Nanoscale X-ray structural characterization instrument: NANOPIX
SAXS (Small Angle X-ray Scattering) is a powerful tool for nano-scale structural analysis covering a broad range of applications from research and development to quality...
SAXS (Small Angle X-ray Scattering) is a powerful tool for nano-scale structural analysis covering a broad range of applications from research and development to quality...
TXRF spectrometers are widely used as evaluation instruments for measuring contamination in the semiconductor fabrication process. This is mainly because the TXRF technique allows non-destructive...
String cheese, which has a texture similar to that of jerky, the taste of fresh cheese, and strands that can be split apart, is a...
Total Reflection X-ray Fluorescence (TXRF) analysis is a non-destructive and surface-sensitive analysis method using X-rays, in which incident X-rays are irradiated on a sample at...
Three-dimensional real-space modeling for hierarchical materials by matching experimental and simulated small-angle X-ray scattering patterns is proposed. The positional arrangements of small primary particles in...