Notice to customers in North, Central, and South America
Sections of the United States are under a winter weather warning, which includes the possibility of freezing rain, lower than normal temperatures, or large accumulations of snow. Some regions could lose power, including Texas, where the headquarters of Rigaku Americas and Applied Rigaku Technologies are located. Be advised that staff in the affected areas might be slow to respond. Some employees might be offline and unable to respond to your request.If you need immediate customer service, you can contact us at: 1-888-362-2324.
We appreciate your patience. Any potential disruptions should be over by Tuesday.
High-resolution X-ray Diffraction
High-resolution X-ray diffraction (HRXRD) is a powerful technique used for research and manufacturing of semiconductors. It has several advantages such as assessing crystal quality, analyzing layer thickness and composition, evaluating interface quality, analyzing strain, optimizing processes, detecting and analyzing defects, developing advanced materials, and quality control in manufacturing. HRXRD plays a vital role in advancing semiconductor technology.
HRXRD metrology solutions
From lab to fab
XTRAIA XD Series
High-resolution XRD epitaxial film characterization
HR-XRD and XRR. Strain, composition, and thickness of epitaxial layers, crystalline phase, and texture of polycrystalline films. Thin film and film stack thicknesses and density.
TFXRD Series
Thin film XRD systems for in-line monitoring & control from Lab to Fab
High-speed X-ray diffraction and reflectivity (XRD/XRR) for real-time monitoring and control of thin film properties. Measure layer thickness, density, composition, strain, crystal quality, and interface integrity directly on production wafers, delivering research-grade insight at fab-level throughput.
HRXRD advantages
Crystal quality assessment
Characterize crystal quality, including crystal structure, lattice parameters, and crystal defects.
Layer thickness and composition analysis
Determine layer thicknesses and compositions in semiconductor heterostructures, including epitaxial layers and multilayer structures.
Strain analysis
Analyze strain with high sensitivity in semiconductor materials to improve carrier mobility in field-effect transistors (FETs) and enhance the efficiency of optoelectronic devices.
Interface quality evaluation
Provide insights into the quality of interfaces between different semiconductor layers
Defect analysis and detection
Identify and characterize various types of defects in semiconductor materials, including threading dislocations, stacking faults, and point defects.
Advanced material development
Develop avanced semiconductor materials, such as III-V compound semiconductors and wide-bandgap materials for next-generation devices.
Contact Us
Whether you are interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.