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Notice to customers in North, Central, and South America

Sections of the United States are under a winter weather warning, which includes the possibility of freezing rain, lower than normal temperatures, or large accumulations of snow. Some regions could lose power, including Texas, where the headquarters of Rigaku Americas and Applied Rigaku Technologies are located. Be advised that staff in the affected areas might be slow to respond. Some employees might be offline and unable to respond to your request.

If you need immediate customer service, you can contact us at: 1-888-362-2324.

We appreciate your patience. Any potential disruptions should be over by Tuesday.
Semiconductor

XRR, EDXRF & Optical Tools

XRR (X-ray reflectometry): Provides thickness, density, and roughness information for single layers or complex multilayer film stacks.

EDXRF (Energy dispersive X-ray fluorescence): An elemental analysis technique for film thickness and composition.

Optical methods: Techniques utilizing visible light to inspect / characterize 2D and 3D structures.

Hybrid metrology: Combining micro-spot EDXRF, 2D optical microscopy, and 3D confocal optical scanning for In-line, non-destructive inspection and metrology.  This combination of complementary techniques is well-suited for back-end-of-line (BEOL) and packaging applications.

Products

Application notes

Explore the example analyses to see which analytical technique is right for you.

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