先进材料与新材料

XCT2201 - Submicron CT for the Life Sciences: Animal and Tissue Research Applications

XCT2103 - Submicron CT for Plant Research Applications

XCT2102 - Submicron CT for the Pharmaceutical Industry

XCT2101 - Textile and Fiber Industry using the nano3DX

WDXRF1111 - FeO Analysis in Iron Ore Sinters Using the XRD Channel on multi-channel XRF Spectrometer Simultix 15

SMX039 - The Absolute Structure of Light-atom-containing Molecules

SMX038 - Rigaku Rotating Anodes: Powerful and Reliable Sources for Seamless and High-throughput Small Molecule Structure Solution

SMX036 - Comparison of Two XtaLAB Synergy Instruments

SMX034 - The Molecular Grabber Method: Another Crystalline Sponge using Protein

SMX032 - PDF Analysis of Glassy Materials on a Home Laboratory Diffractometer

SMX030 - Application of the Crystalline Sponge Method for Structure Determination of Persistent organic Pollutants of Agrochemical Degradation Products

SMX029 - What Is This? and Data Collection on Metal-organic Framework Microcrystals using the XtaLAB Synergy-S

SMX028 - Calibrating the XtaLAB Synergy-S for PDF Analysis

SMX027 - Micro Powder Diffraction on XtaLAB Synergy Single Crystal Diffractometers

SMX024 - Charge-density Data Collection on XtaLAB Synergy Diffractometers

SMX023 - Charge-density Data Collection on XtaLAB Synergy-S with HyPix 6000

SMX019 - The HyPix-6000HE Detector and Its Ability to Resolve Reflections at Close Crystal-to-Detector Distances

SMX018 - Structures in Seconds with What Is This?

SMX017 - Determining Structure of Volatile Compounds with the Crystalline Sponge Method

SMX011 - Superior Data Quality Achieved with the XtaLAB Synergy-i, Microfocus Mo source

SMX010 - A Study of the Stereochemistry of Sucrose and a Phenidate Derivative using the Copper Microfocus Source of the XtaLAB Synergy-i

SMX006 - Treatment of Modulated Structures in CrysAlisᴾʳᵒ

SMX004 - Using CrysAlisᴾʳᵒ to Elucidate Twinned Crystals by X-ray Diffraction

RSMD010 - Metrology for Substrate Back Side Contamination

RSMD009 - Metrology for MTJ Layer Thickness & Composition

RSMD008 - Metrology for MRAM Layer Thickness, Density & Roughness

RSMD007 - Single Wafer Pass Detection & Metrology

RSMD006 - Thickness and Composition of Piezoelectric PZT Films

RSMD005 - Surface Contamination of SiC, GaN Power Device Wafers

RSMD004 - Pd Measurement on GaAs Wafer

RSMD003 - WDXRF Composition Mapping of a PZT Sputtering Target

RSMD002 - Thickness Characterization of a Power Device Backside Electrode

RSMD001 - Evaluation Of Wet Cleans In SiC Power MOSFET Fabrication By TXRF

RSMD-20220728 - Measurements of AgSn Micro Solder Bump using Monochromatic Micro X-ray Beam

