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SmartLab SE 概览
SmartLab Studio II软件集成智能引导专家系统，可为针对特定应用的测量需求，智能推荐最优硬件配置和参数设置。该软件能筛选适配的光学器件，确定仪器设置并执行测量，实现全自动的测量流程。此外，得益于SmartLab SE的内置组件识别功能，智能导引导系统不仅能输出最优配置 ，还会在配置不当时发出警告。专家级智能决策与硬件配置验证相结合，共同构筑了SmartLab SE平台的基础。
HyPix-400：新一代二维探测器
伴随着 SmartLab SE，理学同步推出了可选配的 HyPix-400探测器。这是一款专为多 功能X 射线衍射仪设计的半导体混合像素阵列探测器。具备大有效探测面积、高角度分辨率和超高动态范围三大优势，是粉末衍射、薄膜衍射等多场景下兼具性能与经济性的二维探测解决方案。此外，系统支持D/teX Ultra 250 硅条探测器作为标准配置。
自动对准以最大化运行时间
传统衍射仪上更换硬件配置或耗材时通常依赖售后工程师的操作，存在导致成本高昂、耗时费力。SmartLab SE 采用自动对准的光学系统，从X射线管高度校准到单色器对准，全流程由计算机自动控制完成。这一功能显著减少了停机时间，降低了了总体拥有成本，并确保仪器始终处于最佳工作状态。
SmartLab SE 功能
SmartLab SE 视频
SmartLab SE 技术规格
| 技术原理 | X 射线衍射（XRD） | |
|---|---|---|
| 应用场景 | 粉末衍射、薄膜衍射、小角散射（SAXS）、极图、残余应力和非环境原位实验 | |
| 仪器类型 | 内置智能引导系统的多功能θ-θ X 射线衍射仪 | |
| 标准配置 | 3 kW 密封 X 射线管 D/teX Ultra 250 硅条探测器 垂直型 θ-θ 测角仪 |
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| 可选配置 | 二维 HPAD探测器HyPix-400 | |
| 控制系统 | 外置PC、MS Windows 操作系统、SmartLab Studio II 软件 | |
| 尺寸 | 1270（宽）×1880（高）×1220（深）mm | |
| 整机质量 | 约 800 千克（核心部件） | |
| 电源要求 | 三相： 200 V AC 50/60 Hz 30 A 单相： 220-230 V AC 50/60 Hz 40 A |
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SmartLab SE 选配项目
本产品可选配以下附件：
Solid-State Battery Cell Attachment
Enables In Operando XRD analysis of a complete and functioning rechargeable solid-state cell.
Liquid Electrolyte Cell Attachment
Holds the individual components of a battery (anode, cathode, liquid electrolyte, etc.) to form a working rechargeable cell.
Laminate/Pouch Cell Attachment
Holds a laminate/pouch type rechargeable cell for In Operando XRD analysis.
Coin Cell Attachment - Reflection
Holds a coin cell horizontally for reflection geometry X-ray beam for In Operando XRD analysis.
Coin Cell Attachment - Transmission
Holds a coin cell vertically for transmission geometry X-ray beam for In Operando XRD analysis.
