SmartLab Studio II

本产品可选配以下附件：

XRD Measurement Plugin

A measurement package built by experts in XRD

Powder XRD Plugin

The state-of-the-art consolidated powder X-ray analysis package

AI Plugin - Phase Identification

This module can improve your productivity when you often analyze similar samples but have difficulty identifying minor phases such as impurities, foreign materials, etc.

AI Plugin - XRD Component Decomposition

This AI-powered module can separate an X-ray diffraction (XRD) pattern of an unknown mixture into multiple components and quantify each phase.

AI Plugin - X-ray Reflectivity Analysis

This AI-powered module can suggest how to adjust your simulation model to improve the quality and accuracy of X-ray reflectivity (XRR) analysis.

PDF Analysis

The PDF can extract information about interatomic distances and coordination numbers from scattering patterns independent of the crystallinity of the material.

RMC Method

The RMC method provides real space information as follows: revised structure mode, partial correlation, angular histogram.

Total Scattering Measurement

The Total Scattering Measurement uses not only diffraction peaks but also diffuse scattering, which is treated as background in powder XRD measurement, for analysis.

Measurement and PDF plug-in

An integrated software package for X-ray analysis from measurement to analysis.

XRR Plugin

X-ray reflectivity analysis software for a wide range of applications, from film thickness to detailed multilayer structure analysis

Stress Plugin

Stress plugin for a variety of purposes from QC to R&D

HRXRD Plugin

An integrated reciprocal lattice map and high-resolution rocking curve plugin for epitaxial films analysis

Texture Plugin

Texture plugin is designed to analyze the ODF (Orientation Distribution Function) from pole figure data measured with 0D or 2D detectors.

MRSAXS Plugin

Determination of particle/pore size distribution ranging from nano- to submicron order

PDF Plugin

The PDF plugin can calculate RDF (radial distribution function) and PDF (pair distribution function) with Fourier transform of S(Q) (Structure factor).

Data Visualization Plugin

The Data Visualization plugin efficiently processes thousands of data sets collected by operando measurements such as temperature-controlled measurements and displays the results in an easy-to-understand manner.

XRD-DSC Plugin

User-friendly tool for simultaneous XRD-DSC measurement

EasyX Plugin

Screening/plugin for quality control affording easy measurement, automated analysis and visualization of analysis result

以下应用说明与本产品相关

• B-XRD1162 - In-situ Evaluation of Orientation in Polymer Films at Different Draw Ratios by Wide Angle X-ray Scattering

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• B-XRD1169 - Temperature-dependent Analysis of Polymer Crystallization Behavior Using High-speed Time-resolved Measurement

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• B-XRD1165 - Phase Identification and Quantitative Analysis of Iron Ore by X-ray Diffraction

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• XRD1014 - Ab-initio Crystal Structure Determination of a Cu-MOF Using Powder Diffraction Data Obtained from a Benchtop X-ray Diffractometer

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• XRD2001 - Orientation and Residual Stress Evaluation in Metal Thin Films

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• XRD1161 - MiniFlex XpC for Clinker Application

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• XRD1160 - Fast Analysis of Mineralogical Phases in Blended Cements using Miniflex XpC

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• PHRM0002 - In-Situ DSC-Humidity PXRD Analysis for Pharmaceuticals

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• BATT0002 - Battery Material Characterization

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• BATT0001 - Battery Material Development

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• B-XRD1143 - Verifying the Validity of Crystallite Sizes Determined by the FP Method

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• B-XRD1129 - Variable Humidity Measurement of a Drug Substance using XRD-DSC and a Humidity Controller

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• B-XRD1109 - Structure Determination of Ferroelectric Nano-powder by PDF Analysis

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• B-XRD1131 - Structural Characterization of Zeolite by PDF Analysis

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• B-XRD1136 - Structural Characterization of Zeolite by Electron Density Analysis

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• B-XRD1112 - Structural Analysis of Amorphous Silica by PDF Analysis

