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    Learning Hub

    Welcome to Learning Hub, your premier online resource for mastering semiconductor metrology techniques and tools. Explore our comprehensive collection of courses and resources tailored to wafer inspection and metrology techniques, with a special focus on X-ray metrology.

    Unlock the most reliable solutions to your metrology challenges with our in-depth coverage of advanced X-ray techniques, including:

    • WDXRF (Wavelength dispersive X-ray fluorescence)
    • TXRF (Total reflection X-ray fuorescence)
    • XRR (X-ray reflectometry)
    • EDXRF (Energy dispersive X-ray fluorescence)
    • CDSAXS (Critical-dimension small-angle X-ray scattering)
    • HRXRD (High-resolution X-ray diffraction)
    • XRF (X-ray fluorescence)
    • XRD (X-ray diffraction)
    • XRT (X-ray topography)

    Join our dynamic community of learners, engage in discussions, and collaborate with industry experts to expand your skills and stay updated on the latest advancements in semiconductor metrology.

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    Semiconductor learning resources

    Understanding semiconductors a connection with the industry leaders.

    Understanding_Semiconductors_Podcast
    Understanding Semiconductors podcast

    A podcast designed to connect semiconductor industry experts and engineering leaders in characterization, metrology, process, and analytics, discussing recent semiconductor metrology challenges.

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    TXRF Measurable elements periodic table
    Wafer inspection and X-ray metrology techniques

    Learn about the most reliable solutions to your metrology challenges: WDXRF, TXRF, XRR, EDXRF, CDSAXS, HRXRD, XRT and XRD

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    Social media post TOTAL REFLECTIVE X-RAY FLUORESCENCE (txrf)
    Webinar recordings
     

    Watch on-demand recordings of webinars related to the semiconductor industry.

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    Rigaku Journal cover - Winter 2012 Vol. 28 No. 1
    Rigaku Journal
     

    Read articles pertaining to semiconductor products and applications in the Rigaku Journal.

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