Background
The MiniFlex can be equipped with the D/teX Ultra high-speed 1-dimensional detector to obtain greater intensity. By using this detector, it is possible to obtain intensity a few tens to roughly 100 times greater than with a scintillation counter, and this enables a dramatic shortening of measurement time. Fig. 1 shows the diffraction profiles obtained with a scintillation counter and the D/teX Ultra high-speed 1-dimensional detector. The D/teX Ultra detector measures data faster because it can measure a wide range of 2θ simultaneously with good angular resolution.
Investigation
Using the D/teX Ultra high-speed 1-dimensional detector is effective not only for rapid measurement, but also for detecting trace components. Fig. 2 shows the X-ray diffraction pattern and qualitative analysis results for a mineral sample, obtained in a measurement time of 1 minute. This enables qualitative analysis, with good sensitivity, and evaluation in an extremely short measurement time of mixed mineral samples with multiple components.
Apparatus condition:
MiniFlex600 (F.F tube 40 kV, 15 mA), Detector: D/teX Ultra, Slit conditions: DS = 1.25°, SS = 8 mm, RS = 13mm, Incident side and receiving side Soller slit: 5°, Incident height limiting slit = 10 mm
Measurement condition:
Scan range: 2θ = 10 ~ 70°, Step width: 0.02°, Scan speed: 80° / min. (about 1 min.)