SmartLab Studio II
Software Suite for Rigaku X-ray Diffractometers
Integrates user privileges, measurements, analyses, data visualization and reporting
SmartLab Studio II is a new Windows-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components.
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SmartLab Studio II Overview
Just one click switches from measurement to analysis. Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop by selecting an appropriate layout. The software provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc.
Announcing: Total scattering measurements and PDF analysis
The reverse Monte-Carlo (RMC) option has been added to the SmartLab Studio II PDF plug-in. Accordingly, detailed information about total scattering measurements and PDF analysis is now available on a web page. For details, please refer to the following link: Total Scattering Measurements and PDF Analysis
SmartLab Studio II Features
SmartLab Studio II Videos
SmartLab Studio II Options
The following accessories are available for this product:
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AI Plugin - Phase Identification
This module can improve your productivity when you often analyze similar samples but have difficulty identifying minor phases such as impurities, foreign materials, etc.
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AI Plugin - XRD Component Decomposition
This AI-powered module can separate an X-ray diffraction (XRD) pattern of an unknown mixture into multiple components and quantify each phase.
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AI Plugin - X-ray Reflectivity Analysis
This AI-powered module can suggest how to adjust your simulation model to improve the quality and accuracy of X-ray reflectivity (XRR) analysis.
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PDF Analysis
The PDF can extract information about interatomic distances and coordination numbers from scattering patterns independent of the crystallinity of the material.
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RMC Method
The RMC method provides real space information as follows: revised structure mode, partial correlation, angular histogram.
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Total Scattering Measurement
The Total Scattering Measurement uses not only diffraction peaks but also diffuse scattering, which is treated as background in powder XRD measurement, for analysis.
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Measurement and PDF plug-in
An integrated software package for X-ray analysis from measurement to analysis.
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XRR Plugin
X-ray reflectivity analysis software for a wide range of applications, from film thickness to detailed multilayer structure analysis
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HRXRD Plugin
An integrated reciprocal lattice map and high-resolution rocking curve plugin for epitaxial films analysis
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Texture Plugin
Texture plugin is designed to analyze the ODF (Orientation Distribution Function) from pole figure data measured with 0D or 2D detectors.
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MRSAXS Plugin
Determination of particle/pore size distribution ranging from nano- to submicron order
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PDF Plugin
The PDF plugin can calculate RDF (radial distribution function) and PDF (pair distribution function) with Fourier transform of S(Q) (Structure factor).
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Data Visualization Plugin
The Data Visualization plugin efficiently processes thousands of data sets collected by operando measurements such as temperature-controlled measurements and displays the results in an easy-to-understand manner.
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EasyX Plugin
Screening/plugin for quality control affording easy measurement, automated analysis and visualization of analysis result
SmartLab Studio II Application Notes
The following application notes are relevant to this product
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PHRM0002 - In-Situ DSC-Humidity PXRD Analysis for Pharmaceuticals
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BATT0003 - Battery Performance
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BATT0002 - Battery Material Characterization
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BATT0001 - Battery Material Development
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B-XRD1143 - Verifying the Validity of Crystallite Sizes Determined by the FP Method
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B-XRD1129 - Variable Humidity Measurement of a Drug Substance using XRD-DSC and a Humidity Controller
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B-XRD1109 - Structure Determination of Ferroelectric Nano-powder by PDF Analysis
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B-XRD1131 - Structural Characterization of Zeolite by PDF Analysis
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B-XRD1136 - Structural Characterization of Zeolite by Electron Density Analysis
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B-XRD1112 - Structural Analysis of Amorphous Silica by PDF Analysis
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B-XRD3001 - Stress Distribution of a Shot Peened Coil Spring
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B-XRD1123 - Simultaneous Operando XRD Measurement for Positive and Negative Electrode Materials
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B-XRD1076 - Rietveld Quantitative Analysis of Trace Components in Cement
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B-XRD1080 - Rietveld Analysis of Battery Material using a Mo Source
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B-XRD1118 - Quick Pole Figure Measurement of a Metal Material using 2DD
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B-XRD1119 - Quantitative Characterization of Polymer film by Orientation Function
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B-XRD1081 - Quantitative Analysis of Polymorphic Impurities in a Drug Substance by the Calibration Method
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B-XRD1120 - Quantitative Analysis of Pharmaceutical Polymorphic Forms via the DD Method
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B-XRD1115 - Quantitative Analysis of γ-Al₂O₃ by the DD Method