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• B-XRD3001 - Stress Distribution of a Shot Peened Coil Spring

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• B-XRD1123 - Simultaneous Operando XRD Measurement for Positive and Negative Electrode Materials

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• B-XRD1076 - Rietveld Quantitative Analysis of Trace Components in Cement

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• B-XRD1080 - Rietveld Analysis of Battery Material using a Mo Source

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• B-XRD1118 - Quick Pole Figure Measurement of a Metal Material using 2DD

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• B-XRD1119 - Quantitative Characterization of Polymer film by Orientation Function

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• B-XRD1081 - Quantitative Analysis of Polymorphic Impurities in a Drug Substance by the Calibration Method

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• B-XRD1120 - Quantitative Analysis of Pharmaceutical Polymorphic Forms via the DD Method

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• B-XRD1115 - Quantitative Analysis of γ-Al₂O₃ by the DD Method

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• B-XRD1132 - Quantitative Analysis of Glass with the DD Method

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• B-XRD1142 - Quantitative Analysis of Crystal Polymorphs by the DD Method

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• B-XRD1093 - Quantitative Analysis of Amorphous Components in Cement

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• B-XRD1001 - Quantitative Analysis of a 4-component Sample

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• B-XRD1111 - Quantitative Analysis of 3-component Sample by DD method

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• B-XRD1125 - Quantification of the Taste of Salt by DD (Direct Derivation) Method

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• B-XRD1146 - Quantification of Blast Furnace Slag by Rietveld Refinement using Reference Intensity Ratio

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• B-XRD1002 - Quantification of a 4-component Sample using RIR method

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• B-XRD1043 - Powder Crystal Structure of Organic Crystals

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• B-XRD1121 - Phase Identification of Mixed Powder by Real-time Analysis

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• B-XRD2023 - Phase Identification of an Organic Thin Film by GIWAXS Measurement with a 2D detector

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• B-XRD1103 - Phase Identification of a Coarse-grained Trace Component in a Mineral Powder using 2D XRD

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• B-XRD2020 - Phase ID and Orientation Analysis for Thin Film SOFC Material using 2DD

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• B-XRD1137 - Phase ID Analysis of Micro-impurities on the Surface of a Tablet by Micro-area XRD Measurements

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• B-XRD1021 - Phase Changes of Pharmaceuticals as a Function of Temperature and Humidity

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• B-XRD1110 - Particle Size Distribution Analysis of Ferroelectric Nanopowder by USAXS

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• B-XRD1102 - Particle Size / Distribution of Pigment Ink by USAXS

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• B-XRD1030 - Particle Diameter Distribution of Gold Nanoparticles

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• B-XRD2009 - Orientation Analysis of Organic Thin Film on Single Crystal Sub by In-plane XRD

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• B-XRD1124 - Operando Transmission XRD Measurement of All-solid-state Lithium-ion Battery using Ag Source

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• B-XRD2028 - Off-normal Fiber Texture Analysis by Pole Figure Measurement

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• B-XRD1133 - Observation of Phase Transition Behavior of Pharmaceutical Materials with a Benchtop XRD System

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• B-XRD2032 - Observation of Orientation State of Polypropylene Film Products by 2D-GIWAXS Measurement

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• B-XRD1020 - Observation of Dehydration Process of Hydrate by XRD-DSC

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• B-XRD1128 - Observation of Dehydration Behavior of a Drug Substance using TG-DTA and XRD-DSC

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• B-XRD1026 - Observation of Crystallization Behavior of Ionic Liquids by XRD-DSC

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• B-XRD1135 - Observation of Butter Crystal by Simultaneous XRD-DSC Measurement

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• B-XRD1060 - MiniFlex Measurement of Trace Samples

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• B-XRD1089 - Micro-area Mapping Measurement of Printed Circuit Boards

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• B-XRD1023 - Measurement of Pseudo-polymorph Impurities in Tablets