RSMD-20104496 - Defect Sizing and Identification using 3D and XRF Review

RSMD-20101936 - Cu Seed Composition and Thickness

RSMD-20101835 - Ultrathin Film Thickness

RSMD-20101833 - Aluminum Oxide Film Thickness Measurement

RSMD-20101831 - Ultrathin Ru Thickness Measurement by Micro-spot EDXRF

RACCT9048 - 3D Printed Superalloy

RACCT9047 - Lithium Battery Protection Board Analysis

RACCT9046 - Wild Bird Forensic

RACCT9045 - Tablet Crystallinity Analysis by X-ray CT

RACCT9044 - Rapid-release Pain Medication Capsule Comparison by X-ray CT

RACCT9043 - Multivitamin Tablet Analysis by X-ray CT

RACCT9042 - Microparticle Coating Analysis by X-ray CT

RACCT9041 - Famotidine Tablet Comparison by X-ray CT

RACCT9040 - Degradation of Sustained-release Dosage Tablet Imaged by X-ray CT

RACCT9039 - Compression Methods Comparison by X-ray CT

RACCT9038 - Brand Name vs Generic Atorvastatin Tablets Comparison by X-ray CT

RACCT9037 - Aspirin Tablet Coating Delamination Imaging by X-ray CT

RACCT9036 - Steel Wool under Compressive Stress

RACCT9035 - Solder Voids in PCB

RACCT9034 - Delamination in Lithium-ion Batteries

RACCT9033 - Water Flosser Tip Stress Simulation using X-ray CT Scan

RACCT9032 - Plastic Parts Quality Control and Reverse Engineering by X-ray CT

RACCT9031 - Plastic Locking Parts Dimensional Comparison by X-ray CT

RACCT9030 - Nesting Doll Dimensional Analysis by X-ray CT

RACCT9029 - Golf Ball Layer Thickness Analysis by X-ray CT

RACCT9028 - Bottlecap Air Gap Analysis by X-ray CT

RACCT9027 - Aluminum Part Dimensional Analysis by X-ray CT

RACCT9026 - Aluminum Die Casting Void Analysis by X-ray CT

RACCT9025 - 3D Printed Plastic Dimensional Analysis by X-ray CT

RACCT9024 - Tomato Plant Root System Analysis by X-ray CT

RACCT9023 - Maize Kernel Analysis by X-ray CT

RACCT9022 - Coral Surface Area and Porosity Analysis by X-ray CT

RACCT9021 - Cicada Analysis by X-ray CT

RACCT9020 - Three sandstone porosity comparison by X-ray CT

RACCT9019 - Sandstone pore network analysis by X-ray CT

RACCT9018 - Sandstone Grain Size Analysis by X-ray CT

RACCT9017 - Sand Oil and Brine Segmentation by X-ray CT

RACCT9016 - Rock Crack Analysis by X-ray CT

RACCT9015 - Granite Phase Fraction Analysis by X-ray CT

RACCT9014 - Carbonate porosity analysis by X-ray CT - Segmentation comparison

RACCT9013 - Ammonite Fossil Scan by X-ray CT

RACCT9012 - Processed Meat Heating Experiment by X-ray CT

RACCT9011 - Processed Meat Fat and Protein Analysis Distribution Analysis by X-ray CT

RACCT9010 - Pretzel Coating Thickness Analysis by X-ray CT

RACCT9009 - Chocolate Candy Coating Analysis by X-ray CT

RACCT9008 - Breading Air and Oil Distribution Analysis by X-ray CT

RACCT9007 - Bread Dough Rising Process Observed by X-ray CT

RACCT9006 - Superabsorbent Water Absorption Process Observation by X-ray CT

RACCT9005 - Shoe Sole Compression and Pore Size Analysis by X-ray CT

RACCT9004 - Particleboard Packing Density Analysis by X-ray CT

RACCT9003 - Makeup Sponge Wear and Tear Analysis by X-ray CT

RACCT9002 - Insulator Porosity and Cell Wall Thickness Analysis by X-ray CT

RACCT9001 - Earplug Pore Size Analysis by X-ray CT

RACCT9000 - CFRP Void and Fiber Analysis by X-ray CT

PHRM0002 - In-Situ DSC-Humidity PXRD Analysis for Pharmaceuticals

BATT1023 - Assessment of Particle Diameter and Interparticle Voids for Cathode Material for Lithium-Ion Batteries

BATT1022 - Particle Distribution Analysis and Crack Analysis in Lithium-Ion Batteries

BATT1018 - XRD Measurement with Temperature Control and Charge/Discharge Using Laminated Cells

BATT1017 - XRD Measurement during Charge/Discharge Using All-Solid-State Batteries

BATT1016 - XRD Measurement During Charge/Discharge Using Laminated Cell Batteries

BATT1015 - Local Structure Analysis of Li₃PS₄ Solid-State Electrolyte

BATT1014 - Measurement of Li₇P₃S₁₁ Solid-State Electrolyte Using Airtight Sample Holder

BATT1013 - Crystallite Diameter and Particle Diameter Calculation for Silicon Negative Electrode Material

BATT1012 - Inference of Valence and Li Ion Diffusion Path Using the BVS Method

BATT1011 - Measurement of Cathode Material NCM Using XSPA-400 ER High-Energy Resolution Detector

