High-throughput, high-resolution X-ray topography imaging system: XRTmicron
The XRTmicron is a topography measurement system which can reduce measurement time by one order of magnitude compared to previous systems by using a new...
The XRTmicron is a topography measurement system which can reduce measurement time by one order of magnitude compared to previous systems by using a new...
X-ray topography is a powerful technique for evaluating crystal defects such as dislocations, stacking faults, scratches, and so on. High–performance electronics devices such as microprocessors...
For more than 50 years, X-ray topography (XRT) has been an indispensable industrial and research tool for crystal growth of functional materials, since crystalline defects...
In powder X-ray diffraction (XRD) measurements, the measurement mode (0D, 1D, 2D) and optical system are selected to suit the state of the sample and the purpose of...
One of the major technical challenges of this decade are energy efficient technologies, which is among others, comparable in its importance to Artificial Intelligence, 5G...
Abstract
Rigaku launched a high-speed X-ray topography system with the improved throughput of 10–20 wafers/hour (3–6 min/wafer). High-speed image acquisition is achieved using an uncollimated...
SmartLab Studio II is an integrated X-ray diffraction software package for SmartLab 3, an automated multipurpose X-ray diffractometer. The package covers the full spectrum of...
SmartLab SE, which includes a semiconductor detector as a “standard” component, is Rigaku’s newest automated multipurpose X-ray diffractometer system. Customers can select either the “2D” or the “1D” version...
SmartLab Studio II is an integrated X-ray diffraction software package for making both measurements and analyses using SmartLab, an automated multipurpose X-ray diffractometer. Two years ago(1), the user...