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• B-XRD1063 - Measurement of a Film Sample

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• B-XRD1107 - Material Characterization by PDF and RDF Analysis

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• B-XRD1114 - LOQ of Trace Impurities in API by the DD Method

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• XRD1003 - How to Evaluate Solid Pharmaceutical Drugs (3): Confirming Hydrates

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• XRD1002 - How to Evaluate Solid Pharmaceutical Drugs (2): Confirming the Presence/absence of Amorphous Substances

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• XRD1001 - How to Evaluate Solid Pharmaceutical Drugs (1): Confirming the crystal form of an API

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• B-XRD1101 - High-T analysis - MiniFlex with HyPix-400 MF / BTS 500

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• B-XRD1105 - High-speed in-situ Measurement of Melting Process of Metal

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• B-XRD1147 - High-precision Quantitative Analysis of Clinker Mineral Polymorphs by Rietveld Refinement

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• B-XRD2021 - High-speed RSM of an Epitaxial Film by 1D Detection Mode

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• B-XRD2024 - High-speed RSM of a III-nitride Epitaxial Film by 1D Detection Mode

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• B-XRD2030 - Evaluation of Uniformity of Thin Film Thickness by X-ray Reflectivity Mapping

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• B-XRD2027 - Evaluation of Uniformity of a Single CrystalSubstrate by Rocking Curve Measurement

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• B-XRD1122 - Evaluation of the Crystallinity of a Carious Tooth using X-ray Diffraction

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• B-XRD3005 - Evaluation of Residual Stress of Thin Films by GI-XRD and the Multiple hkl Method

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• B-XRD1113 - Evaluation of Oxidation State by the BVS Method

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• B-XRD1150 - Evaluation of Graphitization Degree of Lithium-ion Battery Carbon Anode Material by X-ray Diffractometry

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• B-XRD1104 - Evaluation of Grain Condition and Orientation of Cemented carbide using 2D XRD

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• B-XRD2031 - Evaluation of Curvature of a Single Crystal Substrate by Rocking Curve Measurement

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• B-XRD1078 - Evaluation of Crystallite Size and Pore Size distribution of Fuel Cell Materials

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• B-XRD1149 - Evaluation of Barium Titanate Polymorphs by Rietveld Analysis

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• B-XRD1108 - Direct Observation of Melting and Crystallization of Fresh Cream

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• B-XRD1126 - Crystallization of Chocolate Observed by XRD-DSC

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• B-XRD1018 - Crystallite Size Distribution of Zinc Oxide Nanoparticles

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• B-XRD1072 - Crystallite Size Analysis Analysis of a Microvolume of Metallic Nanoparticles with a Benchtop X-ray Diffractometer

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• B-XRD1071 - Crystallite Size Analysis of a Catalyst Material by the Scherrer Method

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• B-XRD1035 - Crystal Structure Analysis of a Powder Sample of Pharmaceutical Cocrystals by the Rietveld Method

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• B-XRD2006 - Crystal Orientation Evaluation of Epitaxial Film and Ultrathin Buffer Layers by In-plane Reciprocal Space Mapping

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• B-XRD1014 - Crystal Orientation Analysis of Rolled Sheet Material by Pole Figure Measurement

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• B-XRD2022 - Crystal Defect Analysis by X-ray Reflection Topography

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• B-XRD1139 - Calculation of Molecular Stacking Spacing of Copper Phthalocyanine using PDF Analysis

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• B-XRD2025 - Analysis of Uniaxially Oriented Film by Wide-range RSM

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• B-XRD2026 - Analysis of Epitaxial Films on In-plane Anisotropic Substrates by Wide-Range RSM

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• B-XRD1141 - Observation of time-dependent hydration reaction by X-ray diffractometry

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• B-XRD1140 - Accurate and Highly Precise Quantitative Analysis of Cement Samples using Rietveld Refinement

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• B-XRD1011 - Temperature Dependence of a Lattice Constant

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