High-throughput, high-resolution X-ray topography imaging system: XRTmicron
The XRTmicron is a topography measurement system which can reduce measurement time by one order of magnitude compared to previous systems by using a new...
The XRTmicron is a topography measurement system which can reduce measurement time by one order of magnitude compared to previous systems by using a new...
X-ray topography is a powerful technique for evaluating crystal defects such as dislocations, stacking faults, scratches, and so on. High–performance electronics devices such as microprocessors...
Ultima IV is an advanced and versatile X-ray diffraction system equipped with a precision-engineering horizontal- sample X-ray diffractometer together with a conventional X-ray generator and...
For more than 50 years, X-ray topography (XRT) has been an indispensable industrial and research tool for crystal growth of functional materials, since crystalline defects...
One of the major technical challenges of this decade are energy efficient technologies, which is among others, comparable in its importance to Artificial Intelligence, 5G...
An essential feature of the qualitative analysis of the powder X-ray diffraction (PXRD) method is that this provides information on the sample’s crystal structure, which often...
Abstract
Rigaku launched a high-speed X-ray topography system with the improved throughput of 10–20 wafers/hour (3–6 min/wafer). High-speed image acquisition is achieved using an uncollimated...