Skip to main content

Products from Rigaku

XRD products

Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods

2D X-ray detector with latest semiconductor technology designed for home lab diffractometers

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

High-performance, multi-purpose XRD system for applications ranging from R&D to quality control

WDXRF products

WDXRF ultra low sulfur analyzer for method ASTM D2622

Tube below, single element WDXRF analyzer for quality control applications

ASTM D2622 method WDXRF analyzer for sulfur (S) in petroleum fuels and ULSD

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

WDXRF spectrometer designed to handle very large and/or heavy samples

High power, tube above, sequential WDXRF spectrometer

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

EDXRF products

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

EDXRF spectrometer with powerful Windows® software and optional FP.

Scanning multi-element process coatings analyzers for web or coil applications

EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)

Raman products

Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.

 The original handheld 1064 nm Raman analyzer to expand incident response by identifying more chemical threats and narcotics

Narcotics-focused analyzer to identify the latest opioid and fentanyl formations

Improved ergonomics for more convenient identification and detection of chemical threats and narcotics – even in non-visible amounts - using the 1064 nm Raman advantage

Small molecule crystallography products

Automated crystal transport, orientation and retrieval robot

User-inspired data collection and data processing software for small molecule and protein crystallography

High-resolution X-ray detectors for X-ray diffractometers from DECTRIS

Extremely low noise, air-cooled X-ray detector based on direct X-ray detection technology.

A unique curved single crystal X-ray diffraction detector based on direct X-ray detection technology with the highest 2θ range at a single position available for the home lab.

Extremely low noise, compact, air-cooled X-ray detector based on direct X-ray detection technology.

The smallest detachable motorized goniometer head on the market

A benchtop single crystal X-ray diffractometer ideal for self-service crystallography and teaching.

A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.

A dual-wavelength, extremely high-flux, rotating anode X-ray diffractometer specifically configured for measuring difficult samples as well as providing versatility through multiple wavelengths.

A modern single crystal X-ray diffractometer for structural analysis of small molecule samples configured with microfocus sealed tube technology and a direct X-ray detection detector.

An extremely high-flux rotating anode X-ray diffractometer specifically configured for measuring difficult samples.

Our most popular diffractometer for chemical crystallography, configured with either single or dual microfocus sealed tube X-ray sources and an extremely low noise direct X-ray detection detector.

Protein crystallography products

A customized single crystal X-ray diffraction system that has the capabilities of utilizing both ports of a rotating anode X-ray source.

A microfocus sealed tube single crystal X-ray diffractometer that is low maintenance and perfect for screening and evaluating protein crystals.

A single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator and direct detection, HPC X-ray detector.

A versatile and high-flux dual-wavelength (DW) X-ray diffractometer with an HPC X-ray detector for multipurpose diffraction experiments

Single wavelength Confocal Max-Flux (CMF) optics for single crystal diffraction

Automated tool for performing in situ crystallography experiments on existing X-ray diffractometers

Small angle X-ray scattering (SAXS) Kratky camera system

User-inspired data collection and data processing software for small molecule and protein crystallography

A unique curved single crystal X-ray diffraction detector based on direct X-ray detection technology with the highest 2θ range at a single position available for the home lab.

Extremely low noise, air-cooled X-ray detector based on direct X-ray detection technology.

High-resolution X-ray detectors for X-ray diffractometers from DECTRIS

Automated crystal transport, orientation and retrieval robot

The smallest detachable motorized goniometer head on the market

X-ray imaging products

High-speed, stationary sample microtomography of large samples

High-resolution benchtop microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

LIBS products from Rigaku

Handheld laser induced breakdown (LIBS) spectrometer for fast and accurate alloy identification

Semiconductor metrology products

Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.

Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.

Trace elemental surface contamination metrology by TXRF; up to 300 mm wafers

Ultra-trace elemental surface contamination metrology by TXRF with VPD capability; up to 300 mm wafers

In-line, simultaneous WDXRF spectrometer for wafer metal film metrology; up to 300 mm wafers

Simultaneous WDXRF spectrometer for wafer metal film metrology; up to 200 mm wafers

Sequential WDXRF spectrometer for elemental analysis and thin-film metrology of large and/or heavy samples

Process XRR, XRF, and XRD metrology tool for blanket and patterned wafers; up to 300 mm wafers

XRF and optical metrology tool for blanket and patterned wafers; up to 300 mm wafers