ZSX Primus IV
Tube-above sequential wavelength dispersive X-ray fluorescence spectrometer
Elemental analysis of solids, liquids, powders, alloys and thin films
As a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the Rigaku ZSX PrimusIV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Supported by LabLinc Studio
ZSX Primus IV Overview
New ZSX Guidance expert system XRF software
ZSX Guidance supports you in all aspects of XRF measurement and data analysis. Can accurate analysis only be performed by experts ? No—that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
Exceptional light element XRF performance with inverted optics for superior reliability
ZSX PrimusIV features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time. Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX PrimusIV WDXRF spectrometer features a 30 micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits.
Mapping and multi-spot XRF analysis
Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX PrimusIV allows easy detailed XRF spectrometric investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. Available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.
SQX fundamental parameters with EZ-scan software
EZ-scan allows users to perform XRF elemental analysis of unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.
Nitrogen or Helium Flush mechanism
Nitrogen gas can now be used as the atmospheric gas in place of helium. When nitrogen gas is used, the SQX analysis range is 15P to 96Cm. When measuring in nitrogen atmosphere, the standard option “SQX scattering FP method” is not applicable.
ZSX Primus IV Features
ZSX Primus IV Videos
ZSX Primus IV Specifications
| Technique | Wavelength dispersive X-ray fluorescence (WDXRF) | |
|---|---|---|
| Benefit | Elemental analysis of solids, liquids, powders, alloys and thin films | |
| Technology | Tube-above sequential WDXRF | |
| Attributes | 3 or 4 kW sealed X-ray tube, 48-position autosampler, analyze Be to U, vacuum | |
| Options | He-flush, additional analyzing crystals, r-θ stage/mapping | |
| Computer | External PC, MS Windows OS, ZSX software | |
| Dimensions | 1310 (W) x 1470 (H) x 890 (D) mm | |
| Mass | Approx. 620 kg (core unit) | |
| Power requirements | 1Ø, 200 VAC 50/60 Hz, 8 kW | |
ZSX Primus IV Options
The following accessories are available for this product:
Automation Solution
Automatically transports measurement samples to the instrument, enabling continuous measurement.
Ultra Carry
Ultra Carry is a novel disposable (single-use) sample retainer for XRF analysis used to preconcentrate a liquid sample into a uniform sample carrier optimized for the suppression of background noise.
ZSX Primus IV Application Notes
The following application notes are relevant to this product
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XRF1131 - Standardless FP Analysis of Lithium-ion Battery Cathode Material LiFePO₄ by ZSX Primus IV
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BATT1021 - Composition Analysis for Argyrodite-Based Sulfide Solid Electrolyte Material
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BATT1007 - Impurity Analysis for Graphite Anodes
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BATT1006 - Impurity Analysis for NCM Cathode Material
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BATT0004 - Chemical Composition Analysis of NMC Cathode
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BATT0001 - Battery Material Development
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WDXRF1099 - Trace Element Analysis in Geological Samples by the Pressed Powder Method, using GEO-TRACE-PAK
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WDXRF1085 - Trace Element Analysis for Water Solution by Micro-droplet Method using Ultra Carry Filter Paper
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WDXRF1068 - Silicate Rock Analysis by Fusion Method
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WDXRF1071 - Semi-quantitative FP Analysis of Geological Samples
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WDXRF1023 - Pt, Rh and Pd Analysis of Used Automobile Catalyst by WDXRF
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WDXRF1084 - Mapping and Small Spot Analysis with a General-Purpose XRF Spectrometer
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WDXRF1101 - Fused Bead Analysis for Refractories using Application Package Refractory Series
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WDXRF1100 - Fused Bead Analysis for Wide Concentration Ranges of Various Oxide Materials using OXIDE-FB-PAK
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WDXRF1092 - Fixed Angle Measurement using the Semi-Quantitative Analysis Function SQX of ZSX Guidance Software
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WDXRF1096 - Fe, Ni and Co Based Alloy Analysis by Fundamental Parameter Method using ZSX Primus III+
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WDXRF1070 - Chlorine Analysis of Aluminosilicate for Fluid Catalytic Cracking Catalyst by WDXRF
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WDXRF1086 - Boron and Fluorine Quantitative Analysis for Water Solution by Micro-droplet Method using Ultra Carry Filter Paper
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WDXRF1088 - Boron Analysis in Glass Powder
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WDXRF1091 - Beryllium Analysis in Beryllium Copper Alloy using ZSX Primus IV with RX85
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WDXRF1109 - Automatic Quant Application Setup Applied to Calibrating Coal Fly Ash Fused Beads
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WDXRF1089 - Analysis of Hazardous Heavy Elements in Soil and Sediment using ZSX Primus IV
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WDXRF1126 - Accurate Quantitative Analysis of Ferrosilicon by the Fusion Method using ZSX Primus III NEXT
