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From teaching instrumental analysis to basic research

MiniFlex, the world’s first benchtop diffractometer for teaching this analytical technique, invented by Rigaku over 30 years ago, set the scene for today’s benchtop solution family. The MiniFlex benchtop XRD has evolved over the past three decades into a highly versatile and well-established multi-purpose diffractometer for R&D and industry. Based on this success Rigaku now offers a range of benchtop X-ray instruments, providing affordable and easy-to-use solutions for small molecule single crystal diffraction, general purpose X-ray diffraction (XRD) and X-ray fluorescence (XRF). The latest additions are benchtop CT (computed tomography), TXRF (total reflection XRF) and SAXS (Small angle X-ray scattering) instruments that are perfect for university research and teaching.

Beyond benchtop instrumentation, Rigaku also manufactures a portfolio of handheld products based on Raman spectroscopy. The Rigaku family of handheld analyzers provide fast and accurate identification of various materials—including pharmaceuticals, chemicals, narcotics and explosives.

Rigaku recommends the following systems:


Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders


New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance


Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.

A cost-effective solution for departments looking for targeted chemical threat analysis

Offers features and benefits that maximize chemical threat analysis in safety and security applications

Provides presumptive identification of narcotics, precursor chemicals, and cutting agents

Single crystal

A benchtop single crystal X-ray diffractometer ideal for chemical crystallography and teaching.


Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

Variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

EDXRF spectrometer with powerful Windows® software and optional FP.

High-performance, Cartesian-geometry EDXRF elemental analyzers for measuringes Na to U in solids, liquids, powders and thin films

X-ray CT

High-speed, stationary sample microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

High-resolution benchtop microtomography of large samples