SmartLab
Automated Multipurpose X‑ray Diffractometer (XRD) With Guidance Software
Powder diffraction, thin film metrology, SAXS, in-plane scattering, operando measurements
Rigaku SmartLab is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.
SmartLab Overview
This new X-ray diffraction system features the PhotonMax high-flux 9 kW rotating anode X-ray source coupled with a HyPix-3000 high-energy-resolution 2D multidimensional semiconductor detector that supports 0D, 1D and 2D measurement modes, allowing all applications to be handled with a single detector, eliminating the inconvenience of preparing and switching individual detectors for different applications. The HyPix-3000 detector can be used to obtain 2D powder diffraction patterns, which can be processed to deliver superior qualitative analysis by using all the 2D pattern information. The system incorporates a high-resolution θ/θ closed loop goniometer drive system with an available in-plane diffraction arm. The system’s new Cross-Beam-Optics (CBO) family feature fully automated switchable reflection and transmission optics (CBO-Auto).
XRD designed for usability
Coupling a computer controlled alignment system with a fully automated optical system, and the User Guidance functionality within the SmartLab Studio II software, makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.
XRD that is functionality redefined
Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the XRD functionality to make the measurements you want to make when you want to make them. The equipment accepts powder, liquid, films, and even textile samples and allows mapping measurements within suitable samples. Operando (a.k.a., real time in-situ) measurements can be performed with the new Rigaku SmartLab Studio II software suite, which is an integrated software platform incorporating all functions from measurement to analysis. The system also features robust security and validation protocols to ensure that any technology component - software or hardware - fulfills its purpose within regulatory guidelines, including 21 CFR Part 11, establishing the US EDA regulations governing electronic records and electronic signatures (ER/ES).
SmartLab Features
High-resolution micro area CBO-μ
SmartLab Videos
SmartLab Specifications
| Technique | X-ray diffraction (XRD) | |
|---|---|---|
| Benefit | Powder diffraction, thin film, SAXS, in-plane scattering, operando measurements | |
| Technology | Automated high-resolution θ-θ multipurpose X-ray diffractometer (XRD) with expert system Guidance software | |
| Attributes | 3 kW sealed X-ray tube CBO optics D/teX Ultra 250 silicon strip detector |
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| Options | PhotonMax high-flux 9 kW rotating anode X-ray source In-plane arm (5-axis goniometer) HyPix-3000 high energy resolution 2D HPAD detector Johansson Kα₁ optics |
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| Computer | External PC, MS Windows OS, SmartLab Studio II software | |
| Dimensions | 1300 (W) x 1880 (H) x 1300 (D) mm | |
| Mass | Approx. 750 kg (sealed tube) 850 kg (rotating anode) |
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| Power requirements | 1Ø, 200-230 V 50/60 Hz, 40 A or 3Ø, 200 V 50/60 Hz, 30 A (sealed tube) 3Ø, 200 V 50/60 Hz, 60 A (rotating anode) |
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SmartLab Options
The following accessories are available for this product:
SmartLab Application Notes
SmartLab Resources
Webinars
| X-ray Diffraction Measurements for Battery Research | Watch the Recording |
| Pair Distribution Function (PDF) Analysis for Everyday Battery Analysis | Watch the Recording |
| How to Run in Operando XRD Experiments | Watch the Recording |
| Total Diffraction and Amorphous Material Characterization | Watch the Recording |
| When to Use XRD and How to Set Up Experiments for Li-ion Battery Research | Watch the Recording |
| Simultaneous XRD-DSC – The sum Is Much Greater than the Parts | Watch the Recording |
| Component Analysis and Standardless Quantitative Analysis for Pharmaceutical Applications | Watch the Recording |
| In-Depth Overview of the Use of X-ray Diffraction (XRD) in the Investigation of Asbestos and Respirable Silica | Watch the Recording |
| Smartlab XRD Solution for Semiconductor Materials | Watch the Recording |
| Introduction of X-ray Analysis Solutions for Battery Materials | Watch the Recording |
| The Use of Atomic Pair Distribution Function Analysis to Verify Molecular Structure for Amorphous and Non-Crystalline Systems | Watch the Recording |
| Powder X-ray Diffraction (XRD) for Pharmaceuticals | Watch the Recording |
| Dissolution Rate Enchancement of Poorly Water Soluble Drugs - Role in XRPD in the Pharmaceutical Formaulation Development | Watch the Recording |
| Combined XRD-DSC for Pharmaceuticals | Watch the Recording |
| The Application of Chemometric and Statistical Analysis Techniques for X-ray Diffraction Data: Quantitative Analysis and Lot Release | Watch the Recording |
| Introduction of Part 11 Compliant Features in SmartLab Studio II | Watch the Recording |
| On the Diffraction Line Profiles in the Rietveld Method | Watch the Recording |
Rigaku Journal articles
Visit the Rigaku Journal resource page to access articles relevant to SmartLab
Publications
Visit the Publication Library to access articles relevant to SmartLab
SmartLab Events
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SmartLab Training
Upcoming training sessions
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