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SmartLab SE
Features
  • SmartLab Studio II software based on a new architecturally integrated modular platform
  • Cross-beam optics module switches between Bragg-Brentano and parallel beam without the need to change optics.
  • HyPix-400 2D detector enables seamless switch between 0D, 1D and 2D detection mode depending on application type.
  • D/teX Ultra 250 1D detector accelerates powder diffraction by a factor of 250 in speed and provides adjustable energy resolution of approximately 20% or 4% depending on sample type.
  • Integrated intelligent Guidance software enables fully automated measurement including optics and sample alignment.
  • Self-aligned optics maximize instrument uptime and minimize cost of ownership.

SmartLabStudio II – Automation
SmartLabStudio II – Audit Trail

Multipurpose X-ray diffraction system with built-in intelligent Guidance

Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments

The SmartLab® SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD).

Guidance expert system

SmartLab Studio II incorporates a built-in Guidance expert system that suggests the optimal hardware configuration and settings for specific application measurements. The software will determine which optics are most appropriate for a given application, determine the instrument settings and execute the measurement, delivering a completely automated measurement sequence. Since the SmartLab SE has built-in component recognition, Guidance will not only tell you how you should configure the SmartLab SE for a given measurement, it will also warn you if you have not configured it properly. Expert advice coupled with hardware that will confirm the correct configuration is the foundation of the SmartLab SE platform.

HyPix-400: next generation 2D detector

With the SmartLab SE, Rigaku introduces the available HyPix-400, a semiconductor hybrid pixel array detector that was specifically designed for multipurpose X-ray diffractometers. Its large active area, high angular resolution and ultra-high dynamic range make it the perfect, affordable, 2D detector solution for a large variety of applications, including powder and thin film diffraction. Please note that the D/teX Ultra 250 silicon strip detector is also available as a standard detector choice if desired.

Automatic alignment for maximized uptime

Changing hardware configurations or consumables on some diffractometers is so daunting that people often invite their service engineer to perform the task. This can be costly and time consuming. The optics configuration on the SmartLab SE is self-aligning. From the tube height to the monochromator alignment, all of the optical alignment is done automatically under computer control. This feature drastically reduces down time and cost of ownership of the instrument, and it allows you to be confident that your instrument will always be in an aligned condition.

Specifications
Product name SmartLab SE
Technique X-ray diffraction
Benefit Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments
Technology Multipurpose θ-θ X-ray diffractometer with built-in intelligent Guidance
Core attributes 3 kW sealed X-ray tube, D/teX Ultra 250 silicon strip detector, vertical type θ-θ geometry
Core options HyPix-400 (2D HPAD) detector
Computer External PC, MS Windows® OS, SmartLab Studio II software
Core dimensions 1270 (W) x 1880 (H) x 1220 (D) mm
Mass Approx. 800 kg (core unit)
Power requirements 3Ø, 200 VAC 50/60 Hz 30 A or 1Ø, 220-230 VAC 50/60 Hz 40 A,

Video for SmartLab SE

Options and Accessories

The following accessories are available for this product
D/teX Ultra 250

The D/tex Ultra 250 is a 1D silicon strip detector that decreases data acquisition time by almost 50% compared to competitive detectors. This is achieved by increasing the active area of the aperture and thus increasing the count rate. Compared to the previous model, the D/teX Ultra, has a smaller pixel pitch (0.075mm) and is longer in the direction of 2θ. For researchers who are interested in the lowest XRF suppression possible, the combination of an optional receiving monochromator and low-enrgy discrimination offer outstanding suppression.

Simultaneous XRD and DSC

Simultaneous collection of XRD and DSC data eliminates the uncertainty of separate measurements. With the addition of a humidity generator, the XRD-DSC system provides the ability to study crystalline-amorphous and amorphous-amorphous changes at constant temperature and variable humidity or variable humidity at constant temperature.

