SmartLab Studio II

Software Suite for Rigaku X-ray Diffractometers

Integrates user privileges, measurements, analyses, data visualization and reporting

SmartLab Studio II is a new Windows-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components.

Now Artifical Intelligence Powered

SmartLab Studio II splash screen

SmartLab Studio II Overview

Expert XRD results. No expertise required.

SmartLab Studio II (SLS II) is the automation engine that powers the SmartLab multipurpose X-ray diffractometer. It transforms how you interact with XRD by guiding users in selecting the optimum configuration, aligning optics, and recommending best measurement conditions.

With SLS II, you don’t need to memorize complicated settings or worry about system alignment. The software’s built-in Guidance wizard asks what you want to measure and configures everything for you. It checks the current setup using intelligent sensors, suggests any necessary changes, automatically aligns the optics and sample, and starts collecting high-quality data—all with minimal input.

SLS II brings together automatic alignment, guided setup, and advanced data visualization into a single platform. It’s the key to making XRD faster, easier, and more accessible for every user in your lab.

Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop. Just one click switches from measurement to SLS II analysis modules with a simple flow-bar interface that will guide users through the analysis and reporting process. A wide variety of applications are available, including phase identification, reflectivity, residual stress, reciprocal space mapping, crystallite size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, in-situ or operando, and cluster data analyses. Its comprehensive data visualization tools make both the data analysis and reporting less complicated.

Announcing: Total scattering measurements and PDF analysis

The reverse Monte-Carlo (RMC) option has been added to the SmartLab Studio II PDF plug-in.  Accordingly, detailed information about total scattering measurements and PDF analysis is now available on a web page. For details, please refer to the following link: Total Scattering Measurements and PDF Analysis

SmartLab Studio II Features

Seamless operations from measurement to reporting by single software platform
Covers basic XRPD applications, e.g. qualitative, quantitative, crystallite size, Rietveld analysis, as well as advanced analysis, e.g. X-ray reflectivity, HRXRD, pole figure and PDF
Fully automated optics alignment
Clustering analysis and Data Visualization supports various data treatments
Supports FDA 21 CFR Part 11 data integrity
Network dongle provides software licenses maximum 10 PCs
Guidance function recommends system configuration and measurement conditions for best results
Advanced data visualization to display and navigate X-ray data with additional dimensions, such as XY mapping positions, temperature, humidity, charge/discharge state
Component sensors for checking and ensuring the correct system configuration

SmartLab Studio II Videos

SmartLab Studio II Options

The following accessories are available for this product:

XRD Measurement Plugin

A measurement package built by experts in XRD

Powder XRD Plugin

The state-of-the-art consolidated powder X-ray analysis package

AI Plugin - Phase Identification

This module can improve your productivity when you often analyze similar samples but have difficulty identifying minor phases such as impurities, foreign materials, etc.

AI Plugin - XRD Component Decomposition

This AI-powered module can separate an X-ray diffraction (XRD) pattern of an unknown mixture into multiple components and quantify each phase.

AI Plugin - X-ray Reflectivity Analysis

This AI-powered module can suggest how to adjust your simulation model to improve the quality and accuracy of X-ray reflectivity (XRR) analysis.

PDF Analysis

The PDF can extract information about interatomic distances and coordination numbers from scattering patterns independent of the crystallinity of the material.

RMC Method

The RMC method provides real space information as follows: revised structure mode, partial correlation, angular histogram.

Total Scattering Measurement

The Total Scattering Measurement uses not only diffraction peaks but also diffuse scattering, which is treated as background in powder XRD measurement, for analysis.

Measurement and PDF plug-in

An integrated software package for X-ray analysis from measurement to analysis.

XRR Plugin

X-ray reflectivity analysis software for a wide range of applications, from film thickness to detailed multilayer structure analysis

Stress Plugin

Stress plugin for a variety of purposes from QC to R&D

HRXRD Plugin

An integrated reciprocal lattice map and high-resolution rocking curve plugin for epitaxial films analysis

Texture Plugin

Texture plugin is designed to analyze the ODF (Orientation Distribution Function) from pole figure data measured with 0D or 2D detectors.

MRSAXS Plugin

Determination of particle/pore size distribution ranging from nano- to submicron order

PDF Plugin

The PDF plugin can calculate RDF (radial distribution function) and PDF (pair distribution function) with Fourier transform of S(Q) (Structure factor).

