General features of GaN-related materials
In modern society where our daily environment is supported by various electronic devices, it is critical to pursue opto-electronic or power-electronic devices with less environment...
In modern society where our daily environment is supported by various electronic devices, it is critical to pursue opto-electronic or power-electronic devices with less environment...
Although high-resolution X-ray diffraction (HR-XRD) has been commonly employed for the crystallinity characterization of GaN-related materials, special care is required due to the complexities resulting...
High-voltage and high-efficiency power devices are in strong demand as a way of decreasing energy consumption in a wide range of industrial and consumer products...
TXRF spectrometers are widely used as evaluation instruments for measuring contamination in the semiconductor fabrication process. This is mainly because the TXRF technique allows non-destructive...
Due to the recent development of fundamental technologies of X-ray generators and detectors, such as X-ray focusing optics and area detectors, the size of the...
Total reflection X-ray fluorescence (TXRF) spectrometry is widely used in semiconductor manufacturing processes for nondestructive analyses of metallic contamination on wafer surfaces. Sensitivity requirements for...
The MiniFlex II benchtop XRD system is widely used in a variety of fields. Its small size, high angular performance and dependable design lend it...
In X-ray powder diffraction analysis, obtaining high resolution and high intensity diffraction data leads to the improved accuracy of analyses based on that data, such...
Recently, there are a very large number of electric devices developed in the high-tech industry. Semiconductor material is one of the basic components for these...
It is necessary to obtain high-quality data for highly accurate analysis. The characteristics of high-quality data may be high intensity, high resolution, high P/B (peak-to-background...