Evaluation of crystal quality (tilt and twist widths) of group-III nitride film by the rocking curve method AppNote B-XRD2001: Evaluation of crystal quality (tilt and twist widths) of group-III nitride film by the rocking curve method
Crystal orientation evaluation of epitaxial film and ultra-thin buffer layers by in-plane reciprocal space mapping AppNote B-XRD2006: Crystal orientation evaluation of epitaxial film and ultra-thin buffer layers by in-plane reciprocal space mapping
High speed RSM of a III-nitride epitaxial film by 1D detection mode AppNote XRD2024: High speed RSM of a III-nitride epitaxial film by 1D detection mode
Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM AppNote B-XRD2026: Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM
Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM AppNote B-XRD2026: Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM
Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM AppNote B-XRD2026: Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM