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Compound Semiconductor Metrology with Rigaku

Precision X-ray solutions for GaN, SiC, photonics, and quantum computing

April 7-9, 2025 | Brussels, Belgium | Booth [# 70]

The compound semiconductor industry is evolving rapidly, with new materials and structures driving innovation in GaN, SiC, photonics, and quantum computing. As these technologies transition from lab to fab, precise and reliable X-ray metrology is critical for ensuring quality and performance.

Join Rigaku at CS International 2025 to explore the latest advancements in X-ray characterization, connect with our experts, and discover how our cutting-edge solutions are shaping the future of semiconductor manufacturing.

Why meet Rigaku at CS International?​

  • Learn about our latest innovations – Discover how our X-ray metrology solutions enhance compound semiconductor manufacturing.​
  • Network with industry experts – Engage with our team and explore strategic partnerships.​
  • Gain a competitive edge – Learn how precision metrology is shaping the future of advanced semiconductor materials.​

Visit our booth to:

Featured presentation by Assunta Vigliante​

Technological Director, Rigaku Semiconductor Metrology Division​​

GaN: Going beyond fast charging​
X-ray Metrology Solutions for Compound Semiconductors from Labs to Fabs

csinternational.net

Assunta Vigliante

X-ray characterization of compound semiconductors has been extensively used for over three decades in the lab space and is relatively limited in the fab space. However, in the past five years, the demand for X-ray metrology is noticeably increased due to the introduction of new materials for power devices like SiC and GaN, photonics, quantum computing, and new complex thin film structures. In this presentation, I will provide an overview of the X-ray metrology solutions and the progress in the X-ray technology which have enabled the transition from the lab to a fab environment.

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