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Petroleum and petrochemicals

Petroleum and petrochemicals

Rigaku makes X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation for material characterization and element analysis at every stage of the exploration, production and distribution process, such as for sulfur analysis and other elements in crude oil and fuels. Rigaku instruments comply with the relevant measurement protocols, including ASTM D2622, D7220, D4294, and IP 532, as well as EN ISO 8754 & 20847. The Rigaku NEX XT process analyzer is used for on-line measurement of sulfur for pipeline, blending and upgrading, as well as bunker fuel blending for MARPOL compliance and additive packages for lubricating oils.

Application Notes

The following application notes are relevant to this industry

EDXRF

WDXRF

XRD

X-ray topography (XRT)

Process

WDXRF, XRF

Rigaku recommends the following systems:


WDXRF

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

WDXRF ultra low sulfur analyzer for method ASTM D2622

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

WDXRF ultralow chlorine analyzer

Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples

XRD

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

EDXRF

Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

Variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

EDXRF spectrometer with powerful Windows® software and optional FP.

High-performance, Cartesian-geometry EDXRF elemental analyzers for measuringes Na to U in solids, liquids, powders and thin films

X-ray CT

High-speed, stationary sample microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

High-resolution benchtop microtomography of large samples

Process

Process sulfur analysis by X-ray transmission (X-ray absorption)

EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)