BATT1010 - Investigation of Phase Transition Behavior upon Cathode Material NCM Firing

BATT1009 - Verification of Winding Misalignment and Anode Overhang Analysis for Lithium-Ion Battery Winding Body

BATT1003 - Management of Graphitization Degree for Graphite Anode Material

BATT1002 - Lattice Constant and Crystallite Diameter Management for NCM Cathode Material

BATT1001 - Qualitative Analysis of Impurities (Sulfate) in Mixed Nickel-Cobalt Sulfide

BATT0006 - Failure Analysis of a Multilayered Battery Cell

BATT0005 - Porosity Analysis of Cathode-Coated Sheet

BATT0003 - Battery Performance

BATT0002 - Battery Material Characterization

BATT0001 - Battery Material Development

B-XRI1035 - Ceramic Additive Manufacturing

B-XRI1034 - 3D Printed Titanium Rods

B-XRI1033 - Respirator Cartridge

B-XRI1032 - Drone Inspection

B-XRI1024 - Fiber orientation analysis of short fibers in GFRPs by micro X-ray CT

B-XRI1023 - Analysis of potato thickness and oil particle size in potato chips by micro X-ray CT

B-XRI1017 - Analysis of volume fraction and thickness of bran layer using a high-resolution 3D X-ray microscope

B-XRI1016 - Observation and Analysis of Laminated Films by Micro X-ray CT

B-XRI1015 - Observation of Lyophilized Formulations by Micro X-ray CT

B-XRI1007 - Visualization of Components in Ceramic Composites using a High-resolution 3D X-ray Microscope

B-XRI1004 - Visualization and Size Analysis of Foreign Matter in CFRP using a High-resolution 3D X-ray Microscope

B-XRI1003 - Defective Site Analysis of LED package by CT slices and Volume Rendering

B-XRI1002 - Observation of Milk Protein Aggregation in String Cheese

B-XRI1001 - CT Observation of a Laminated Battery Cell by X-ray Microscopy

B-XRD3007 - Tri-axial Stress Analysis of a Multilayer Ceramic Capacitor (MLCC)

B-XRD3005 - Evaluation of Residual Stress of Thin Films by GI-XRD and the Multiple hkl Method

B-XRD3001 - Stress Distribution of a Shot Peened Coil Spring

B-XRD2039 - Observation of Anisotropic and Nonlinear Thermal Expansion of Thin Films on Substrates by In-Plane X-ray Diffraction

B-XRD2038 - Full-wafer Mapping Evaluation of Metal Films on an 8-inch Wafer using the Rθ Attachment

B-XRD2037 - Evaluation of Native Oxide Film on Larger-diameter Silicon Substrates Using High-precision Thin Film XRD for Advanced Research

B-XRD2034 - Twist Width Evaluation of Group III-V Nitride Films by Rocking Curve Measurement

B-XRD2032 - Observation of Orientation State of Polypropylene Film Products by 2D-GIWAXS Measurement

B-XRD2031 - Evaluation of Curvature of a Single Crystal Substrate by Rocking Curve Measurement

B-XRD2030 - Evaluation of Uniformity of Thin Film Thickness by X-ray Reflectivity Mapping

B-XRD2028 - Off-normal Fiber Texture Analysis by Pole Figure Measurement

B-XRD2027 - Evaluation of Uniformity of a Single Crystal Substrate by Rocking Curve Measurement

B-XRD2026 - Analysis of Epitaxial Films on In-plane Anisotropic Substrates by Wide-Range RSM

B-XRD2025 - Analysis of Uniaxially Oriented Film by Wide-range RSM

B-XRD2024 - High-speed RSM of a III-nitride Epitaxial Film by 1D Detection Mode

B-XRD2023 - Phase Identification of an Organic Thin Film by GIWAXS Measurement with a 2D detector

B-XRD2022 - Crystal Defect Analysis by X-ray Reflection Topography

B-XRD2021 - High-speed RSM of an Epitaxial Film by 1D Detection Mode

B-XRD2020 - Phase ID and Orientation Analysis for Thin Film SOFC Material using 2DD

