SmartLab SE
Multipurpose X-ray diffraction system with built-in intelligent guidance
Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments
The SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD).
Supported by LabLinc Studio
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SmartLab SE Overview
SmartLab Studio II incorporates a built-in Guidance expert system that suggests the optimal hardware configuration and settings for specific application measurements. The software will determine which optics are most appropriate for a given application, determine the instrument settings and execute the measurement, delivering a completely automated measurement sequence. Since the SmartLab SE has built-in component recognition, Guidance will not only tell you how you should configure the SmartLab SE for a given measurement, it will also warn you if you have not configured it properly. Expert advice coupled with hardware that will confirm the correct configuration is the foundation of the SmartLab SE platform.
HyPix-400: next generation 2D detector
With the SmartLab SE, Rigaku introduces the available HyPix-400, a semiconductor hybrid pixel array detector that was specifically designed for multipurpose X-ray diffractometers. Its large active area, high angular resolution and ultra-high dynamic range make it the perfect, affordable, 2D detector solution for a large variety of applications, including powder and thin film diffraction. Please note that the D/teX Ultra 250 silicon strip detector is also available as a standard detector choice if desired.
Automatic alignment for maximized uptime
Changing hardware configurations or consumables on some diffractometers is so daunting that people often invite their service engineer to perform the task. This can be costly and time consuming. The optics configuration on the SmartLab SE is self-aligning. From the tube height to the monochromator alignment, all of the optical alignment is done automatically under computer control. This feature drastically reduces down time and cost of ownership of the instrument, and it allows you to be confident that your instrument will always be in an aligned condition.
SmartLab SE Features
SmartLab SE Videos
SmartLab SE Specifications
| Technique | X-ray diffraction | |
|---|---|---|
| Benefits | Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments | |
| Technology | Multipurpose θ-θ X-ray diffractometer with built-in intelligent Guidance | |
| Attributes | 3 kW sealed X-ray tube D/teX Ultra 250 silicon strip detector Vertical type θ-θ geometry |
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| Options | HyPix-400 (2D HPAD) detector | |
| Computer | External PC, MS Windows OS, SmartLab Studio II software | |
| Dimensions | 1270 (W) x 1880 (H) x 1220 (D) mm | |
| Mass | Approx. 800 kg (core unit) | |
| Power requirements | 3Ø, 200 VAC 50/60 Hz 30 A or 1Ø, 220-230 VAC 50/60 Hz 40 A |
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SmartLab SE Options
The following accessories are available for this product:
Solid-State Battery Cell Attachment
Enables In Operando XRD analysis of a complete and functioning rechargeable solid-state cell.
Liquid Electrolyte Cell Attachment
Holds the individual components of a battery (anode, cathode, liquid electrolyte, etc.) to form a working rechargeable cell.
Laminate/Pouch Cell Attachment
Holds a laminate/pouch type rechargeable cell for In Operando XRD analysis.
Coin Cell Attachment - Reflection
Holds a coin cell horizontally for reflection geometry X-ray beam for In Operando XRD analysis.
Coin Cell Attachment - Transmission
Holds a coin cell vertically for transmission geometry X-ray beam for In Operando XRD analysis.
SmartLab SE Application Notes
The following application notes are relevant to this product
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XRD2001 - Orientation and Residual Stress Evaluation in Metal Thin Films
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BATT1012 - Inference of Valence and Li Ion Diffusion Path Using the BVS Method
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BATT1011 - Measurement of Cathode Material NCM Using XSPA-400 ER High-Energy Resolution Detector
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BATT1010 - Investigation of Phase Transition Behavior upon Cathode Material NCM Firing
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BATT1001 - Qualitative Analysis of Impurities (Sulfate) in Mixed Nickel-Cobalt Sulfide
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PHRM0002 - In-Situ DSC-Humidity PXRD Analysis for Pharmaceuticals
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BATT0001 - Battery Material Development
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B-XRD1129 - Variable Humidity Measurement of a Drug Substance using XRD-DSC and a Humidity Controller
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B-XRD1001 - Quantitative Analysis of a 4-component Sample
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B-XRD1111 - Quantitative Analysis of 3-component Sample by DD method
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B-XRD1002 - Quantification of a 4-component Sample using RIR method
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B-XRD1103 - Phase Identification of a Coarse-grained Trace Component in a Mineral Powder using 2D XRD
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B-XRD1021 - Phase Changes of Pharmaceuticals as a Function of Temperature and Humidity
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B-XRD1020 - Observation of Dehydration Process of Hydrate by XRD-DSC
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B-XRD1128 - Observation of Dehydration Behavior of a Drug Substance using TG-DTA and XRD-DSC
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B-XRD1117 - Observation of a Phase Transition at High Temperature under Various Atmospheres
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B-XRD1023 - Measurement of Pseudo-polymorph Impurities in Tablets
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B-XRD1113 - Evaluation of Oxidation State by the BVS Method
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B-XRD1150 - Evaluation of Graphitization Degree of Lithium-ion Battery Carbon Anode Material by X-ray Diffractometry
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B-XRD1149 - Evaluation of Barium Titanate Polymorphs by Rietveld Analysis
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B-XRD1018 - Crystallite Size Distribution of Zinc Oxide Nanoparticles
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B-XRD2025 - Analysis of Uniaxially Oriented Film by Wide-range RSM
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B-XRD2026 - Analysis of Epitaxial Films on In-plane Anisotropic Substrates by Wide-Range RSM
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B-XRD1168 - Phase identification and Quantitative Analysis of Nickel Ore by X-ray Diffraction
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B-XRD1166 - Phase Identification and Quantitative Analysis of Copper Ore by X-ray Diffraction
