2D semiconductor detector with large active area (approx. 3000 mm²), small pixel size (100 μm²), ultra-high dynamic range, high sensitivity, and XRF suppression by high and low energy discrimination. Seamless switching from 2D-TDI (Time Delay and Integration) mode to 2D snapshot mode to 1D-TDI mode to 0D mode with a single detector.

High-temperature sample heating stage with strip heater for powder XRD of refractory materials. The use of a tungsten strip offers extremely high temperature and fast heating and cooling, the strip pre-stressing mechanism ensures high sample position stability.

Temperature range:

with W-strip: 25 °C to 2300 °C in vacuum
with Pt -strip: 25 °C to 1600 °C in air, vacuum

Atmospheres: vacuum(10⁻⁴ mbar), inert gas, air

High-temperature sample heating stage with strip heater for powder diffraction. Allows for very fast heating and cooling and ensures high sample position stability with heating strip pre-stressing.

Temperature range:

with Pt-strip: 25 °C to 1600 °C in air, vacuum
with Ta and C-strip: 25 °C to 1500 °C in vacuum

Atmospheres: air, inert gas, vacuum(10⁻⁴ mbar)

Sample heating stage with spherical X-ray window for in-situ texture and thin film analysis. Compact and light-weight stage with air-cooling.

Temperature range: 25 °C to 1100°C

Atmospheres: air, inert gas, vacuum(10⁻¹ mbar)

High-temperature heating stage for powders and polycrystalline solid samples. Heating to 1200 °C in air and vacuum possible.

Main features:

• furnace heater for good temperature uniformity
• sample spinning for good data quality
• capillary option for transmission XRD
• easy sample loading

Temperature range: 25 °C to 1200 °C

Atmospheres: air, inert gas, vacuum(10⁻⁴ mbar)

Sample cooling and heating stage with spherical X-ray window for in-situ texture and thin film analysis. Compact and light-weight stage with liquid nitrogen sample cooling.

Temperature range: -100 °C to 350 °C

Atmospheres: air, inert gas, vacuum(10⁻¹ mbar)

The optional secondary monochromator can be used with the D/teX Ultra 250 silicon strip detector for outstanding energy resolution. If the D/teX Ultra 250 is used in conjunction with the secondary monochromator an energy resolution of 320 eV is achieved, or 4% with CuKα.

Allows xy positioning of the sample in the X-ray beam. 20 mm, 50 mm, and 75 mm translations available.

Allows xy positioning of the sample in the X-ray beam. 20 mm, 50 mm, and 75 mm translations available.

The D/teX Ultra 250 HE is a special silicon strip detector that is optimized for high energy X-ray work by utilizing a thicker detector material. For Cr, Fe, Co, and Cu, the efficiency is approximately 99%. With Mo radiation the efficiency is approximately 70%.

The D/tex Ultra 250 is a 1D silicon strip detector that decreases data acquisition time by almost 50% compared to competitive detectors. This is achieved by increasing the active area of the aperture and thus increasing the count rate. Compared to the previous model, the D/teX Ultra, has a smaller pixel pitch (0.075mm) and is longer in the direction of 2θ. For researchers who are interested in the lowest XRF suppression possible, the combination of an optional receiving monochromator and low-enrgy discrimination offer outstanding suppression.

The TTK 600 Low-Temperature Chamber is a non-ambient attachment for powder X-ray diffraction studies from -190°C to 600°C. Different sample holders allow investigating samples in reflection and transmission geometry. Samples can be measured in vacuum, air or inert gases. An antechamber option allows safe transfer of air-sensitive samples into the TTK 600.

The TTK 600 fits to all common powder diffractometers and is the instrument of choice for X-ray structure analysis of various sample types at low and medium temperatures.

• Non-ambient attachment for X-ray diffraction studies from -190 °C to 600 °C
• For investigations on samples in reflection and transmission geometry
• Also for air-sensitive samples and in-operando studies on batteries
• Fits to all common powder diffractometers

Simultaneous collection of XRD and DSC data eliminates the uncertainty of separate measurements. With the addition of a humidity generator, the XRD-DSC system provides the ability to study crystalline-amorphous and amorphous-amorphous changes at constant temperature and variable humidity or variable humidity at constant temperature.

• Enables simultaneous characterization of dehydration, polymorphic phase transitions, melting, crystallization, and decomposition of geological samples
• Distinguishes exothermic and endothermic reactions and provides their enthalpies and temperatures
• Probes the effects of temperature history and heat treatment on structural and thermal properties
• Requires only milligrams of sample
• Humidity attachment for hydration studies