ZSX Primus IVđť’ľ

Tube-Below Sequential Wavelength Dispersive X-ray Fluorescence Spectrometer

Uncompromised X-ray analysis of liquids, alloys, and plated metals

The tube-below high-performance model enables uncompromised analysis of samples such as liquids, alloys, and plated metals. Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus IVđť’ľ WDXRF spectrometer features a 30 micron Be tube window, the thinnest standard tube window in the industry, for exceptional light element (low-Z) detection limits.

ZSX Primus IVđť’ľ Overview

Vacuum (partition) system for analyzing liquids

Because the spectrometer chamber is always under vacuum, the change from vacuum atmosphere to helium atmosphere is completed in less than two minutes. Furthermore, the consumption of helium gas is significantly reduced compared to models where the spectrometer chamber must also be purged.

Improved throughput

Improved mechanics minimize the analysis dead time. For example, a 16-element sequential quantitative measurement time improved from 348 seconds to 287 seconds, representing an 18% increase in efficiency.

D-MCA high-speed analysis

The Digital Multi-Channel Analyzer (D-MCA) system facilitates high-speed digital processing for high count rates for improved analytical precision and increased throughput speeds.

Optical system not easily impacted by sample surface height variations

An uneven sample surface causes variations in the distance between the sample and the X-ray tube. These differences can lead to changes in the X-ray intensity. Rigaku optical systems enable suppression of X-ray intensity changes caused by variation in distance. This enables accurate analysis by minimizing the impact of shape differences from fusion molds used in glass bead formulation and the impact of uneven sample surfaces during pressing of powder samples.

Point/mapping analysis

Equipped with a high-resolution camera that allows the user to zoom in on small features for proper identification and analysis. Enables accurate analysis by eliminating differences in sensitivity caused by measurement placement. Superior design uses the hot-spot of the tube to maximize intensity/sensitivity.

Refined SQX analysis

SQX analysis is standardless FP analysis software for calculation of accurate elemental composition. Now easier to use than ever.

Automated center wire cleaning mechanism

The F-PC detector center wire gradually becomes contaminated by proportional counter quench gas, which diminishes resolution. The center wire cleaning mechanism enables restoration of performance by eliminating center wire contamination by means of electrical heating, with no need to shut off the power source or to open the cabinet.

ZSX Primus IVđť’ľ Features

Assisted measurement and analysis support: ZSX Guidance
Automated analysis settings features enhanced third-generation SQX analysis software
ZSX Guidance software
Built-in XRF expertise handles sophisticated settings. Available application packages enable turn-key operations
Intuitive software programmable for everyday analysis using sample trays
Sample ID settings for each tray (facilitates easy copy-and-paste for efficient measurement setup)
Improved accuracy of liquid sample analysis
Correction of geometry effect caused by geometry of liquid sample cups
High-speed, high-precision measurements
Efficiency of the new drive sequence decreases instrument overhead time
Unique functionality
The tube-below optics enables convenient functionality, including new sample film corrections

ZSX Primus IVđť’ľ Videos

ZSX Primus IVđť’ľ Specifications

Technique Wavelength dispersive X-ray fluorescence spectrometer (WDXRF)
Benefit Elemental analysis of solids, liquids, powders, alloys and thin films
Technology Tube-above sequential WDXRF
Attributes End window type Rh target 4 or 3 kW, 54-position autosampler, analyze Be to Cm, vacuum
Options He-flush
Additional analyzing crystals
r-θ stage/mapping
Computer External PC, MS Windows OS, ZSX software
Dimensions 840 (W) x 1440 (H) x 980 (D) mm
Mass Approx. 600 kg (core unit)
Power requirements 3-phase 200/208 V 40 A 50/60 Hz

ZSX Primus IVđť’ľ Application Notes

The following application notes are relevant to this product

ZSX Primus IVđť’ľ Resources


Analysis of Hazardous Heavy Elements in Soil and Sediment Watch the Recording
A Non-Destructive XRF Technique for Rapid and Easy Screening of Residual Catalysts in APIs and Intermediates Watch the Recording
Quality control of API potency, excipient blend uniformity, and heavy metals impurities by non-destructive and direct analysis of intact pills by XRF Watch the Recording

Rigaku Journal articles

adobeWavelength dispersive X-ray fluorescence spectrometer ZSX Primus IVi Read the Article
adobeSample preparation for X-ray fluorescence analysis V. / Fusion bead method—part 2: practical applications Read the Article
adobeSample preparation for X-ray fluorescence analysis IV./ Fusion bead method―part 1 basic principals Read the Article
adobeSample preparation for X-ray fluorescence analysis III. Pressed and loose powder methods Read the Article
adobeSample preparation for X-ray fluorescence analysis II. Pulverizing methods of powder samples Read the Article

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