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XtaLAB Synergy-ED
  • Fully integrated electron diffractometer creating a seamless workflow from data collection to structure determination of three-dimensional molecular structures.
  • Improve your ability to investigate nanocrystalline samples due to the ability of electron diffraction to measure crystals that are only a few hundred nanometers or less in size.
  • No Sharing of instrument with microscopists because switching a microscope configuration between imaging and diffraction can be time consuming, making the sharing of an instrument sometimes difficult.
  • Any X-ray crystallographer will find intuitive to operate without having to become an expert in microscopy.


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Fully Integrated Electron Diffractometer

A system any X-ray crystallographer will find intuitive to operate


XtaLAB Synergy-ED


XtaLAB Synergy-ED is a new and fully integrated electron diffractometer, creating a seamless workflow from data collection to structure determination of three-dimensional molecular structures. The XtaLAB Synergy-ED is the result of an innovative collaboration to synergistically combine our core technologies: Rigaku’s high-speed, high-sensitivity photon-counting detector (HyPix-ED) and state-of-the-art instrument control and single crystal analysis software platform (CrysAlisPro for ED), and JEOL’s long-term expertise and market leadership in designing and producing transmission electron microscopes. The key feature of this product is that it provides researchers an integrated platform enabling easy access to electron crystallography. The XtaLAB Synergy-ED is a system any X-ray crystallographer will find intuitive to operate without having to become an expert in electron microscopy.

The XtaLAB Synergy-ED was designed to address the increasing need to investigate smaller and smaller samples in structural research. With X-ray crystallography, the smallest possible crystal dimension is 1 micron, and only then when utilizing the brightest X-ray sources and noise free detectors. However, in recent years, there has been an increasing need for the structure analysis of substances that only form microcrystals, crystals that are only a few hundred nanometers or less in size. In recent years, a new analytical method, MicroED, has been developed that uses electron diffraction on a TEM electron microscope to measure 3D molecular structures from nanocrystalline materials. Researchers developing this technique have relied on customized electron microscopes and a combination of microscopy software for measuring diffraction data, and public domain X-ray crystallography software for data processing and structure determination. Switching a microscope configuration between imaging and diffraction can be time-consuming, making the sharing of an instrument sometimes difficult.

To address these issues, Rigaku and JEOL started a collaboration to develop a dedicated single crystal structure analysis platform for nanocrystals utilizing key technologies from both companies. The result is the XtaLAB Synergy-ED, a dedicated electron diffractometer that is operated by the same control software that is used to run Rigaku’s X-ray diffractometers and includes a complete integrated pipeline from sample selection and diffraction measurement to data processing and structure solution. This instrument can easily be installed in an existing X-ray crystallography facility, where researchers and students will be able to easily master the MicroED technique since the software workflow is the same as for an X-ray diffractometer. Having such an instrument installed in an X-ray facility immediately provides structure determination for materials that only form nanocrystals.

Specifications and features
Product name XtaLAB Synergy-ED
Technique Single crystal electron diffraction
Core attributes Dedicated electron diffractometer with hybrid pixel array detector, rotation axis, and CrysAlisPro-ED, a complete integrated software platform.
Detector High-speed, high-sensitivity hybrid pixel array detector, HyPix-ED
Source Acceleration up to 200 kV
Goniometer Single rotation axis
Accessories Various low temperature devices
Computer External PC, MS Windows® OS

Application Notes

The following application notes are relevant to this product

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Papers published using the XtaLAB Synergy-ED

  1. Selective photoinduced charge separation in perylenediimide-pillar[5]arene rotaxanes, Nicholas Pearce, Katherine E. A. Reynolds, Surajit Kayal, Xue Z. Sun, E. Stephen Davies, Ferdinando Malagreca, Christian J. Schürmann, Sho Ito, Akihito Yamano, Stephen P. Argent, Michael W. George & Neil R. Champness, Nature Communications volume 13, Article number: 415 (2022)
    "Much to our surprise the electron diffraction experiment gave better quality data for our crystals than even the synchrotron X-ray. We were very pleased that electron diffraction gave such good data for such a complex molecule, and this allowed a much greater appreciation of the chemistry that we are studying."
  2. Na₂Ca₃S₂O₈ or γ-Na₂Ca₆Si₄O₁₅? A hybrid approach combining 3D single-crystal electron and powder X-ray diffraction, Volker Kahlenberg,Jonathan Vinke,Hannes Krüger,Sho Ito,Christian J. Schürmann,Journal of the American Ceramic Society, July 14, 2022.
    "Our investigation is an excellent example that 3D electron diffraction has transformed from an exotic technique for crystal-structure determination into an indispensable method for problems where small sizes of the crystallites is an issue."

  3. Structure Determination of Small Molecule Compounds by an Electron Diffractometer for 3D ED/MicroED, Ito, Sho, Fraser J. White, Eiji Okunishi, Yoshitaka Aoyama, Akihito Yamano, Hiroyasu Sato, Joseph D. Ferrara, Michał Jasnowski, and Mathias Meyer. CrystEngComm 23, no. 48 (2021): 8622–30.
    "Here, we present a diffractometer specifically designed for 3D ED/microED and show how it works for determining crystal structures."

  4. Synthesis and Characterization of a Calcium-Pyrazolonato Complex. Observation of In-Situ Desolvation During Micro-Electron Diffraction, Mies, Thomas, Christian Schürmann, Sho Ito, Andrew J. P. White, Mark R. Crimmin, and Anthony G. M. Barrett.. Zeitschrift Für Anorganische Und Allgemeine Chemie n/a, no. n/a (2022): e202200294.
    "These findings demonstrate that XRD and micro-ED methods can provide complementary data during structural determination, and that even electrophilic metals are susceptible to desolvation under micro-ED measurements."

  5. Isostructural Family of Rare-Earth MOFs Synthesized from 1,1,2,2-Tetrakis(4-Phosphonophenyl)Ethylene, Steinke, Felix, Tobias Otto, Sho Ito, Stephan Wöhlbrandt, and Norbert Stock. European Journal of Inorganic Chemistry n/a, no. n/a (n.d.): e202200562.
    "The crystal structure of Y-CAU-34 was solved from electron diffraction and thoroughly characterized by PXRD, TGA, EA, MIR, Raman and sorption measurements."

  6. Fine Pore-Structure Engineering by Ligand Conformational Control of Naphthalene Diimide-Based Semiconducting Porous Coordination Polymers for Efficient Chemiresistive Gas Sensing, Xue, Ziqian, Jia-Jia Zheng, Yusuke Nishiyama, Ming-Shui Yao, Yoshitaka Aoyama, Zeyu Fan, Ping Wang, et al. Angewandte Chemie International Edition n/a, no. n/a. Accessed 18 November 2022
    "Three conjugated PCPs (Co-pyNDI, Ni-pyNDI, and Zn-pyNDI) with varying pore structure and conductivity were obtained, whose crystal structures were determined by the three-dimensional electron diffraction technique."