  • Enables simultaneous characterization of dehydration, polymorphic phase transitions, melting, crystallization, and decomposition of geological samples
  • Distinguishes exothermic and endothermic reactions and provides their enthalpies and temperatures
  • Probes the effects of temperature history and heat treatment on structural and thermal properties
  • Requires only milligrams of sample
  • Humidity attachment for hydration studies
D/teX Ultra 250 HE

The D/teX Ultra 250 HE is a special silicon strip detector that is optimized for high energy X-ray work by utilizing a thicker detector material. For Cr, Fe, Co, and Cu, the efficiency is approximately 99%. With Mo radiation the efficiency is approximately 70%.

Anton Paar TTK 600 Low Temperature Chamber

The TTK 600 Low-Temperature Chamber is a non-ambient attachment for powder X-ray diffraction studies from -190°C to 600°C. Different sample holders allow investigating samples in reflection and transmission geometry. Samples can be measured in vacuum, air or inert gases. An antechamber option allows safe transfer of air-sensitive samples into the TTK 600.

The TTK 600 fits to all common powder diffractometers and is the instrument of choice for X-ray structure analysis of various sample types at low and medium temperatures.

  • Non-ambient attachment for X-ray diffraction studies from -190 °C to 600 °C
  • For investigations on samples in reflection and transmission geometry
  • Also for air-sensitive samples and in-operando studies on batteries
  • Fits to all common powder diffractometers
HyPix-3000 Hybrid Pixel Array Detector

2D semiconductor detector with large active area (approx. 3000 mm²), small pixel size (100 μm²), ultra-high dynamic range, high sensitivity, and XRF suppression by high and low energy discrimination. Seamless switching from 2D-TDI (Time Delay and Integration) mode to 2D snapshot mode to 1D-TDI mode to 0D mode with a single detector.

Anton Paar HTK 2000N High-Temperature Chamber

High-temperature sample heating stage with strip heater for powder XRD of refractory materials. The use of a tungsten strip offers extremely high temperature and fast heating and cooling, the strip pre-stressing mechanism ensures high sample position stability.

Temperature range:

with W-strip: 25 °C to 2300 °C in vacuum
with Pt -strip: 25 °C to 1600 °C in air, vacuum

Atmospheres: vacuum(10⁻⁴ mbar), inert gas, air

Anton Paar HTK 16N High-Temperature Chamber

High-temperature sample heating stage with strip heater for powder diffraction. Allows for very fast heating and cooling and ensures high sample position stability with heating strip pre-stressing.

Temperature range:

with Pt-strip: 25 °C to 1600 °C in air, vacuum
with Ta and C-strip: 25 °C to 1500 °C in vacuum

Atmospheres: air, inert gas, vacuum(10⁻⁴ mbar)

Anton Paar DHS 1100 Domed Hot Stage

Sample heating stage with spherical X-ray window for in-situ texture and thin film analysis. Compact and light-weight stage with air-cooling.

Temperature range: 25 °C to 1100°C

Atmospheres: air, inert gas, vacuum(10⁻¹ mbar)

Anton Paar HTK 1200N High-Temperature Oven Chamber

High-temperature heating stage for powders and polycrystalline solid samples. Heating to 1200 °C in air and vacuum possible.

Main features:

  • furnace heater for good temperature uniformity
  • sample spinning for good data quality
  • capillary option for transmission XRD
  • easy sample loading

Temperature range: 25 °C to 1200 °C

Atmospheres: air, inert gas, vacuum(10⁻⁴ mbar)

Anton Paar DCS 350 Domed Cooling Stage

Sample cooling and heating stage with spherical X-ray window for in-situ texture and thin film analysis. Compact and light-weight stage with liquid nitrogen sample cooling.

Temperature range: -100 °C to 350 °C

Atmospheres: air, inert gas, vacuum(10⁻¹ mbar)

Secondary Monochromator

The optional secondary monochromator can be used with the D/teX Ultra 250 silicon strip detector for outstanding energy resolution. If the D/teX Ultra 250 is used in conjunction with the secondary monochromator an energy resolution of 320 eV is achieved, or 4% with CuKα.

Upcoming training sessions