X-ray diffractometer system with single or dual PhotonJet microfocus sources
With your success utmost in our minds, the XtaLAB Synergy has been developed for single crystal X-ray diffraction. Using a combination of leading edge components...
With your success utmost in our minds, the XtaLAB Synergy has been developed for single crystal X-ray diffraction. Using a combination of leading edge components...
Rigaku Oxford Diffraction single’s crystal diffraction systems are controlled with the user-inspired CrysAlisPro software. CrysAlisPro integrates and interfaces seamlessly with not only our...
A scientific discipline, which investigates crystal structures by means of the X-ray diffraction method, is called X-ray crystallography or simply crystallography. It originated in a...
In modern society where our daily environment is supported by various electronic devices, it is critical to pursue opto-electronic or power-electronic devices with less environment...
Although high-resolution X-ray diffraction (HR-XRD) has been commonly employed for the crystallinity characterization of GaN-related materials, special care is required due to the complexities resulting...
Dr. Satoshi Omura of Kitasato Univerisity and his collaborator, Dr. William C. Campbell of Merck, were awarded the 2015 Nobel Prize in Physiology or Medicine...
High-voltage and high-efficiency power devices are in strong demand as a way of decreasing energy consumption in a wide range of industrial and consumer products...
TXRF spectrometers are widely used as evaluation instruments for measuring contamination in the semiconductor fabrication process. This is mainly because the TXRF technique allows non-destructive...
Due to the recent development of fundamental technologies of X-ray generators and detectors, such as X-ray focusing optics and area detectors, the size of the...
Total reflection X-ray fluorescence (TXRF) spectrometry is widely used in semiconductor manufacturing processes for nondestructive analyses of metallic contamination on wafer surfaces. Sensitivity requirements for...