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WDXRF1124 - Quantitative Analysis of Blast Furnace Slag by Fusion Method on the ZSX Primus III NEXT
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WDXRF1121 - Quantitative Analysis of Cast Iron using ZSX Primus III NEXT
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WDXRF1123 - Quantitative Analysis of Stainless Steel using the ZSX Primus III NEXT
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WDXRF1122 - Silicate Rock Analysis by Fusion Bead Method on ZSX Primus III NEXT
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WDXRF1120 - Quantitative Analysis of Low Alloy Steel using the ZSX Primus III NEXT
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WDXRF1119 - Cement Raw Meal Analysis by Pressed Powder Method on the ZSX Primus III NEXT
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WDXRF1060 - Elemental Determination of Whole Coal by the Pressed Powder Method
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WDXRF1047 - Highly Accurate Determination of Total Iron in Natural and Processed Iron Ores using Pressed Powder Method
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WDXRF1063 - Thickness/composition of ITO Thin Film by FP Method
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WDXRF1102 - Standardless FP Analysis of Plant, Animal and Food Samples Applying Correction by Scattering Line
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WDXRF1090 - Semi-quantitative Analysis of Recycled Solid Fuel with Benchtop WDXRF Supermini200
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WDXRF1059 - Semi-quantitative Analysis of Glass Raw Materials
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WDXRF1036 - Semiquant Analysis by the SQX Scatter FP Method
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WDXRF1062 - Quantitative Analysis of Soda-lime Glass
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WDXRF1042 - Quantitative Analysis of Low Alloy Steel using the Supermini200
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WDXRF1055 - Quantitative Analysis of Aluminum Alloy on Supermini200
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WDXRF1061 - Polymetallic Sulfide Ore Analysis with Supermini200
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WDXRF1048 - Fused Bead Analysis for Wide Concentration Ranges of Various Oxide Materials on Benchtop WDXRF
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WDXRF1058 - Quantitative Analysis of Dolomite and Limestone by Pressed powder Method with Supermini200
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WDXRF1066 - Determination of Chemical Composition of Nickel Laterite Ore by Fusion Method
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WDXRF1041 - Copper Concentrate by Pressed Powder Method
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WDXRF1040 - Cement Raw Meal by the Pressed Powder Method
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WDXRF1114 - Cement Analysis by the Pressed Powder Method on Benchtop WDXRF Supermini200 According to ASTM C114-18
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WDXRF1115 - Cement Analysis by the Fusion Method on Benchtop WDXRF Supermini200 According to ASTM C114-18
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WDXRF1110 - Cement Analysis by the Fusion Method According to ASTM C114-18
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WDXRF1052 - Accurate Determination for Elements in Laterite Ores by Pressed Powder Method
ZSX Primus IV Resources
Webinars
Visit the Webinar resource page to access Webinars relevant to ZSX Primus IV
Rigaku Journal articles
Visit the Rigaku Journal resource page to access articles relevant to ZSX Primus IV
Publications
Visit the Publication Library to access articles relevant to ZSX Primus IV
ZSX Primus IV Events
Learn more about our products at these events
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EventDatesLocationEvent website
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AAPS PharmSci 360 - 2026October 25 2026 - October 28 2026New Orleans, LA, USA
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SERMACS 2026November 4 2026 - November 7 2026Memphis, TN, USA
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Webinar: Integrate Analytical Instruments into Your Self-driving LabNovember 11 2026 - November 11 2026Webinar
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Eastern Analytical Symposium (EAS) 2026November 16 2026 - November 18 2026New Jersey
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MRS Fall 2026November 29 2026 - December 4 2026Boston, MA, USA
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Advanced Automotive Battery Conf 2026December 8 2026 - December 11 2026Las Vegas, NV, USA
ZSX Primus IV Training
Upcoming training sessions
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TitleDatesCostLocationNotesCourse outlineRegistration form
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ZSX Primus IV & Supermini200 training (EMEA)November 30 2026 - December 2 2026Please contact ECOE@rigaku.comNeu-Isenburg, GermanyZSX Primus IV & Supermini200 training
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ZSX Primus IV & Supermini200 training (EMEA)February 8 2027 - February 10 2027Please contact ECOE@rigaku.comNeu-Isenburg, GermanyZSX Primus IV & Supermini200 training
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ZSX Primus IV & Supermini200 training (EMEA)August 2 2027 - August 4 2027Please contact ECOE@rigaku.comNeu-Isenburg, GermanyZSX Primus IV & Supermini200 training
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ZSX Primus IV & Supermini200 training (EMEA)December 6 2027 - December 8 2027Please contact ECOE@rigaku.comNeu-Isenburg, GermanyZSX Primus IV & Supermini200 training
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