SmartLab Studio II
Software Suite for Rigaku X-ray Diffractometers
Integrates user privileges, measurements, analyses, data visualization and reporting
SmartLab Studio II is a new Windows-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components.
Now Artifical Intelligence Powered
Supported by LabLinc Studio
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SmartLab Studio II Overview
Expert XRD results. No expertise required.
SmartLab Studio II (SLS II) is the automation engine that powers the SmartLab multipurpose X-ray diffractometer. It transforms how you interact with XRD by guiding users in selecting the optimum configuration, aligning optics, and recommending best measurement conditions.
With SLS II, you don’t need to memorize complicated settings or worry about system alignment. The software’s built-in Guidance wizard asks what you want to measure and configures everything for you. It checks the current setup using intelligent sensors, suggests any necessary changes, automatically aligns the optics and sample, and starts collecting high-quality data—all with minimal input.
SLS II brings together automatic alignment, guided setup, and advanced data visualization into a single platform. It’s the key to making XRD faster, easier, and more accessible for every user in your lab.
Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop. Just one click switches from measurement to SLS II analysis modules with a simple flow-bar interface that will guide users through the analysis and reporting process. A wide variety of applications are available, including phase identification, reflectivity, residual stress, reciprocal space mapping, crystallite size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, in-situ or operando, and cluster data analyses. Its comprehensive data visualization tools make both the data analysis and reporting less complicated.
Announcing: Total scattering measurements and PDF analysis
The reverse Monte-Carlo (RMC) option has been added to the SmartLab Studio II PDF plug-in. Accordingly, detailed information about total scattering measurements and PDF analysis is now available on a web page. For details, please refer to the following link: Total Scattering Measurements and PDF Analysis
SmartLab Studio II Features
SmartLab Studio II Videos
SmartLab Studio II Options
The following accessories are available for this product:
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AI Plugin - Phase Identification
This module can improve your productivity when you often analyze similar samples but have difficulty identifying minor phases such as impurities, foreign materials, etc.
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AI Plugin - XRD Component Decomposition
This AI-powered module can separate an X-ray diffraction (XRD) pattern of an unknown mixture into multiple components and quantify each phase.
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AI Plugin - X-ray Reflectivity Analysis
This AI-powered module can suggest how to adjust your simulation model to improve the quality and accuracy of X-ray reflectivity (XRR) analysis.
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PDF Analysis
The PDF can extract information about interatomic distances and coordination numbers from scattering patterns independent of the crystallinity of the material.
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RMC Method
The RMC method provides real space information as follows: revised structure mode, partial correlation, angular histogram.
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Total Scattering Measurement
The Total Scattering Measurement uses not only diffraction peaks but also diffuse scattering, which is treated as background in powder XRD measurement, for analysis.
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Measurement and PDF plug-in
An integrated software package for X-ray analysis from measurement to analysis.
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XRR Plugin
X-ray reflectivity analysis software for a wide range of applications, from film thickness to detailed multilayer structure analysis
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HRXRD Plugin
An integrated reciprocal lattice map and high-resolution rocking curve plugin for epitaxial films analysis
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Texture Plugin
Texture plugin is designed to analyze the ODF (Orientation Distribution Function) from pole figure data measured with 0D or 2D detectors.
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MRSAXS Plugin
Determination of particle/pore size distribution ranging from nano- to submicron order
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PDF Plugin
The PDF plugin can calculate RDF (radial distribution function) and PDF (pair distribution function) with Fourier transform of S(Q) (Structure factor).
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Data Visualization Plugin
The Data Visualization plugin efficiently processes thousands of data sets collected by operando measurements such as temperature-controlled measurements and displays the results in an easy-to-understand manner.