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B-XRD1132 - Quantitative Analysis of Glass with the DD Method
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B-XRD1142 - Quantitative Analysis of Crystal Polymorphs by the DD Method
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B-XRD1001 - Quantitative Analysis of a 4-component Sample
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B-XRD1111 - Quantitative Analysis of 3-component Sample by DD method
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B-XRD1125 - Quantification of the Taste of Salt by DD (Direct Derivation) Method
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B-XRD1146 - Quantification of Blast Furnace Slag by Rietveld Refinement using Reference Intensity Ratio
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B-XRD1002 - Quantification of a 4-component Sample using RIR method
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B-XRD1043 - Powder Crystal Structure of Organic Crystals
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B-XRD1121 - Phase Identification of Mixed Powder by Real-time Analysis
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B-XRD2023 - Phase Identification of an Organic Thin Film by GI-WAXS Measurement with a 2D detector
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B-XRD1103 - Phase Identification of a Coarse-grained Trace Component in a Mineral Powder using 2D XRD
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B-XRD2020 - Phase ID and Orientation Analysis for Thin Film SOFC Material using 2DD
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B-XRD1137 - Phase ID Analysis of Micro-impurities on the Surface of a Tablet by Micro-area XRD Measurements
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B-XRD1021 - Phase Changes of Pharmaceuticals as a Function of Temperature and Humidity
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B-XRD1110 - Particle Size Distribution Analysis of Ferroelectric Nanopowder by USAXS
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B-XRD1102 - Particle Size / Distribution of Pigment Ink by USAXS
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B-XRD1030 - Particle Diameter Distribution of Gold Nanoparticles
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B-XRD2009 - Orientation Analysis of Organic Thin Film on Single Crystal Sub by In-plane XRD
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B-XRD2028 - Off-normal Fiber Texture Analysis by Pole Figure Measurement
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B-XRD1133 - Observation of Phase Transition Behavior of Pharmaceutical Materials with a Benchtop XRD System
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B-XRD2032 - Observation of Orientation State of Polypropylene Film Products by 2D-GI-WAXS Measurement
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B-XRD1020 - Observation of Dehydration Process of Hydrate by XRD-DSC
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B-XRD1128 - Observation of Dehydration Behavior of a Drug Substance using TG-DTA and XRD-DSC
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B-XRD1026 - Observation of Crystallization Behavior of Ionic Liquids by XRD-DSC
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B-XRD1135 - Observation of Butter Crystal by Simultaneous XRD-DSC Measurement
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B-XRD1089 - Micro-area Mapping Measurement of Printed Circuit Boards
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B-XRD1023 - Measurement of Pseudo-polymorph Impurities in Tablets
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B-XRD1063 - Measurement of a Film Sample
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B-XRD1107 - Material Characterization by PDF and RDF Analysis
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B-XRD1114 - LOQ of Trace Impurities in API by the DD Method
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XRD1003 - How to Evaluate Solid Pharmaceutical Drugs (3): Confirming Hydrates
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XRD1001 - How to Evaluate Solid Pharmaceutical Drugs (1): Confirming the crystal form of an API
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B-XRD1105 - High-speed in-situ Measurement of Melting Process of Metal
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B-XRD1147 - High-precision Quantitative Analysis of Clinker Mineral Polymorphs by Rietveld Refinement
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B-XRD2021 - High-speed RSM of an Epitaxial Film by 1D Detection Mode
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B-XRD2024 - High-speed RSM of a III-nitride Epitaxial Film by 1D Detection Mode
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B-XRD2030 - Evaluation of Uniformity of Thin Film Thickness by X-ray Reflectivity Mapping
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B-XRD2027 - Evaluation of Uniformity of a Single CrystalSubstrate by Rocking Curve Measurement
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B-XRD1122 - Evaluation of the Crystallinity of a Carious Tooth using X-ray Diffraction
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B-XRD3005 - Evaluation of Residual Stress of Thin Films by GI-XRD and the Multiple hkl Method
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B-XRD1113 - Evaluation of Oxidation State by the BVS Method
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B-XRD1150 - Evaluation of Graphitization Degree of Lithium-ion Battery Carbon Anode Material by X-ray Diffractometry
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B-XRD1104 - Evaluation of Grain Condition and Orientation of Cemented carbide using 2D XRD
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B-XRD2031 - Evaluation of Curvature of a Single Crystal Substrate by Rocking Curve Measurement
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B-XRD1078 - Evaluation of Crystallite Size and Pore Size distribution of Fuel Cell Materials
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B-XRD1149 - Evaluation of Barium Titanate Polymorphs by Rietveld Analysis
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B-XRD1108 - Direct Observation of Melting and Crystallization of Fresh Cream
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B-XRD1126 - Crystallization of Chocolate Observed by XRD-DSC
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B-XRD1018 - Crystallite Size Distribution of Zinc Oxide Nanoparticles
