Liquid analysis by total reflection X-ray fluorescence spectrometer
Total Reflection X-ray Fluorescence (TXRF) is a method that can be used for high sensitive elemental analysis on solid sample surface, and has been widely...
Total Reflection X-ray Fluorescence (TXRF) is a method that can be used for high sensitive elemental analysis on solid sample surface, and has been widely...
Total reflection of X-rays occurs on the surface of a measured object by X-ray irradiation at an extremely low glancing angle (less than 0.1°). X-rays...
X-ray fluorescence spectrometry (XRF) is well known as an analysis method with high precision by means of non-destructive and no contact analysis, and is therefore...
Total reflection X-ray fluorescence (TXRF) spectrometry is widely used in semiconductor manufacturing processes for nondestructive analyses of metallic contamination on wafer surfaces. Sensitivity requirements for...
The newly-released sequential general-purpose wavelength-dispersive X-ray fluorescence spectrometer, ZSX Primus III+ is the latest member of the ZSX Primus series. The ZSX Primus III+ with...
Total Reflection X-ray Fluorescence (TXRF) analysis is a non-destructive and surface-sensitive analysis method using X-rays, in which incident X-rays are irradiated on a sample at...
In the past, total scattering data was used to obtain the pair distribution function (PDF) G(r). However, it has become clear that it is also...
Introduction
The local structure of materials is closely related to their functional properties, a subject that has been extensively studied for cathode materials, solid electrolytes...