes in the X-ray intensity. Rigaku optical systems enable suppression of X-ray intensity changes caused by variation in distance. This enables accurate analysis by minimizing the impact of shape differences from fusion molds used in glass bead formulation and the impact of uneven sample surfaces during pressing of powder samples.

Point/mapping analysis

Equipped with a high-resolution camera that allows the user to zoom in on small features for proper identification and analysis. Enables accurate analysis by eliminating differences in sensitivity caused by measurement placement. Superior design uses the hot-spot of the tube to maximize intensity/sensitivity. 

Refined SQX analysis

SQX analysis is standardless FP analysis software for calculation of accurate elemental composition. Now easier to use than ever. 

Automated center wire cleaning mechanism

The F-PC detector center wire gradually becomes contaminated by proportional counter quench gas, which diminishes resolution. The center wire cleaning mechanism enables restoration of performance by eliminating center wire contamination by means of electrical heating, with no need to shut off the power source or to open the cabinet.


Learn more about our products at these events

Booth number Date Location Event website
Single Crystal Online Users’ Meeting - Online event Register Now!
ACS Fall 2020 - Virtual conference Website
The Rigaku XtaLAB mini II: A Way to Publish Great Structures with a Simple and Affordable Benchtop X-ray Diffractometer - Webinar Register Now!
Best Operating Practices for XRF users including the importance of sample preparation Webinar Register Now!
SPIE Optics & Photonics - Virtual event Website
NGAUS 2020 - Virtual conference Website
New England Narcotic Enforcement Officers Association Conference - Newport, RI Website
Forensic Sciences Exhibition - Taiwan
MS&T 2020 - Pittsburgh, PA Website
Forum Labo 609 - Lyon, France Website
FLORIAN 2020 - Dresden, Germany Website
ACS SERMACS 2020 - New Orleans, LA Website
X-Ray Computed Tomography For Materials And Life Science: Life Science Applications Webinar Register Now!
analytica 2020 431 - Munich, Germany Website
SEECAT Tokyo, Japan
ACS MWRM 2020 - Springfield, MO Website
AAPS PharmSci 360 2020 621 - New Orleans, LA Website
GSA 2020 - Online event Website
Japanese Association Forensic Science Conference Japan
PhysChem Forum Japan
Heliospir - Nantes, France
CBRNe Convergence 203 - Boston, MA Website
Volume Graphics User Group Meeting 2020 - Charlotte, NC Website
ASNT 2020 223 - Lake Buena Vista, FL Website
JASIS 2020 - Tokyo, Japan Website

Upcoming training sessions

Title Dates Cost Location Notes Course outline Registration form
Introduction to X-ray fluorescence spectroscopy (Europe) - Please contact ECOE@rigaku.com Neu-Isenburg, Germany Class outline Online registration form
Introduction to X-ray fluorescence spectroscopy (Europe) - Please contact ECOE@rigaku.com Neu-Isenburg, Germany Class outline Online registration form
X-ray fluorescence software and applications training (USA) - $4200 The Woodlands, TX USA Class outline Register now!
Introduction to X-ray fluorescence spectroscopy (Europe) - Please contact ECOE@rigaku.com Neu-Isenburg, Germany Class outline Online registration form