SmartLab SE 应用说明
以下应用说明与本产品相关
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XRD2001 - Orientation and Residual Stress Evaluation in Metal Thin Films
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BATT1012 - Inference of Valence and Li Ion Diffusion Path Using the BVS Method
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BATT1011 - Measurement of Cathode Material NCM Using XSPA-400 ER High-Energy Resolution Detector
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BATT1010 - Investigation of Phase Transition Behavior upon Cathode Material NCM Firing
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BATT1001 - Qualitative Analysis of Impurities (Sulfate) in Mixed Nickel-Cobalt Sulfide
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PHRM0002 - In-Situ DSC-Humidity PXRD Analysis for Pharmaceuticals
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BATT0001 - Battery Material Development
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B-XRD1129 - Variable Humidity Measurement of a Drug Substance using XRD-DSC and a Humidity Controller
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B-XRD1001 - Quantitative Analysis of a 4-component Sample
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B-XRD1111 - Quantitative Analysis of 3-component Sample by DD method
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B-XRD1002 - Quantification of a 4-component Sample using RIR method
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B-XRD1103 - Phase Identification of a Coarse-grained Trace Component in a Mineral Powder using 2D XRD
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B-XRD1021 - Phase Changes of Pharmaceuticals as a Function of Temperature and Humidity
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B-XRD1020 - Observation of Dehydration Process of Hydrate by XRD-DSC
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B-XRD1128 - Observation of Dehydration Behavior of a Drug Substance using TG-DTA and XRD-DSC
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B-XRD1117 - Observation of a Phase Transition at High Temperature under Various Atmospheres
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B-XRD1023 - Measurement of Pseudo-polymorph Impurities in Tablets
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B-XRD1113 - Evaluation of Oxidation State by the BVS Method
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B-XRD1150 - Evaluation of Graphitization Degree of Lithium-ion Battery Carbon Anode Material by X-ray Diffractometry
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B-XRD1149 - Evaluation of Barium Titanate Polymorphs by Rietveld Analysis
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B-XRD1018 - Crystallite Size Distribution of Zinc Oxide Nanoparticles
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B-XRD2025 - Analysis of Uniaxially Oriented Film by Wide-range RSM
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B-XRD2026 - Analysis of Epitaxial Films on In-plane Anisotropic Substrates by Wide-Range RSM
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B-XRD1168 - Phase identification and Quantitative Analysis of Nickel Ore by X-ray Diffraction
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B-XRD1166 - Phase Identification and Quantitative Analysis of Copper Ore by X-ray Diffraction
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B-XRD1165 - Phase Identification and Quantitative Analysis of Iron Ore by X-ray Diffraction
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XRD1014 - Ab-initio Crystal Structure Determination of a Cu-MOF Using Powder Diffraction Data Obtained from a Benchtop X-ray Diffractometer
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B-XRD1155 - Detection of trace components in battery cathode materials using a seamless pixel array detector
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B-XRD1148 - Composition ratio classification of ternary cathode material by cluster analysis
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B-XRD1143 - Verifying the Validity of Crystallite Sizes Determined by the FP Method
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B-XRD1076 - Rietveld Quantitative Analysis of Trace Components in Cement
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B-XRD1119 - Quantitative Characterization of Polymer film by Orientation Function
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B-XRD1115 - Quantitative Analysis of γ-Al₂O₃ by the DD Method
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B-XRD1142 - Quantitative Analysis of Crystal Polymorphs by the DD Method
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B-XRD1093 - Quantitative Analysis of Amorphous Components in Cement
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B-XRD1125 - Quantification of the Taste of Salt by DD (Direct Derivation) Method
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B-XRD1146 - Quantification of Blast Furnace Slag by Rietveld Refinement using Reference Intensity Ratio
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B-XRD1121 - Phase Identification of Mixed Powder by Real-time Analysis
