SAXS (Small Angle X-ray Scattering) is a powerful tool for nano-scale structural analysis covering a broad range of applications from research and development to quality control. The technique targets a broad range of materials, from periodic and non-periodic structures including solid, liquid, liquid crystal and gels to research in advanced functional materials such as carbon fiber reinforced plastics (CFRP), nano-particle (NP) sizing, and coarse-structure analysis of macromolecules. Advanced functional materials, used increasingly in today’s nanotechnology-focused research, have nanoscale fine structural features that must be well-controlled. SAXS measurement and analysis is used for atomic and molecular-scale structure evaluations, but it can also be used for measurement of diffuse scattering caused from boundaries of electron density inhomogeneity. In the case of a periodic structure having 10 nm spacing, a diffraction peak is observed around 0.4 degrees in two theta using copper Kα emission line (λ＝0.15418 nm). This is an example of small angle scattering, or scattering which occurs at lower angles—typically less than 5 degrees.
Rigaku’s new product, NANOPIX, gets its name from “Nano Particle Inspection by X-rays”. It is optimized for SAXS measurement such as scattering occurs at low scattering angles. Moreover, It has been developed for not only the SAXS but also the atomic-scale structures that are in higher scattering angles around 20–30 degrees. Including both SAXS and WAXS, this new instrument is developed for multi-scale structure analysis of materials which have hierarchical structures.