ZSX Primus IV

    Tube-Above Sequential Wavelength Dispersive X-ray Fluorescence Spectrometer

    Elemental analysis of solids, liquids, powders, alloys and thin films

    As a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.

    ZSX Primus IV Overview

    New ZSX Guidance expert system XRF software

    ZSX Guidance supports you in all aspects of XRF measurement and data analysis. Can accurate analysis only be performed by experts ? No—that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.

    Exceptional light element XRF performance with inverted optics for superior reliability

    ZSX Primus IV features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time. Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus IV WDXRF spectrometer features a 30 micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits.

    Mapping and multi-spot XRF analysis

    Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX Primus IV allows easy detailed XRF spectrometric investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. Available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.

    SQX fundamental parameters with EZ-scan software

    EZ-scan allows users to perform XRF elemental analysis of unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.

    ZSX Primus IV Features

    Analysis of elements from Be to U
    ZSX Guidance expert system software
    Digital multi-channel analyzer (D-MCA)
    EZ Analysis interface for routine measurements
    Tube above optics minimizes contamination issues
    Small footprint uses less valuable lab space
    Micro analysis to analyze samples as small as 500 µm
    30μ tube delivers superior light element performance
    Mapping feature for elemental topography/distribution
    Helium seal means the optics are always under vacuum

    ZSX Primus IV Videos

    ZSX Primus IV Specifications

    Technique Wavelength dispersive X-ray fluorescence (WDXRF)
    Benefit Elemental analysis of solids, liquids, powders, alloys and thin films
    Technology Tube-above sequential WDXRF
    Attributes 3 or 4 kW sealed X-ray tube, 48-position autosampler, analyze Be to U, vacuum
    Options He-flush, additional analyzing crystals, r-θ stage/mapping
    Computer External PC, MS Windows OS, ZSX software
    Dimensions 1310 (W) x 1470 (H) x 890 (D) mm
    Mass Approx. 620 kg (core unit)
    Power requirements 1Ø, 200 VAC 50/60 Hz, 8 kW

    ZSX Primus IV Application Notes

    The following application notes are relevant to this product

    ZSX Primus IV Resources

    Webinars

    Analysis of Hazardous Heavy Elements in Soil and Sediment Watch the Recording
    Building Quantitative XRF Methods on the ZSX Primus IV for Pharmaceuticals Watch the Recording
    A Non-Destructive XRF Technique for Rapid and Easy Screening of Residual Catalysts in APIs and Intermediates Watch the Recording
    Direct CNOX analysis of solid forms for confirmation of composition and determination of salts/stoichiometry, hydrates, and solvates by WDXRF Watch the Recording
    The Use of Easy XRF Elemental Analyses Techniques to Support the Development of Pharmaceutical Formulations Watch the Recording
    Quality control of API potency, excipient blend uniformity, and heavy metals impurities by non-destructive and direct analysis of intact pills by XRF Watch the Recording

    Rigaku Journal articles

    adobeX-ray Fluorescence Analysis of Liquid Samples without Helium Gas Read the Article
    adobeStandardless FP XRF analysis for lithium ion battery electrode materials Read the Article
    adobeX-ray analysis of a magnesium alloy expected to be a useful lightweight material Read the Article
    adobeOIL-MULTI-PAK for multi-elements analysis of oils using pre-calibration package Read the Article
    adobeWater analysis by X-ray fluorescence spectrometry using UltraCarry Read the Article
    adobeDetermination of refractory products with the XRF quantitative application package Read the Article
    adobeAdvanced ZSX Guidance—Semi-quantitative analysis (SQX analysis) Read the Article
    adobeCement analysis by wavelength dispersive XRF spectrometry Read the Article
    adobeSample preparation for X-ray fluorescence analysis VIII. Liquid solidification method Read the Article
    adobeComparison of analysis results between the fusion method and the pressed powder method for powder sample analysis Read the Article
    adobeHow to measure trace amounts of sample by X-ray fluorescence analysis Read the Article
    adobeThickness and composition analysis of thin film samples using FP method by XRF analysis Read the Article
    adobeWavelength dispersive X-ray fluorescence spectrometer: ZSX Primus IV Read the Article
    adobeSample preparation for X-ray fluorescence analysis V. / Fusion bead method—part 2: practical applications Read the Article
    adobeSample preparation for X-ray fluorescence analysis IV./ Fusion bead method―part 1 basic principals Read the Article
    adobeSample preparation for X-ray fluorescence analysis III. Pressed and loose powder methods Read the Article
    adobeSample preparation for X-ray fluorescence analysis II. Pulverizing methods of powder samples Read the Article
    adobeX-ray fluorescence analysis by fusion bead method for ores and rocks Read the Article
    adobeTrace heavy element analysis for wastewater and river water by X-ray fluorescence spectrometry Read the Article

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