XSPA-400 ER
High energy resolution
In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
Seamless multidimensional pixel detector
Since it supports 0, 1, and 2 dimensions, it is possible to obtain general X-ray diffraction patterns and shape measurements of Debye Scherrer rings, making it possible to measure a wide range of samples, from powders and bulk materials to thin films. In addition, the seamless detector eliminates the need for an IC boundary correction because all pixels have the same shape, allowing a uniform image to be obtained.
High linear coefficient and wide dynamic range
Observations from low to high intensities are possible while maintaining high energy resolution.
Filterless Kβ measurements
Taking advantage of the high energy resolution feature, measurement without a Kβ filter is also possible.
High utility utilizing detection area
The detector orientation can be easily switched on its pedestal, making it possible to select between modes with priority given to intensity or angular resolution.
