A new and fully integrated electron diffractometer for measuring submicron crystals, utilizing a seamless workflow from data collection to structure determination of crystal structures
Analyze both ferrous and non-ferrous metal alloys
WDXRF ultralow chlorine analyzer
This versatile X-ray metrology tool enables high-throughput measurements on blanket wafers ranging from ultra-thin single-layer films to multilayer stacks for process development and film quality control.
A curved single crystal X-ray diffraction detector based on direct X-ray detection technology with a higher 2θ range compared to a flat detector.
Robotic sample changer to provide unattended data acquisition, enhanced productivity and standardized workflow to your research environment.
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
XRF and optical metrology tool for blanket and patterned wafers; up to 300 mm wafers