SmartLab Studio II

    Software Suite for Rigaku X-ray Diffractometers

    Integrates user privileges, measurements, analyses, data visualization and reporting

    SmartLab Studio II is a new Windows-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components.

    Now Artifical Intelligence Powered

    SmartLab Studio II Overview

    Just one click switches from measurement to analysis. Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop by selecting an appropriate layout. The software provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc.

    Announcing: Total scattering measurements and PDF analysis

    The reverse Monte-Carlo (RMC) option has been added to the SmartLab Studio II PDF plug-in.  Accordingly, detailed information about total scattering measurements and PDF analysis is now available on a web page. For details, please refer to the following link: Total Scattering Measurements and PDF Analysis

    SmartLab Studio II Features

    Seamless operations from measurement to reporting by single software platform
    Covers basic XRPD applications, e.g. qualitative, quantitative, crystallite size, Rietveld analysis, as well as advanced analysis, e.g. X-ray reflectivity, HRXRD, pole figure and PDF
    Clustering analysis and Data Visualization supports various data treatments
    Supports FDA 21 CFR Part 11 data integrity
    Network dongle provides software licenses maximum 10 PCs

    SmartLab Studio II Videos

    SmartLab Studio II Options

    The following accessories are available for this product:

    XRD Measurement Plugin

    A measurement package built by experts in XRD

    Powder XRD Plugin

    The state-of-the-art consolidated powder X-ray analysis package

    AI Plugin - Phase Identification

    This module can improve your productivity when you often analyze similar samples but have difficulty identifying minor phases such as impurities, foreign materials, etc.

    AI Plugin - XRD Component Decomposition

    This AI-powered module can separate an X-ray diffraction (XRD) pattern of an unknown mixture into multiple components and quantify each phase.

    AI Plugin - X-ray Reflectivity Analysis

    This AI-powered module can suggest how to adjust your simulation model to improve the quality and accuracy of X-ray reflectivity (XRR) analysis.

    PDF Analysis

    The PDF can extract information about interatomic distances and coordination numbers from scattering patterns independent of the crystallinity of the material.

    RMC Method

    The RMC method provides real space information as follows: revised structure mode, partial correlation, angular histogram.

    Total Scattering Measurement

    The Total Scattering Measurement uses not only diffraction peaks but also diffuse scattering, which is treated as background in powder XRD measurement, for analysis.

    Measurement and PDF plug-in

    An integrated software package for X-ray analysis from measurement to analysis.

    XRR Plugin

    X-ray reflectivity analysis software for a wide range of applications, from film thickness to detailed multilayer structure analysis

    Stress Plugin

    Stress plugin for a variety of purposes from QC to R&D

    HRXRD Plugin

    An integrated reciprocal lattice map and high-resolution rocking curve plugin for epitaxial films analysis

    Texture Plugin

    Texture plugin is designed to analyze the ODF (Orientation Distribution Function) from pole figure data measured with 0D or 2D detectors.

    MRSAXS Plugin

    Determination of particle/pore size distribution ranging from nano- to submicron order

    PDF Plugin

    The PDF plugin can calculate RDF (radial distribution function) and PDF (pair distribution function) with Fourier transform of S(Q) (Structure factor).

    Data Visualization Plugin

    The Data Visualization plugin efficiently processes thousands of data sets collected by operando measurements such as temperature-controlled measurements and displays the results in an easy-to-understand manner.

    XRD-DSC Plugin

    User-friendly tool for simultaneous XRD-DSC measurement

    EasyX Plugin

    Screening/plugin for quality control affording easy measurement, automated analysis and visualization of analysis result

    SmartLab Studio II Application Notes

    The following application notes are relevant to this product

    SmartLab Studio II Resources


    X-ray Diffraction Measurements for Battery Research Watch the Recording
    Pair Distribution Function (PDF) Analysis for Everyday Battery Analysis Watch the Recording
    How to Run in Operando XRD Experiments Watch the Recording
    When to Use XRD and How to Set Up Experiments for Li-ion Battery Research Watch the Recording
    Simultaneous XRD-DSC – The sum Is Much Greater than the Parts Watch the Recording
    Component Analysis and Standardless Quantitative Analysis for Pharmaceutical Applications Watch the Recording
    In-Depth Overview of the Use of X-ray Diffraction (XRD) in the Investigation of Asbestos and Respirable Silica Watch the Recording
    Curved Image Plate for Rapid Laboratory-based X-ray Total Scattering Measurements: Applications to PDF Analysis Watch the Recording
    Powder X-ray Diffraction (XRD) for Pharmaceuticals Watch the Recording
    Dissolution Rate Enhancement of Poorly Water Soluble Drugs - Role in XRPD in the Pharmaceutical Formaulation Development Watch the Recording
    Combined XRD-DSC for Pharmaceuticals Watch the Recording
    Introduction of Part 11 Compliant Features in SmartLab Studio II Watch the Recording
    On the Diffraction Line Profiles in the Rietveld Method Watch the Recording

    Rigaku Journal articles

    adobeTotal X-ray Scattering (TXS) Plugin Read the Article
    adobeQuantification analysis of cement materials Read the Article
    adobeSmartLab Studio II Data Visualization plugin —Analysis examples of micro area XY mapping using CBO-μ— Read the Article
    adobeReal-time analysis and display function using SmartLab Studio II Read the Article
    adobeIntegrated X-ray diffraction software -- SmartLab Studio II Read the Article
    adobeIntegrated X-ray diffraction software / SmartLab Studio II Read the Article


    Visit the Publication Library to access articles relevant to SmartLab Studio II

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