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B-XRD1030 - Particle Diameter Distribution of Gold Nanoparticles
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B-XRD1060 - MiniFlex Measurement of Trace Samples
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B-XRD1063 - Measurement of a Film Sample
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B-XRD1114 - LOQ of Trace Impurities in API by the DD Method
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XRD1003 - How to Evaluate Solid Pharmaceutical Drugs (3): Confirming Hydrates
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XRD1002 - How to Evaluate Solid Pharmaceutical Drugs (2): Confirming the Presence/absence of Amorphous Substances
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XRD1001 - How to Evaluate Solid Pharmaceutical Drugs (1): Confirming the crystal form of an API
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B-XRD1101 - High-T analysis - MiniFlex with HyPix-400 MF / BTS 500
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B-XRD1105 - High-speed in-situ Measurement of Melting Process of Metal
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B-XRD1147 - High-precision Quantitative Analysis of Clinker Mineral Polymorphs by Rietveld Refinement
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B-XRD3005 - Evaluation of Residual Stress of Thin Films by GI-XRD and the Multiple hkl Method
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B-XRD1104 - Evaluation of Grain Condition and Orientation of Cemented carbide using 2D XRD
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B-XRD1078 - Evaluation of Crystallite Size and Pore Size distribution of Fuel Cell Materials
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B-XRD1071 - Crystallite Size Analysis of a Catalyst Material by the Scherrer Method
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B-XRD1014 - Crystal Orientation Analysis of Rolled Sheet Material by Pole Figure Measurement
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B-XRD1009 - Charging-discharging of Cathode Materials in Li-ion Batteries
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B-XRD1106 - Charge/discharge Process of Li-ion Battery Positive Electrode
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B-XRD1127 - Background Reduction for Iron Oxide with CuKα X-rays using XRF Mode
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B-XRD1141 - Observation of time-dependent hydration reaction by X-ray diffractometry
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B-XRD1140 - Accurate and Highly Precise Quantitative Analysis of Cement Samples using Rietveld Refinement
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B-XRD1011 - Temperature Dependence of a Lattice Constant
SmartLab SE 资源
网络研讨会
| X射线衍射技术在电池研究中的应用 | 观看录音 |
| 如何在进行原位（operando）XRD 实验 | 观看录音 |
| 何时使用 XRD 以及如何为锂离子电池研究设置实验 | 观看视频 |
| XRD-DSC同步表征 - 总和远大于部分 | 观看记录 |
| 制药领域中的成分分析和无标样定量分析 | 观看记录 |
| X 射线衍射 (XRD) 在石棉和可吸入二氧化硅中的深度应用综述 | 观看录音 |
| 制药领域中的粉末 X 射线衍射 (XRD)应用 | 观看记录 |
| 难溶性药物溶出速率的提升 - X 射线衍射在药物制剂开发中的关键作用 | 观看记录 |
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XRD-DSC 联用技术在制药领域的应用研究 |
观看视频 |
| 化学计量学与统计分析在 X 射线衍射数据中的应用：定量分析与批次放行标准 | 观看记录 |
| SmartLab Studio II 软件中Part 11合规性功能解析 | 观看录音 |
| Rietveld精修方法中的衍射线谱图分析 | 观看录音 |
理学期刊文章
SmartLab SE 活动
在以下活动中了解更多我们的产品
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活动日期地点活动网站
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AAPS PharmSci 360 - 20262026年10月25日 - 2026年10月28日New Orleans, LA, USA
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Conférence GDR MATEPI2026年11月2日 - 2026年11月6日Nice, France
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SERMACS 20262026年11月4日 - 2026年11月7日Memphis, TN, USA
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34th Leoben-Conference on Polymer Engineering and Science2026年11月5日 - 2026年11月6日Leoben, Austria
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IWN2026（International Workshop on Nitride Semiconductors 2026）2026年11月8日 - 2026年11月13日Kumamoto, Japan
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Webinar: Integrate Analytical Instruments into Your Self-driving Lab2026年11月11日 - 2026年11月11日Webinar
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Eastern Analytical Symposium (EAS) 20262026年11月16日 - 2026年11月18日New Jersey
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MATERIAUX 20262026年11月16日 - 2026年11月20日Grenoble, France
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German Epitaxy Workshop2026年11月25日 - 2026年11月27日Freiburg, Germany
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MRS Fall 20262026年11月29日 - 2026年12月4日Boston, MA, USA
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Advanced Automotive Battery Conf 20262026年12月8日 - 2026年12月11日Las Vegas, NV, USA
SmartLab SE 培训
即将举行的培训课程
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标题日期费用地点备注课程大纲报名表
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SmartLab training (EMEA)2027年3月7日 - 2027年3月11日Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)2027年6月27日 - 2027年7月1日Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)2027年10月17日 - 2027年10月21日Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
