NEX DE VS
Features
- Analyze ₁₁Na to ₉₂U non-destructively
- 1, 3 and 10 mm spot sizes, software selectable
- High resolution imaging for accurate sample positioning
- Powerful QuantEZ Windows®-based software
- Solids, liquids, alloys, powders and thin films
- 60 kV X-ray tube for wide elemental coverage
- Silicon drift detector for superior counting statistics
- Multiple automated tube filters for enhanced sensitivity
- Unmatched performance-to-price ratio
- Optional RPF-SQX fundamental parameters software
- Optional standardless fundamental parameters software
Variable spot size energy dispersive X-ray fluorescence (EDXRF) spectrometer
Elemental analysis of solids, liquids, powders, alloys and thin films
Specifications
Product name | NEX DE VS |
Technique | X-ray fluorescence (XRF) |
Benefit | Elemental analysis of solids, liquids, powders, alloys and thin films with a variable analysis spot size |
Technology | Energy dispersive XRF (EDXRF) using SDD detector with computer selectable collimation |
Core attributes | 12 W, 60 kV X-ray tube, SDD detector, analyze Na to U, variable spot (1,3 and 10 mm) |
Core options | He-flush, vacuum, autosampler, spinner (single position), FP |
Computer | External PC, MS Windows® OS , QuantEZ software |
Core dimensions | 356 (W) x 260 (H) x 351 (D) mm |
Mass | Approx. 27 kg (core unit) |
Power requirements | 1Ø, 100/220 VAC 50/60 Hz, 1.5 A |