In X-ray diffractometry, a variety of detectors are used depending on the purpose of the measurement. In recent years, in addition to the previously used 0D detectors (scintillation counters etc.), there has been increasing use of 1D detectors in which multiple detector elements are packaged into a single unit using the latest semiconductor technology. These semiconductor 1D detectors enable measurement with high-intensity using multiple elements, high-resolution with a strip width of 100 microns or less, and a high P/B (peak/background) ratio.
The D/teX Ultra 250 1D silicon strip X-ray detector introduced here is a new type of detector that makes major improvements on previous 1D detectors, and achieves dramatically improved performance. The D/teX Ultra 250 can measure extremely high-intensity data, approximately 150 times that of a scintillation counter (SC). In addition to detection of even smaller trace components and micro-area measurements on small samples, it also enables increased speed in tasks such as multi-point measurement, in-situ measurement and reciprocal space mapping measurement. These detectors work well in a variety of fields, including R&D and quality control.