Simultix15

For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision, such as steel and cement. Nearly 1,000 Simultix XRF instruments have been delivered to customers around the world. Along with technological progress over these years, customer requirements have advanced and diversified as well. Simultix 15 WDXRF elemental analyzer was developed to meet these changing needs. It offers significantly improved performance, functions, and usability.

XRF for fast, precise elemental analysis

Analyze beryllium (Be) through uranium (U) in almost any sample matrix. The most important metrics for automated process control are precision, accuracy and sample throughput. With up to 30 (and optionally 40) discrete and optimized elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power, Simultix 15 delivers unparalleled analytical speed and sensitivity. Coupled to powerful but easy-to-use software, with extensive data reduction capabilities and maintenance functionality, this instrument is the perfect elemental analysis metrology tool.

Elemental analysis by XRF with full automation

For high-throughput applications, automation is a fundamental requirement. Rigaku Simultix 15 WDXRF spectrometer may be fitted with a 48-position Automatic Sample Changer (ASC). For full automation, the optional Sample Loading Unit provides right or left side belt-in feed from a third party sample preparation automation system.

Elemental analysis by simultaneous WDXRF

In contrast to the more common sequential WDXRF instrumentation, where elements are measured one after the other using a scanning goniometer equipped with an analyzing crystal changer mechanism, simultaneous WDXRF speeds up the measurement process. Each Rigaku Simultix 15 XRF spectrometer is customized for your specific elemental analysis applications with a set of discrete, optimized fixed channels for the elements of interest. All channels measure simultaneously—without moving parts, without time delay and without compromise. This makes simultaneous WDXRF the best solution in terms of time-to-result, precision, reliability, low cost-per-analysis and instrument longevity. For additional flexibility, Simultix 15 wavelength dispersive X-ray fluorescence spectrometer may be optionally equipped with a scanning goniometer for analysis of other elements as well as XRD channels for phase analysis.