X-ray diffractometer system with dual wavelength X-ray source: XtaLAB Synergy-DW

In straightforward terms, the XtaLAB Synergy-DW diffractometer combines the increased flux of a rotating anode source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide range of crystallographic research interests. The system is based on Rigaku’s proven, low-maintenance MicroMax-007HF microfocus rotating anode. The target is constructed with two different source materials (Cu and Mo, for example) and is coupled with an autoswitching dual-wavelength optic, meaning that you can select between copper and molybdenum X-ray radiation at the click of a button.