B-XRD2009 - Orientation Analysis of Organic Thin Film on Single Crystal Sub by In-plane XRD

B-XRD2007 - Examination for Growth Process of Organic Thin Film by In-plane XRD

B-XRD2006 - Crystal Orientation Evaluation of Epitaxial Film and Ultrathin Buffer Layers by In-plane Reciprocal Space Mapping

B-XRD2005 - Orientation Analysis of Organic Thin Film on Rubbed Glass by In-plane XRD

B-XRD2003 - Magnetic Recording Media (FePt) by In-plane XRD

B-XRD2001 - Evaluation of Crystal Quality (Tilt and Twist Qidths) of Group-III Nitride Film by the Rocking Curve Method

B-XRD1172 - Phase Identification and Quantitative Analysis of Rare Earth Ore by X-ray Diffraction

B-XRD1170 - Phase Identification of a Black Foreign Material on a Sintered BaTiO₃ Ceramic using Micro-area X-ray Diffraction

B-XRD1169 - Temperature-dependent Analysis of Polymer Crystallization Behavior Using High-speed Time-resolved Measurement

B-XRD1168 - Phase identification and Quantitative Analysis of Nickel Ore by X-ray Diffraction

B-XRD1166 - Phase Identification and Quantitative Analysis of Copper Ore by X-ray Diffraction

B-XRD1165 - Phase Identification and Quantitative Analysis of Iron Ore by X-ray Diffraction

B-XRD1162 - In-situ Evaluation of Orientation in Polymer Films at Different Draw Ratios by Wide Angle X-ray Scattering

B-XRD1155 - Detection of trace components in battery cathode materials using a seamless pixel array detector

B-XRD1150 - Evaluation of Graphitization Degree of Lithium-ion Battery Carbon Anode Material by X-ray Diffractometry

B-XRD1149 - Evaluation of Barium Titanate Polymorphs by Rietveld Analysis

B-XRD1148 - Composition ratio classification of ternary cathode material by cluster analysis

B-XRD1147 - High-precision Quantitative Analysis of Clinker Mineral Polymorphs by Rietveld Refinement

B-XRD1146 - Quantification of Blast Furnace Slag by Rietveld Refinement using Reference Intensity Ratio

B-XRD1143 - Verifying the Validity of Crystallite Sizes Determined by the FP Method

B-XRD1142 - Quantitative Analysis of Crystal Polymorphs by the DD Method

B-XRD1141 - Observation of time-dependent hydration reaction by X-ray diffractometry

B-XRD1140 - Accurate and Highly Precise Quantitative Analysis of Cement Samples using Rietveld Refinement

B-XRD1139 - Calculation of Molecular Stacking Spacing of Copper Phthalocyanine using PDF Analysis

B-XRD1137 - Phase ID Analysis of Micro-impurities on the Surface of a Tablet by Micro-area XRD Measurements

B-XRD1136 - Structural Characterization of Zeolite by Electron Density Analysis

B-XRD1135 - Observation of Butter Crystal by Simultaneous XRD-DSC Measurement

B-XRD1133 - Observation of Phase Transition Behavior of Pharmaceutical Materials with a Benchtop XRD System

B-XRD1132 - Quantitative Analysis of Glass with the DD Method

B-XRD1131 - Structural Characterization of Zeolite by PDF Analysis

B-XRD1129 - Variable Humidity Measurement of a Drug Substance using XRD-DSC and a Humidity Controller

B-XRD1128 - Observation of Dehydration Behavior of a Drug Substance using TG-DTA and XRD-DSC

B-XRD1127 - Background Reduction for Iron Oxide with CuKα X-rays using XRF Mode

B-XRD1126 - Crystallization of Chocolate Observed by XRD-DSC

B-XRD1125 - Quantification of the Taste of Salt by DD (Direct Derivation) Method

B-XRD1124 - Operando Transmission XRD Measurement of All-solid-state Lithium-ion Battery using Ag Source

B-XRD1123 - Simultaneous Operando XRD Measurement for Positive and Negative Electrode Materials

B-XRD1122 - Evaluation of the Crystallinity of a Carious Tooth using X-ray Diffraction

B-XRD1121 - Phase Identification of Mixed Powder by Real-time Analysis

B-XRD1120 - Quantitative Analysis of Pharmaceutical Polymorphic Forms via the DD Method

