Nanoscale X-ray structural characterization instrument: NANOPIX
SAXS (Small Angle X-ray Scattering) is a powerful tool for nano-scale structural analysis covering a broad range of applications from research and development to quality...
SAXS (Small Angle X-ray Scattering) is a powerful tool for nano-scale structural analysis covering a broad range of applications from research and development to quality...
In modern society where our daily environment is supported by various electronic devices, it is critical to pursue opto-electronic or power-electronic devices with less environment...
Although high-resolution X-ray diffraction (HR-XRD) has been commonly employed for the crystallinity characterization of GaN-related materials, special care is required due to the complexities resulting...
Solid drugs taken orally are mixtures of active pharmaceutical ingredients (hereinafter referred to as “API”); agents such as excipients added as binders or diluents; and lubricants...
High-voltage and high-efficiency power devices are in strong demand as a way of decreasing energy consumption in a wide range of industrial and consumer products...
TXRF spectrometers are widely used as evaluation instruments for measuring contamination in the semiconductor fabrication process. This is mainly because the TXRF technique allows non-destructive...
Due to the recent development of fundamental technologies of X-ray generators and detectors, such as X-ray focusing optics and area detectors, the size of the...
Total reflection X-ray fluorescence (TXRF) spectrometry is widely used in semiconductor manufacturing processes for nondestructive analyses of metallic contamination on wafer surfaces. Sensitivity requirements for...
We have been making a series of papers for thin-film analysis techniques for characterization of crystalline qualities and crystal structures using High Resolution XRD (HR-XRD)...
String cheese, which has a texture similar to that of jerky, the taste of fresh cheese, and strands that can be split apart, is a...