使用台式WDXRF 通过熔融法对多种氧化 材料的广泛浓度范围进行分析

使用台式WDXRF 通过熔融法对多种氧化 材料的广泛浓度范围进行分析

AppNote XRF1048: 使用台式WDXRF 通过熔融法对多种氧化 材料的广泛浓度范围进行分析

简介

X 射线荧光（XRF）分析中，熔融法是一个有效的样品制备技术，由于该技术根据晶粒尺寸和矿物学差异消除了不均一性，用于获得粉末样品精确的分析结果。此外，玻璃化材料属性的均匀化，通过使用熔片和试剂的合成标准物质或使用多种基准物质，使能够扩大校正范围。

此应用报告说明了使用Supermini200 ―一个台式波长色散（WD）XRF 光谱仪，通过熔融法建立例如矿物、矿石和耐熔物等不同材料的单一工作曲线。

XRF application note XRF1048
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WDXRF Products from Rigaku

Supermini200 High-power Benchtop Sequential WDXRF Spectrometer

Supermini200

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

ZSX Primus IV Tube-Above Sequential WDXRF Spectrometer ZSX Primus 4

ZSX Primus IV

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

ZSX Primus IVi Tube-Below Sequential WDXRF Spectrometer ZSX Primus 4

ZSX Primus IV𝒾

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

ZSX Primus 400 wavelength dispersive XRF for large samples

ZSX Primus 400

WDXRF spectrometer designed to handle very large and/or heavy samples

Simultix 15 tube-above simultaneous wavelength dispersive X-Ray fluorescence spectrometer

Simultix 15

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U

Wavelength dispersive X-ray fluorescence sulfur (S) analyzer

Micro-Z ULS

WDXRF ultra low sulfur analyzer for method ASTM D2622

Wavelength dispersive X-ray fluorescence chlorine analyzer

Micro-Z CL

WDXRF ultralow chlorine analyzer

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