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EasyX Plugin
Screening/plugin for quality control affording easy measurement, automated analysis and visualization of analysis result
SmartLab Studio II Application Notes
The following application notes are relevant to this product
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B-XRD2037 - Evaluation of Native Oxide Film on Larger-diameter Silicon Substrates Using High-precision Thin Film XRD for Advanced Research
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B-XRD1162 - In-situ Evaluation of Orientation in Polymer Films at Different Draw Ratios by Wide Angle X-ray Scattering
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B-XRD1169 - Temperature-dependent Analysis of Polymer Crystallization Behavior Using High-speed Time-resolved Measurement
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B-XRD1165 - Phase Identification and Quantitative Analysis of Iron Ore by X-ray Diffraction
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XRD1014 - Ab-initio Crystal Structure Determination of a Cu-MOF Using Powder Diffraction Data Obtained from a Benchtop X-ray Diffractometer
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XRD2001 - Orientation and Residual Stress Evaluation in Metal Thin Films
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XRD1161 - MiniFlex XpC for Clinker Application
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XRD1160 - Fast Analysis of Mineralogical Phases in Blended Cements using Miniflex XpC
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PHRM0002 - In-Situ DSC-Humidity PXRD Analysis for Pharmaceuticals
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BATT0002 - Battery Material Characterization
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BATT0001 - Battery Material Development
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B-XRD1155 - Detection of trace components in battery cathode materials using a seamless pixel array detector
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B-XRD1148 - Composition ratio classification of ternary cathode material by cluster analysis
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B-XRD1143 - Verifying the Validity of Crystallite Sizes Determined by the FP Method
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B-XRD1129 - Variable Humidity Measurement of a Drug Substance using XRD-DSC and a Humidity Controller
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B-XRD1109 - Structure Determination of Ferroelectric Nano-powder by PDF Analysis
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B-XRD1131 - Structural Characterization of Zeolite by PDF Analysis
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B-XRD1136 - Structural Characterization of Zeolite by Electron Density Analysis
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B-XRD1112 - Structural Analysis of Amorphous Silica by PDF Analysis
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B-XRD3001 - Stress Distribution of a Shot Peened Coil Spring
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B-XRD1123 - Simultaneous Operando XRD Measurement for Positive and Negative Electrode Materials
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B-XRD1076 - Rietveld Quantitative Analysis of Trace Components in Cement
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B-XRD1080 - Rietveld Analysis of Battery Material using a Mo Source
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B-XRD1118 - Quick Pole Figure Measurement of a Metal Material using 2DD
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B-XRD1119 - Quantitative Characterization of Polymer film by Orientation Function
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B-XRD1081 - Quantitative Analysis of Polymorphic Impurities in a Drug Substance by the Calibration Method
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B-XRD1120 - Quantitative Analysis of Pharmaceutical Polymorphic Forms via the DD Method
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B-XRD1115 - Quantitative Analysis of γ-Al₂O₃ by the DD Method
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B-XRD1132 - Quantitative Analysis of Glass with the DD Method
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B-XRD1142 - Quantitative Analysis of Crystal Polymorphs by the DD Method
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B-XRD1093 - Quantitative Analysis of Amorphous Components in Cement
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B-XRD1001 - Quantitative Analysis of a 4-component Sample
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B-XRD1111 - Quantitative Analysis of 3-component Sample by DD method
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B-XRD1125 - Quantification of the Taste of Salt by DD (Direct Derivation) Method
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B-XRD1146 - Quantification of Blast Furnace Slag by Rietveld Refinement using Reference Intensity Ratio
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B-XRD1002 - Quantification of a 4-component Sample using RIR method
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B-XRD1043 - Powder Crystal Structure of Organic Crystals
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B-XRD1121 - Phase Identification of Mixed Powder by Real-time Analysis
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B-XRD2023 - Phase Identification of an Organic Thin Film by GIWAXS Measurement with a 2D detector
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B-XRD1103 - Phase Identification of a Coarse-grained Trace Component in a Mineral Powder using 2D XRD
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B-XRD2020 - Phase ID and Orientation Analysis for Thin Film SOFC Material using 2DD
