X-ray Diffraction & Scattering

X-ray diffraction (XRD) is a versatile scientific technique widely used for analyzing powdered materials, offering insights into their, phase composition, and crystallite size. By analyzing the positions and intensities of diffraction peaks, researchers can determine the lattice parameters, crystal structure, and phase composition of the material. XRD is also employed in stress analysis, where changes in lattice spacing due to mechanical stress or strain are detected as shifts in diffraction peak positions, enabling the quantification of internal stresses within the material.

Small-angle X-ray scattering (SAXS) is a specialized XRD technique used to study the size, shape, and internal structure of nanoscale objects or features within a powdered material. By measuring the scattering of X-rays at small angles, SAXS provides information about the size distribution, morphology, and arrangement of nanoparticles, pores, or other nanostructures present in the sample.

X-ray diffraction plays a crucial role in materials science, metallurgy, geology, and pharmaceutical research, facilitating the characterization and development of advanced materials with tailored properties.