A curved single crystal X-ray diffraction detector based on direct X-ray detection technology with a higher 2θ range compared to a flat detector.
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
XRF and optical metrology tool for blanket and patterned wafers; up to 300 mm wafers
Robotic sample changer to provide unattended data acquisition, enhanced productivity and standardized workflow to your research environment.
A new and fully integrated electron diffractometer for measuring submicron crystals, utilizing a seamless workflow from data collection to structure determination of crystal structures