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B-XRD1137 - Phase ID Analysis of Micro-impurities on the Surface of a Tablet by Micro-area XRD Measurements
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B-XRD1021 - Phase Changes of Pharmaceuticals as a Function of Temperature and Humidity
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B-XRD1110 - Particle Size Distribution Analysis of Ferroelectric Nanopowder by USAXS
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B-XRD1102 - Particle Size / Distribution of Pigment Ink by USAXS
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B-XRD1030 - Particle Diameter Distribution of Gold Nanoparticles
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B-XRD2009 - Orientation Analysis of Organic Thin Film on Single Crystal Sub by In-plane XRD
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B-XRD1124 - Operando Transmission XRD Measurement of All-solid-state Lithium-ion Battery using Ag Source
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B-XRD2028 - Off-normal Fiber Texture Analysis by Pole Figure Measurement
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B-XRD1133 - Observation of Phase Transition Behavior of Pharmaceutical Materials with a Benchtop XRD System
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B-XRD2032 - Observation of Orientation State of Polypropylene Film Products by 2D-GIWAXS Measurement
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B-XRD1020 - Observation of Dehydration Process of Hydrate by XRD-DSC
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B-XRD1128 - Observation of Dehydration Behavior of a Drug Substance using TG-DTA and XRD-DSC
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B-XRD1026 - Observation of Crystallization Behavior of Ionic Liquids by XRD-DSC
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B-XRD1135 - Observation of Butter Crystal by Simultaneous XRD-DSC Measurement
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B-XRD1060 - MiniFlex Measurement of Trace Samples
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B-XRD1089 - Micro-area Mapping Measurement of Printed Circuit Boards
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B-XRD1023 - Measurement of Pseudo-polymorph Impurities in Tablets
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B-XRD1063 - Measurement of a Film Sample
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B-XRD1107 - Material Characterization by PDF and RDF Analysis
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B-XRD1114 - LOQ of Trace Impurities in API by the DD Method
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XRD1003 - How to Evaluate Solid Pharmaceutical Drugs (3): Confirming Hydrates
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XRD1002 - How to Evaluate Solid Pharmaceutical Drugs (2): Confirming the Presence/absence of Amorphous Substances
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XRD1001 - How to Evaluate Solid Pharmaceutical Drugs (1): Confirming the crystal form of an API
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B-XRD1101 - High-T analysis - MiniFlex with HyPix-400 MF / BTS 500
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B-XRD1105 - High-speed in-situ Measurement of Melting Process of Metal
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B-XRD1147 - High-precision Quantitative Analysis of Clinker Mineral Polymorphs by Rietveld Refinement
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B-XRD2021 - High-speed RSM of an Epitaxial Film by 1D Detection Mode
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B-XRD2024 - High-speed RSM of a III-nitride Epitaxial Film by 1D Detection Mode
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B-XRD2030 - Evaluation of Uniformity of Thin Film Thickness by X-ray Reflectivity Mapping
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B-XRD2027 - Evaluation of Uniformity of a Single CrystalSubstrate by Rocking Curve Measurement
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B-XRD1122 - Evaluation of the Crystallinity of a Carious Tooth using X-ray Diffraction
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B-XRD3005 - Evaluation of Residual Stress of Thin Films by GI-XRD and the Multiple hkl Method
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B-XRD1113 - Evaluation of Oxidation State by the BVS Method
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B-XRD1150 - Evaluation of Graphitization Degree of Lithium-ion Battery Carbon Anode Material by X-ray Diffractometry
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B-XRD1104 - Evaluation of Grain Condition and Orientation of Cemented carbide using 2D XRD
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B-XRD2031 - Evaluation of Curvature of a Single Crystal Substrate by Rocking Curve Measurement
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B-XRD1078 - Evaluation of Crystallite Size and Pore Size distribution of Fuel Cell Materials
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B-XRD1149 - Evaluation of Barium Titanate Polymorphs by Rietveld Analysis
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B-XRD1108 - Direct Observation of Melting and Crystallization of Fresh Cream
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B-XRD1126 - Crystallization of Chocolate Observed by XRD-DSC
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B-XRD1018 - Crystallite Size Distribution of Zinc Oxide Nanoparticles
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B-XRD1072 - Crystallite Size Analysis Analysis of a Microvolume of Metallic Nanoparticles with a Benchtop X-ray Diffractometer
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B-XRD1071 - Crystallite Size Analysis of a Catalyst Material by the Scherrer Method
