Adventures in Wavelength Dispersive XRF: Flexible Element Analysis for Thin Films

Presenter: Meredith Beebe

In this webinar, you will find out how WDXRF enables these analytical advantages and explore ways it can be used in thin film and bulk material optimization and quality control. Meredith Beebe breaks down the fundamentals of WDXRF and will showcase examples of its use in solving manufacturing challenges with photovoltaics, semiconductors, and other advanced materials and devices.

You will learn:

1. Why does peak resolution matter in elemental analysis? How does WDXRF achieve a peak resolution substantially greater than EDXRF?
2. How does WDXRF compare with energy-dispersive X-ray spectroscopy thin film analysis?
3. How are WDXRF composition measurements made? How can WDXRF be used to analyze film thickness?
4. What kinds of problems can WDXRF solve? In what industries is it most relevant?
5. What makes the Rigaku AZX 400 WDXRF instrument at Covalent unique?

WDXRF systems have low background noise (as low as 1/10^th the background intensity of peaks in EDXRF), improved interference removal, and up to ~10-20 times better peak resolution. Their high precision has made WDXRF systems the gold-standard in metallurgy and geological applications and important metrology tools for thin film research and manufacturing.

This webinar is provided in partnership with Covalent Metrology