The development of new functional thin films and the fabrication of functional devices using these materials are the outgrowth of emerging demands for high efficiency, energy-saving, lightweight devices to further the pursuit of comfort and convenience in daily life. The “Smartphone” is a typical example, where numerous functional thin film...
Stress analysis using X-ray diffraction is a well-known, effective technique for nondestructive evaluation of residual stresses in the surface of materials. Among X-ray stress analyses, the sin2 ψ method is the most widely used and very common, especially in the industrial field. In this method, residual stress is calculated by assuming...
In order to elucidate various biological phenomena occurring in vivo, it is essential to determine the structure of proteins. This article will focus on expression of proteins for X-ray analysis.
For performing structure analysis, the first challenge is to establish an expression system. Structure analysis requires large amounts of proteins...
Total Reflection X-ray Fluorescence (TXRF) is a method that can be used for high sensitive elemental analysis on solid sample surface, and has been widely used for detecting contamination on wafer to improve fabrication process yield in the semiconductor industry. On the other hand, there has been increasing need for...
Sample preparation methods for X-ray fluorescence analysis (XRF) featuring powder samples were discussed in the previous issues. Preparation of metal samples is introduced in this issue. XRF is superior to ICP and optical emission spectroscopy in reproducibility. However most of analysis errors in XRF can be caused by nature of...
SAXS (Small Angle X-ray Scattering) is a powerful tool for nano-scale structural analysis covering a broad range of applications from research and development to quality control. The technique targets a broad range of materials, from periodic and non-periodic structures including solid, liquid, liquid crystal and gels to research in advanced...
With your success utmost in our minds, the XtaLAB Synergy has been developed for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy produces fast, precise data in an intelligent fashion.
EasyX is an easy to use software package for completely integrated measurement and analysis of X-ray diffraction data. Crystalline phases can be automatically measured, identified, and quantified in just three clicks. EasyX is well suited for the analysis of industrial materials in the laboratory and on the production floor. It...
Rigaku Oxford Diffraction single’s crystal diffraction systems are controlled with the user-inspired CrysAlisPro software. CrysAlisPro integrates and interfaces seamlessly with not only our own equipment but also with third party data collected on other diffraction systems. It delivers precise system control and superior X-ray data quality and analysis.
A scientific discipline, which investigates crystal structures by means of the X-ray diffraction method, is called X-ray crystallography or simply crystallography. It originated in a discovery of the phenomena that X-rays are diffracted by crystals, and it has a history of more than one hundred years. Various analytical techniques based...