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B-XRD1035 - Crystal Structure Analysis of a Powder Sample of Pharmaceutical Cocrystals by the Rietveld Method
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B-XRD2006 - Crystal Orientation Evaluation of Epitaxial Film and Ultrathin Buffer Layers by In-plane Reciprocal Space Mapping
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B-XRD1014 - Crystal Orientation Analysis of Rolled Sheet Material by Pole Figure Measurement
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B-XRD2022 - Crystal Defect Analysis by X-ray Reflection Topography
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B-XRD1139 - Calculation of Molecular Stacking Spacing of Copper Phthalocyanine using PDF Analysis
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B-XRD2025 - Analysis of Uniaxially Oriented Film by Wide-range RSM
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B-XRD2026 - Analysis of Epitaxial Films on In-plane Anisotropic Substrates by Wide-Range RSM
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B-XRD1141 - Observation of time-dependent hydration reaction by X-ray diffractometry
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B-XRD1140 - Accurate and Highly Precise Quantitative Analysis of Cement Samples using Rietveld Refinement
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B-XRD1011 - Temperature Dependence of a Lattice Constant
SmartLab Studio II Resources
Webinars
Visit the Webinar resource page to access Webinars relevant to SmartLab Studio II
Rigaku Journal articles
Visit the Rigaku Journal resource page to access articles relevant to SmartLab Studio II
Publications
Visit the Publication Library to access articles relevant to SmartLab Studio II
SmartLab Studio II Events
Learn more about our products at these events
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EventDatesLocationEvent website
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36th International Conference on Diamond and Carbon MaterialsAugust 30 2026 - September 3 2026San Sebastian, Spain
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DRIP21 - 21st International Conference on Defects Recognition, Imaging and Physics in SemiconductorsAugust 30 2026 - September 3 2026Warsaw, Poland
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Norwegian X-ray conference 2026September 7 2026 - September 9 2026Fevik, Norway
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17th Pannonian International Symposium on CatalysisSeptember 7 2026 - September 11 2026Malá Morávka, Czech Republic
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101. DKG Jahrestagung / KERAMIK 2026'September 14 2026 - September 16 2026Augsburg, Germany
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[MEET THE EXPERT] Implants 2026September 15 2026 - September 15 2026Solothurn, Switzerland
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XTOP 2026September 21 2026 - September 25 2026Karlsruhe, Germany
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RECIPROCSSeptember 28 2026 - October 9 2026Angers, France
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SFEL school XRD student trainingSeptember 28 2026 - October 2 2026Liptov, Slovakia
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26. Norddeutsches Doktorandenkolloqium (NDDK) der Anorganischen ChemieSeptember 28 2026 - September 29 2026Göttingen, Germany
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MS&T 2026October 4 2026 - October 7 2026Pittsburgh, PA, USA
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GSA 2026October 11 2026 - October 14 2026Denver, CO, USA
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Battery Show 2026October 12 2026 - October 15 2026Detroit, MI, USA
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Gulf Coast Conference (GCC) 2026October 13 2026 - October 15 2026Galveston, TX, USA
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AAPS PharmSci 360 - 2026October 25 2026 - October 28 2026New Orleans, LA, USA
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Conférence GDR MATEPINovember 2 2026 - November 6 2026Nice, France
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SERMACS 2026November 4 2026 - November 7 2026Memphis, TN, USA
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34th Leoben-Conference on Polymer Engineering and ScienceNovember 5 2026 - November 6 2026Leoben, Austria
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IWN2026（International Workshop on Nitride Semiconductors 2026）November 8 2026 - November 13 2026Kumamoto, Japan
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Eastern Analytical Symposium (EAS) 2026November 16 2026 - November 18 2026New Jersey
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MATERIAUX 2026November 16 2026 - November 20 2026Grenoble, France
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German Epitaxy WorkshopNovember 25 2026 - November 27 2026Freiburg, Germany
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MRS Fall 2026November 29 2026 - December 4 2026Boston, MA, USA
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Advanced Automotive Battery Conf 2026December 8 2026 - December 11 2026Las Vegas, NV, USA
SmartLab Studio II Training
Upcoming training sessions
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TitleDatesCostLocationNotesCourse outlineRegistration form
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SmartLab training (EMEA)October 18 2026 - October 22 2026Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)March 7 2027 - March 11 2027Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)June 27 2027 - July 1 2027Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)October 17 2027 - October 21 2027Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
Contact Us
Whether you're interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.