Rigaku at E-MRS 2025 Spring Meeting

Advancing materials science with precision X-ray metrology

Join Rigaku Europe at the European Materials Research Society (E-MRS) Spring Meeting to experience the forefront of X-ray analytical solutions for compound semiconductors, thin films, and advanced materials.

Let’s connect at Booth 30

Our team of experts will be available throughout the event to demonstrate tools, discuss applications, and explore solutions tailored to your research.

Applications we support

Explore how Rigaku enables precision metrology across:

Compound semiconductors (SiC, GaN, InP)
Power & RF devices
Advanced packaging and photonics
Thin film materials and interfaces

View Application Notes

XRTmicron: X-ray topography for quality control

· Non-destructive inspection for compound semiconductor
· Detect dislocations
· Ideal for SiC, GaN, AlN, and GaAs

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SmartLab & SmartLab SE: Intelligent XRD systems

· High-resolution X-ray diffraction
· Ideal for thin films, epitaxial layers, and nanostructure analysis
· Auto-alignment and multi-purpose optics

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MiniFlex: Compact power for everyday XRD

· Tabletop diffraction with exceptional performance
· Fast results for academic labs, R&D, and QA/QC

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XRTmicron (Lab)

XRT (X-ray topography) imaging system for emerging power electronics, optoelectronics, and 5G / 6G communications (SiC, GaN, GaAs, InP, Ga₂O₃) for up to 300 mm wafers

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