Data Visualization Plugin

The Data Visualization plugin efficiently processes thousands of data sets collected by operando measurements such as temperature-controlled measurements and displays the results in an easy-to-understand manner.

XRD-DSC Plugin

User-friendly tool for simultaneous XRD-DSC measurement

EasyX Plugin

Screening/plugin for quality control affording easy measurement, automated analysis and visualization of analysis result

SmartLab Studio II Application Notes

The following application notes are relevant to this product

SmartLab Studio II Resources

Webinars

X-ray Diffraction Measurements for Battery Research Watch the Recording
Pair Distribution Function (PDF) Analysis for Everyday Battery Analysis Watch the Recording
How to Run in Operando XRD Experiments Watch the Recording
When to Use XRD and How to Set Up Experiments for Li-ion Battery Research Watch the Recording
Simultaneous XRD-DSC – The sum Is Much Greater than the Parts Watch the Recording
Component Analysis and Standardless Quantitative Analysis for Pharmaceutical Applications Watch the Recording
In-Depth Overview of the Use of X-ray Diffraction (XRD) in the Investigation of Asbestos and Respirable Silica Watch the Recording
Curved Image Plate for Rapid Laboratory-based X-ray Total Scattering Measurements: Applications to PDF Analysis Watch the Recording
Powder X-ray Diffraction (XRD) for Pharmaceuticals Watch the Recording
Dissolution Rate Enhancement of Poorly Water Soluble Drugs - Role in XRPD in the Pharmaceutical Formaulation Development Watch the Recording
Combined XRD-DSC for Pharmaceuticals Watch the Recording
Introduction of Part 11 Compliant Features in SmartLab Studio II Watch the Recording
On the Diffraction Line Profiles in the Rietveld Method Watch the Recording

Rigaku Journal articles

adobeTotal X-ray Scattering (TXS) Plugin Read the Article
adobeQuantification analysis of cement materials Read the Article
adobeSmartLab Studio II Data Visualization plugin —Analysis examples of micro area XY mapping using CBO-μ— Read the Article
adobeReal-time analysis and display function using SmartLab Studio II Read the Article
adobeIntegrated X-ray diffraction software -- SmartLab Studio II Read the Article
adobeIntegrated X-ray diffraction software / SmartLab Studio II Read the Article

Publications

Visit the Publication Library to access articles relevant to SmartLab Studio II

SmartLab Studio II Events

Learn more about our products at these events

  • ChemUK 2025
    May 20 2025 - May 21 2025
    Birmingham, UK
  • EMRS Spring Meeting 2025
    May 25 2025 - May 29 2025
    Strasbourg, France
  • Rigaku Symposium at Yale
    May 27 2025 - May 28 2025
    New Haven, CT
  • Pharma - Manufacturing and QC
    June 17 2025 - June 17 2025
    Webinar
  • Rigaku Battery Forum 2025
    June 23 2025 - June 24 2025
    Neu-Isenburg, Germany
  • 2025 European School on Magnetism
    June 29 2025 - July 10 2025
    Cambridge, UK
  • The Advanced Materials Show and The Advanced Ceramics Show 2025
    July 8 2025 - July 9 2025
    Birmingham, UK
  • AIC 2025 congress
    September 1 2025 - September 4 2025
    Florence Italy
  • FEMS Euromat 2025
    September 13 2025 - September 17 2025
    Granada, Spain
  • EMRS Fall meeting 2025
    September 14 2025 - September 17 2025
    Warsaw, Poland
  • EuroMOF 2025
    September 20 2025 - September 23 2025
    Crete, Greece
  • Gulf Coast Conference 2025
    October 13 2025 - October 14 2025
    Galveston, TX, United States
  • ICMM 2025 2025
    October 26 2025 - October 30 2025
    Bordeaux, France
  • CONGRESO GEOLÓGICO DE ESPAÑA 2025
    November 4 2025 - November 6 2025
    Zaragoza, Spain
  • Rayons X et Matière 2025
    November 17 2025 - November 20 2025
    Orleans, France

SmartLab Studio II Training

Upcoming training sessions

  • SmartLab training (EMEA)
    June 29 2025 - July 3 2025
    Please contact ECOE@rigaku.com
    Neu-Isenburg, Germany
    SmartLab training (EMEA)
  • SmartLab training (EMEA)
    October 19 2025 - October 23 2025
    Please contact ECOE@rigaku.com
    Neu-Isenburg, Germany
    SmartLab training (EMEA)

Contact Us

Whether you're interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.