Automated Multipurpose X‑ray Diffractometer (XRD) With Guidance Software

Powder diffraction, thin film metrology, SAXS, in-plane scattering, operando measurements

Rigaku SmartLab is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.

SmartLab Overview

This new X-ray diffraction system features the PhotonMax high-flux 9 kW rotating anode X-ray source coupled with a HyPix-3000 high-energy-resolution 2D multidimensional semiconductor detector that supports 0D, 1D and 2D measurement modes, allowing all applications to be handled with a single detector, eliminating the inconvenience of preparing and switching individual detectors for different applications. The HyPix-3000 detector can be used to obtain 2D powder diffraction patterns, which can be processed to deliver superior qualitative analysis by using all the 2D pattern information. The system incorporates a high-resolution θ/θ closed loop goniometer drive system with an available in-plane diffraction arm. The system’s new Cross-Beam-Optics (CBO) family feature fully automated switchable reflection and transmission optics (CBO-Auto).

XRD designed for usability

Coupling a computer controlled alignment system with a fully automated optical system, and the User Guidance functionality within the SmartLab Studio II software, makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.

XRD that is functionality redefined

Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the XRD functionality to make the measurements you want to make when you want to make them. The equipment accepts powder, liquid, films, and even textile samples and allows mapping measurements within suitable samples. Operando (a.k.a., real time in-situ) measurements can be performed with the new Rigaku SmartLab Studio II software suite, which is an integrated software platform incorporating all functions from measurement to analysis. The system also features robust security and validation protocols to ensure that any technology component - software or hardware - fulfills its purpose within regulatory guidelines, including 21 CFR Part 11, establishing the US EDA regulations governing electronic records and electronic signatures (ER/ES).

SmartLab Features

Available in-plane arm (5-axis goniometer)
High-flux X-ray source: PhotonMax
HyPix-3000 high energy resolution 2D HPAD detector
New CBO family
Fully automated beam switchable CBO-Auto
High-resolution micro area CBO-μ
Operando measurements with SmartLab Studio II software
Multi-year component warranty contributes to low cost of ownership

SmartLab Videos

SmartLab Specifications

Technique X-ray diffraction (XRD)
Benefit Powder diffraction, thin film, SAXS, in-plane scattering, operando measurements
Technology Automated high-resolution θ-θ multipurpose X-ray diffractometer (XRD) with expert system Guidance software
Attributes 3 kW sealed X-ray tube
CBO optics
D/teX Ultra 250 silicon strip detector
Options PhotonMax high-flux 9 kW rotating anode X-ray source
In-plane arm (5-axis goniometer)
HyPix-3000 high energy resolution 2D HPAD detector
Johansson Kα₁ optics
Computer External PC, MS Windows OS, SmartLab Studio II software
Dimensions 1300 (W) x 1880 (H) x 1300 (D) mm
Mass Approx. 750 kg (sealed tube)
850 kg (rotating anode)
Power requirements 1Ø, 200-230 V 50/60 Hz, 40 A or 3Ø, 200 V 50/60 Hz, 30 A (sealed tube)
3Ø, 200 V 50/60 Hz, 60 A (rotating anode)

SmartLab Options

SmartLab Application Notes

The following application notes are relevant to this product

SmartLab Resources


X-ray Diffraction Measurements for Battery Research Watch the Recording
Pair Distribution Function (PDF) Analysis for Everyday Battery Analysis Watch the Recording
How to Run in Operando XRD Experiments Watch the Recording
Total Diffraction and Amorphous Material Characterization Watch the Recording
When to Use XRD and How to Set Up Experiments for Li-ion Battery Research Watch the Recording
Simultaneous XRD-DSC – The sum Is Much Greater than the Parts Watch the Recording
Component Analysis and Standardless Quantitative Analysis for Pharmaceutical Applications Watch the Recording
In-Depth Overview of the Use of X-ray Diffraction (XRD) in the Investigation of Asbestos and Respirable Silica Watch the Recording
Smartlab XRD Solution for Semiconductor Materials Watch the Recording
Introduction of X-ray Analysis Solutions for Battery Materials Watch the Recording
The Use of Atomic Pair Distribution Function Analysis to Verify Molecular Structure for Amorphous and Non-Crystalline Systems Watch the Recording
Powder X-ray Diffraction (XRD) for Pharmaceuticals Watch the Recording
Dissolution Rate Enchancement of Poorly Water Soluble Drugs - Role in XRPD in the Pharmaceutical Formaulation Development Watch the Recording
Combined XRD-DSC for Pharmaceuticals Watch the Recording
The Application of Chemometric and Statistical Analysis Techniques for X-ray Diffraction Data: Quantitative Analysis and Lot Release Watch the Recording
Introduction of Part 11 Compliant Features in SmartLab Studio II Watch the Recording
On the Diffraction Line Profiles in the Rietveld Method Watch the Recording

Rigaku Journal articles

Visit the Rigaku Journal resource page to access articles relevant to SmartLab


Visit the Publication Library to access articles relevant to SmartLab

SmartLab Events

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SmartLab Training

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  • I'd strongly recommend the system: it truly is easy to get to grips with, even for a non-specialist. The software guidance and simple hardware fittings are a game-changer for hands-on use.
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    Joseph Wright
    University of East Anglia
  • Big advantage of SmartLab is in simple and rapid change between individual diffractometer configurations followed by automated and reliable optics and sample alignments. This possibility together with high photon flux of rotating anode source significantly increased the throughput of our laboratory, increased the number of measured samples together with the high quality of measured data.
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    Milan Dopita
    Charles University
  • The big advantages of the instrument are especially the in-plane arm, allowing for non-coplanar X-ray diffraction measurements without tilting the sample, and easy procedures for X-ray optics exchange and realignment.
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    Ondřej Caha
    Masarykova univerzita

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