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B-XRD1165 - Phase Identification and Quantitative Analysis of Iron Ore by X-ray Diffraction
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XRD1014 - Ab-initio Crystal Structure Determination of a Cu-MOF Using Powder Diffraction Data Obtained from a Benchtop X-ray Diffractometer
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B-XRD1155 - Detection of trace components in battery cathode materials using a seamless pixel array detector
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B-XRD1148 - Composition ratio classification of ternary cathode material by cluster analysis
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B-XRD1143 - Verifying the Validity of Crystallite Sizes Determined by the FP Method
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B-XRD1076 - Rietveld Quantitative Analysis of Trace Components in Cement
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B-XRD1119 - Quantitative Characterization of Polymer film by Orientation Function
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B-XRD1115 - Quantitative Analysis of γ-Al₂O₃ by the DD Method
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B-XRD1142 - Quantitative Analysis of Crystal Polymorphs by the DD Method
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B-XRD1093 - Quantitative Analysis of Amorphous Components in Cement
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B-XRD1125 - Quantification of the Taste of Salt by DD (Direct Derivation) Method
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B-XRD1146 - Quantification of Blast Furnace Slag by Rietveld Refinement using Reference Intensity Ratio
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B-XRD1121 - Phase Identification of Mixed Powder by Real-time Analysis
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B-XRD1030 - Particle Diameter Distribution of Gold Nanoparticles
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B-XRD1060 - MiniFlex Measurement of Trace Samples
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B-XRD1063 - Measurement of a Film Sample
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B-XRD1114 - LOQ of Trace Impurities in API by the DD Method
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XRD1003 - How to Evaluate Solid Pharmaceutical Drugs (3): Confirming Hydrates
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XRD1002 - How to Evaluate Solid Pharmaceutical Drugs (2): Confirming the Presence/absence of Amorphous Substances
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XRD1001 - How to Evaluate Solid Pharmaceutical Drugs (1): Confirming the crystal form of an API
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B-XRD1101 - High-T analysis - MiniFlex with HyPix-400 MF / BTS 500
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B-XRD1105 - High-speed in-situ Measurement of Melting Process of Metal
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B-XRD1147 - High-precision Quantitative Analysis of Clinker Mineral Polymorphs by Rietveld Refinement
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B-XRD3005 - Evaluation of Residual Stress of Thin Films by GI-XRD and the Multiple hkl Method
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B-XRD1104 - Evaluation of Grain Condition and Orientation of Cemented carbide using 2D XRD
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B-XRD1078 - Evaluation of Crystallite Size and Pore Size distribution of Fuel Cell Materials
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B-XRD1071 - Crystallite Size Analysis of a Catalyst Material by the Scherrer Method
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B-XRD1014 - Crystal Orientation Analysis of Rolled Sheet Material by Pole Figure Measurement
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B-XRD1009 - Charging-discharging of Cathode Materials in Li-ion Batteries
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B-XRD1106 - Charge/discharge Process of Li-ion Battery Positive Electrode
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B-XRD1127 - Background Reduction for Iron Oxide with CuKα X-rays using XRF Mode
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B-XRD1141 - Observation of time-dependent hydration reaction by X-ray diffractometry
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B-XRD1140 - Accurate and Highly Precise Quantitative Analysis of Cement Samples using Rietveld Refinement
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B-XRD1011 - Temperature Dependence of a Lattice Constant
SmartLab SE Resources
Webinars
Visit the Webinar resource page to access Webinars relevant to SmartLab SE
Rigaku Journal articles
Visit the Rigaku Journal resource page to access articles relevant to SmartLab SE
Publications
Visit the Publication Library to access articles relevant to SmartLab SE
SmartLab SE Events
Learn more about our products at these events
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EventDatesLocationEvent website
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AAPS PharmSci 360 - 2026October 25 2026 - October 28 2026New Orleans, LA, USA
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Conférence GDR MATEPINovember 2 2026 - November 6 2026Nice, France
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SERMACS 2026November 4 2026 - November 7 2026Memphis, TN, USA
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34th Leoben-Conference on Polymer Engineering and ScienceNovember 5 2026 - November 6 2026Leoben, Austria
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IWN2026（International Workshop on Nitride Semiconductors 2026）November 8 2026 - November 13 2026Kumamoto, Japan
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Webinar: Integrate Analytical Instruments into Your Self-driving LabNovember 11 2026 - November 11 2026Webinar
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Eastern Analytical Symposium (EAS) 2026November 16 2026 - November 18 2026New Jersey
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MATERIAUX 2026November 16 2026 - November 20 2026Grenoble, France
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German Epitaxy WorkshopNovember 25 2026 - November 27 2026Freiburg, Germany
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MRS Fall 2026November 29 2026 - December 4 2026Boston, MA, USA
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Advanced Automotive Battery Conf 2026December 8 2026 - December 11 2026Las Vegas, NV, USA
SmartLab SE Training
Upcoming training sessions
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TitleDatesCostLocationNotesCourse outlineRegistration form
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SmartLab training (EMEA)October 18 2026 - October 22 2026Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)March 7 2027 - March 11 2027Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)June 27 2027 - July 1 2027Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)October 17 2027 - October 21 2027Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
Contact Us
Whether you're interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.