B-XRD1119 - Quantitative Characterization of Polymer film by Orientation Function

B-XRD1118 - Quick Pole Figure Measurement of a Metal Material using 2DD

B-XRD1117 - Observation of a Phase Transition at High Temperature under Various Atmospheres

B-XRD1116 - Operando Measurement of Laminated Lithium-ion Battery using 2DD

B-XRD1115 - Quantitative Analysis of γ-Al₂O₃ by the DD Method

B-XRD1114 - LOQ of Trace Impurities in API by the DD Method

B-XRD1113 - Evaluation of Oxidation State by the BVS Method

B-XRD1112 - Structural Analysis of Amorphous Silica by PDF Analysis

B-XRD1111 - Quantitative Analysis of 3-component Sample by DD method

B-XRD1110 - Particle Size Distribution Analysis of Ferroelectric Nanopowder by USAXS

B-XRD1109 - Structure Determination of Ferroelectric Nano-powder by PDF Analysis

B-XRD1108 - Direct Observation of Melting and Crystallization of Fresh Cream

B-XRD1107 - Material Characterization by PDF and RDF Analysis

B-XRD1106 - Charge/discharge Process of Li-ion Battery Positive Electrode

B-XRD1105 - High-speed in-situ Measurement of Melting Process of Metal

B-XRD1104 - Evaluation of Grain Condition and Orientation of Cemented carbide using 2D XRD

B-XRD1103 - Phase Identification of a Coarse-grained Trace Component in a Mineral Powder using 2D XRD

B-XRD1102 - Particle Size / Distribution of Pigment Ink by USAXS

B-XRD1101 - High-T analysis - MiniFlex with HyPix-400 MF / BTS 500

B-XRD1093 - Quantitative Analysis of Amorphous Components in Cement

B-XRD1089 - Micro-area Mapping Measurement of Printed Circuit Boards

B-XRD1081 - Quantitative Analysis of Polymorphic Impurities in a Drug Substance by the Calibration Method

B-XRD1080 - Rietveld Analysis of Battery Material using a Mo Source

B-XRD1078 - Evaluation of Crystallite Size and Pore Size distribution of Fuel Cell Materials

B-XRD1076 - Rietveld Quantitative Analysis of Trace Components in Cement

B-XRD1072 - Crystallite Size Analysis Analysis of a Microvolume of Metallic Nanoparticles with a Benchtop X-ray Diffractometer

B-XRD1071 - Crystallite Size Analysis of a Catalyst Material by the Scherrer Method

B-XRD1063 - Measurement of a Film Sample

B-XRD1060 - MiniFlex Measurement of Trace Samples

B-XRD1046 - Crystal Phase Identification of Pharmaceutical Materials in the Freeze Drying Process

B-XRD1044 - Crystal Phase Identification of Carbide Tips by Micro-area 2D X-ray Diffraction

B-XRD1043 - Powder Crystal Structure of Organic Crystals

B-XRD1035 - Crystal Structure Analysis of a Powder Sample of Pharmaceutical Cocrystals by the Rietveld Method

B-XRD1030 - Particle Diameter Distribution of Gold Nanoparticles

B-XRD1026 - Observation of Crystallization Behavior of Ionic Liquids by XRD-DSC

B-XRD1023 - Measurement of Pseudo-polymorph Impurities in Tablets

B-XRD1021 - Phase Changes of Pharmaceuticals as a Function of Temperature and Humidity

B-XRD1020 - Observation of Dehydration Process of Hydrate by XRD-DSC

B-XRD1018 - Crystallite Size Distribution of Zinc Oxide Nanoparticles

B-XRD1014 - Crystal Orientation Analysis of Rolled Sheet Material by Pole Figure Measurement

B-XRD1011 - Temperature Dependence of a Lattice Constant

B-XRD1009 - Charging-discharging of Cathode Materials in Li-ion Batteries

B-XRD1002 - Quantification of a 4-component Sample using RIR method

B-XRD1001 - Quantitative Analysis of a 4-component Sample

B-SCX1011 - High-Speed Measurement Of A Peptide Drug Using HyPix-Arc 150°