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B-XRD1072 - Crystallite Size Analysis Analysis of a Microvolume of Metallic Nanoparticles with a Benchtop X-ray Diffractometer
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B-XRD1071 - Crystallite Size Analysis of a Catalyst Material by the Scherrer Method
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B-XRD1035 - Crystal Structure Analysis of a Powder Sample of Pharmaceutical Cocrystals by the Rietveld Method
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B-XRD2006 - Crystal Orientation Evaluation of Epitaxial Film and Ultrathin Buffer Layers by In-plane Reciprocal Space Mapping
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B-XRD1014 - Crystal Orientation Analysis of Rolled Sheet Material by Pole Figure Measurement
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B-XRD2022 - Crystal Defect Analysis by X-ray Reflection Topography
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B-XRD1139 - Calculation of Molecular Stacking Spacing of Copper Phthalocyanine using PDF Analysis
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B-XRD2025 - Analysis of Uniaxially Oriented Film by Wide-range RSM
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B-XRD2026 - Analysis of Epitaxial Films on In-plane Anisotropic Substrates by Wide-Range RSM
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B-XRD1141 - Accurate and Highly Precise Quantitative Analysis of Cement Samples using Rietveld Refinement
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B-XRD1140 - Accurate and Highly Precise Quantitative Analysis of Cement Samples using Rietveld Refinement
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B-XRD1011 - Temperature Dependence of a Lattice Constant
SmartLab Studio II Resources
Webinars
| X-ray Diffraction Measurements for Battery Research | Watch the Recording |
| Pair Distribution Function (PDF) Analysis for Everyday Battery Analysis | Watch the Recording |
| How to Run in Operando XRD Experiments | Watch the Recording |
| When to Use XRD and How to Set Up Experiments for Li-ion Battery Research | Watch the Recording |
| Simultaneous XRD-DSC – The sum Is Much Greater than the Parts | Watch the Recording |
| Component Analysis and Standardless Quantitative Analysis for Pharmaceutical Applications | Watch the Recording |
| In-Depth Overview of the Use of X-ray Diffraction (XRD) in the Investigation of Asbestos and Respirable Silica | Watch the Recording |
| Curved Image Plate for Rapid Laboratory-based X-ray Total Scattering Measurements: Applications to PDF Analysis | Watch the Recording |
| Powder X-ray Diffraction (XRD) for Pharmaceuticals | Watch the Recording |
| Dissolution Rate Enhancement of Poorly Water Soluble Drugs - Role in XRPD in the Pharmaceutical Formaulation Development | Watch the Recording |
| Combined XRD-DSC for Pharmaceuticals | Watch the Recording |
| Introduction of Part 11 Compliant Features in SmartLab Studio II | Watch the Recording |
| On the Diffraction Line Profiles in the Rietveld Method | Watch the Recording |
Rigaku Journal articles
 Total X-ray Scattering (TXS) Plugin |
Read the Article |
| Quantification analysis of cement materials |
Read the Article |
| SmartLab Studio II Data Visualization plugin —Analysis examples of micro area XY mapping using CBO-μ— |
Read the Article |
| Real-time analysis and display function using SmartLab Studio II |
Read the Article |
| Integrated X-ray diffraction software -- SmartLab Studio II |
Read the Article |
| Integrated X-ray diffraction software / SmartLab Studio II |
Read the Article |
Publications
Visit the Publication Library to access articles relevant to SmartLab Studio II
SmartLab Studio II Events
Learn more about our products at these events
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EventDatesLocationEvent website
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IcAUMS 2025April 20 2025 - April 23 2025Okinawa, Japan
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CERAMICS Expo 2025April 27 2025 - April 29 2025Novi, MI, USA
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IEEE-IAS/PCA Cement Conference 2025May 3 2025 - May 7 2025Birmingham, AL, USA
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ChemUK 2025May 20 2025 - May 21 2025Birmingham, UK
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EMRS Spring Meeting 2025May 25 2025 - May 29 2025Strasbourg, France
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Rigaku Symposium at YaleMay 27 2025 - May 29 2025New Haven, CT
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Enhancing Pharma Processes - #4: Manufacturing and QCJune 17 2025 - June 17 2025Webinar
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Rigaku Battery Forum 2025June 23 2025 - June 24 2025Neu-Isenburg, Germany
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2025 European School on MagnetismJune 29 2025 - July 10 2025Cambridge, UK
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The Advanced Materials Show and The Advanced Ceramics Show 2025July 8 2025 - July 9 2025Birmingham, UK
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AIC 2025 congressSeptember 1 2025 - September 4 2025Florence Italy
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FEMS Euromat 2025September 13 2025 - September 17 2025Granada, Spain
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EMRS Fall meeting 2025September 14 2025 - September 17 2025Warsaw, Poland
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EuroMOF 2025September 20 2025 - September 23 2025Crete, Greece
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Gulf Coast Conference 2025October 13 2025 - October 14 2025Galveston, TX, United States
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ICMM 2025 2025October 26 2025 - October 30 2025Bordeaux, France
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CONGRESO GEOLÓGICO DE ESPAÑA 2025November 4 2025 - November 6 2025Zaragoza, Spain
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Rayons X et Matière 2025November 17 2025 - November 20 2025Orleans, France
SmartLab Studio II Training
Upcoming training sessions
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TitleDatesCostLocationNotesCourse outlineRegistration form
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SmartLab training (EMEA)June 29 2025 - July 3 2025Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)October 19 2025 - October 23 2025Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
Contact Us
Whether you're interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.