ZSX Primus IVš¾
Tube-Below Sequential Wavelength Dispersive X-ray Fluorescence Spectrometer
Uncompromised X-ray analysis of liquids, alloys, and plated metals
The tube-below high-performance model enables uncompromised analysis of samples such as liquids, alloys, and plated metals. Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus IVš¾ WDXRF spectrometer features a 30 micron Be tube window, the thinnest standard tube window in the industry, for exceptional light element (low-Z) detection limits.
ZSX Primus IVš¾ Overview
Vacuum (partition) system for analyzing liquids
Because the spectrometer chamber is always under vacuum, the change from vacuum atmosphere to helium atmosphere is completed in less than two minutes. Furthermore, the consumption of helium gas is significantly reduced compared to models where the spectrometer chamber must also be purged.
Improved throughput
Improved mechanics minimize the analysis dead time. For example, a 16-element sequential quantitative measurement time improved from 348 seconds to 287 seconds, representing an 18% increase in efficiency.
D-MCA high-speed analysis
The Digital Multi-Channel Analyzer (D-MCA) system facilitates high-speed digital processing for high count rates for improved analytical precision and increased throughput speeds.
Optical system not easily impacted by sample surface height variations
An uneven sample surface causes variations in the distance between the sample and the X-ray tube. These differences can lead to changes in the X-ray intensity. Rigaku optical systems enable suppression of X-ray intensity changes caused by variation in distance. This enables accurate analysis by minimizing the impact of shape differences from fusion molds used in glass bead formulation and the impact of uneven sample surfaces during pressing of powder samples.
Point/mapping analysis
Equipped with a high-resolution camera that allows the user to zoom in on small features for proper identification and analysis. Enables accurate analysis by eliminating differences in sensitivity caused by measurement placement. Superior design uses the hot-spot of the tube to maximize intensity/sensitivity.
Refined SQX analysis
SQX analysis is standardless FP analysis software for calculation of accurate elemental composition. Now easier to use than ever.
Automated center wire cleaning mechanism
The F-PC detector center wire gradually becomes contaminated by proportional counter quench gas, which diminishes resolution. The center wire cleaning mechanism enables restoration of performance by eliminating center wire contamination by means of electrical heating, with no need to shut off the power source or to open the cabinet.
ZSX Primus IVš¾ Features
ZSX Primus IVš¾ Videos
ZSX Primus IVš¾ Specifications
Technique | Wavelength dispersive X-ray fluorescence spectrometer (WDXRF) | |
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Benefit | Elemental analysis of solids, liquids, powders, alloys and thin films | |
Technology | Tube-above sequential WDXRF | |
Attributes | End window type Rh target 4 or 3 kW, 54-position autosampler, analyze Be to Cm, vacuum | |
Options | He-flush Additional analyzing crystals r-Īø stage/mapping |
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Computer | External PC, MS Windows OS, ZSX software | |
Dimensions | 840 (W) x 1440 (H) x 980 (D) mm | |
Mass | Approx. 600 kg (core unit) | |
Power requirements | 3-phase 200/208 V 40 A 50/60 Hz |
ZSX Primus IVš¾ Application Notes
ZSX Primus IVš¾ Resources
Webinars
Analysis of Hazardous Heavy Elements in Soil and Sediment | Watch the Recording |
A Non-Destructive XRF Technique for Rapid and Easy Screening of Residual Catalysts in APIs and Intermediates | Watch the Recording |
Quality control of API potency, excipient blend uniformity, and heavy metals impurities by non-destructive and direct analysis of intact pills by XRF | Watch the Recording |
Rigaku Journal articles
Wavelength dispersive X-ray fluorescence spectrometer ZSX Primus IVi | Read the Article |
Sample preparation for X-ray fluorescence analysis V. /ćFusion bead methodāpart 2: practical applications | Read the Article |
Sample preparation for X-ray fluorescence analysis IV./ Fusion bead methodāpart 1 basic principals | Read the Article |
Sample preparation for X-ray fluorescence analysis III. Pressed and loose powder methods | Read the Article |
Sample preparation for X-ray fluorescence analysis II. Pulverizing methods of powder samples | Read the Article |
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