MiniFlex XpC
Compact X-ray Diffractometer
Advanced quality control system
In a move to bring lab-quality performance to the manufacturing floor, Rigaku introduces the MiniFlex XpC, a manufacturing-optimized powder diffractometer for fast and accurate quality control measurements. It is extremely easy to operate using Rigaku’s new EasyX quality control software, which requires minimal clicks to run. A minimal interface means there will be no accidental error variance from operator to operator. The MiniFlex XpC can be configured with a conveyor belt or robot for automated sample processing and collaboration with other instruments. With an 800 W X-ray source and a short-diameter goniometer, the system has the performance of a lab unit, and thus can greatly improve throughput for quality control measurements.
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MiniFlex XpC Overview
New sample loading mechanism
The optimal loading mechanism for quality control allows the operator to easily place the sample without opening the instrument door. This system also supports online measurement using a transfer robot. Workers can easily place samples not only online but also offline. A newly designed sample spinner can be used with a variety of sample holders.
Highly durable and highly accurate horizontal goniometer suitable for quality control
Using the technology cultivated with SmartLab, we have developed a new, durable, compact horizontal sample goniometer that is optimal for quality control.
New, compact, high-output X-ray generator
The MiniFlex XpC features a compact molded ceramic X-ray tube. The generator for the X-ray source has also been improved, enabling a high output of 800 W while being almost the same size as the 600 W generator of the MiniFlex desktop X-ray diffractometer.
High-resolution, high-speed one-dimensional detector boasting a wide detection area
The D/teX Ultra250 has a detection area 1.5 times larger than the D/teX Ultra2 used in the desktop MiniFlex, achieving higher-intensity measurement data. Therefore, measurement time can be reduced.
EasyX software for screening and quality control
Simple measurement, automatic analysis, display of results and pass/fail judgment are possible with this software, so even those who are unfamiliar with analysis can use it with confidence. In addition, the trend graph creation function makes it possible to visualize the results and tangible changes in the device status.
Automation support
The MiniFlex XpC can be connected to automation equipment by combining with a robot arm or a conveyor belt (both optional). Industry standard sample holders (steel rings) are supported as standard. This apparatus achieves the world’s smallest footprint for an online diffractometer (approx. 1 m²).
MiniFlex XpC Features
Rigaku provides X-ray diffractometers for quality control developed using the X-ray diffractometer technology cultivated for research and development over many years. It is easy for anyone to use and stable analysis results can be obtained regardless of the operator, so there is no difference in the results between operators. Work efficiency can be improved using the sample loading mechanism and D/teX Ultra250 detector.
- Touch panel operation
- Runs within 3 taps from measurement to data analysis
- Based on SmartLab Studio II
- Languages: Japanese, English, Chinese
MiniFlex XpC Videos
MiniFlex XpC Specifications
| Technique | X-ray diffraction (XRD) | |
|---|---|---|
| Application benefit | Compact X-ray diffractometer for quality control | |
| Technology | θ-θ X-ray diffractometer equipped with screening/quality control software EasyX | |
| Attributes | Compact X-ray tube Compact sample horizontal goniometer D/teX Ultra250 high-resolution, high-speed 1D X-ray detector |
|
| Computer | Windows 10 Pro 64-bit Touch panel display (Can be combined with external PC) |
|
| Dimensions | 700 (W) x 1490 (H) x 890 (D) mm (core unit) | |
| Mass | Approx. 250 kg (core unit) | |
| Power requirements | 1φ, 200-230 V 50/60 Hz, 6.5A | |
MiniFlex XpC Application Notes
The following application notes are relevant to this product
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BATT1003 - Management of Graphitization Degree for Graphite Anode Material
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BATT1002 - Lattice Constant and Crystallite Diameter Management for NCM Cathode Material
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XRD1161 - MiniFlex XpC for Clinker Application
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XRD1160 - Fast Analysis of Mineralogical Phases in Blended Cements using Miniflex XpC
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XRD1003 - How to Evaluate Solid Pharmaceutical Drugs (3): Confirming Hydrates
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XRD1002 - How to Evaluate Solid Pharmaceutical Drugs (2): Confirming the Presence/absence of Amorphous Substances
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XRD1001 - How to Evaluate Solid Pharmaceutical Drugs (1): Confirming the crystal form of an API
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B-XRD1149 - Evaluation of Barium Titanate Polymorphs by Rietveld Analysis
MiniFlex XpC Resources
Webinars
| Component Analysis and Standardless Quantitative Analysis for Pharmaceutical Applications | Watch the Recording |
| Powder X-ray Diffraction (XRD) for Pharmaceuticals | Watch the Recording |
| Dissolution Rate Enchancement of Poorly Water Soluble Drugs - Role in XRPD in the Pharmaceutical Formaulation Development | Watch the Recording |
| On the Diffraction Line Profiles in the Rietveld Method | Watch the Recording |
| Introduction of Part 11 Compliant Features in SmartLab Studio II | Watch the Recording |
Rigaku Journal articles
 Compact X-ray Diffractometer MiniFlex XpC |
Read the Article |
| Quantification analysis of cement materials |
Read the Article |
MiniFlex XpC Events
Learn more about our products at these events
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EventDatesLocationEvent website
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33rd International Materials Research Congress (IMRC2025)August 16 2025 - August 20 2025Cancún, Mexico
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AIC 2025 congressSeptember 1 2025 - September 4 2025Florence Italy
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FEMS Euromat 2025September 13 2025 - September 17 2025Granada, Spain
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EMRS Fall meeting 2025September 14 2025 - September 17 2025Warsaw, Poland
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EuroMOF 2025September 20 2025 - September 23 2025Crete, Greece
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Analitica Latin AmericaSeptember 22 2025 - September 24 2025São Paulo, Brazil
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Gulf Coast Conference 2025October 13 2025 - October 14 2025Galveston, TX, United States
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ICMM 2025 2025October 26 2025 - October 30 2025Bordeaux, France
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Rayons X et Matière 2025November 17 2025 - November 20 2025Orleans, France
Contact Us
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