XTRAIA CD-3010G
Grazing Incidence X-ray CD Metrology Tool
GISAXS for CD measurements, XRR for thickness, density, and roughness.
For up to 300 mm wafers.

XTRAIA CD-3010G Specifications
Technique | Small-angle X-ray scattering - grazing-incidence mode (GISAXS) X-ray reflectometry (XRR) |
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Benefits | Critical dimension measurements of shallow, repeating structures | |
X-ray source | Sealed tube, Cu Ka (8.04 KeV) | |
X-ray optics | Multilayer mirror optics | |
X-ray detector | 2D detector | |
Attributes | Patterned wafer metrology For periodic fine 3D shape For line & space, dot or hole structures Shallow hole/pillar, resist, mask pattern, cell area of memory devices, FinFET/GAA |
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Features | Patterned recognition and full-wafer mapping | |
Options | GEM300 software, E84/OHT support | |
Dimensions | 1865(W) × 3700(D) × 2115(H) mm, 2965 kg (with load port) | |
Measurement targets | GISAXS: Pitch, CD, height, SWA (side wall angle), RT (round top), RB (round bottom), line width distribution, pitch distribution, height distribution XRR: Thickness, density, and roughness. |
XTRAIA CD-3010G Events
Learn more about our products at these events
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EventDatesLocationEvent website
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SEMICON SEAMay 19 2025 - May 21 2025Singapore
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EMRS Spring Meeting 2025May 25 2025 - May 29 2025Strasbourg, France
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Leti Innovation Days 2025June 24 2025 - June 26 2025Grenoble, France
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SOFC-XIXJuly 12 2025 - July 17 2025Stockholm, Sweden
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JSAP Autumn EXPOSeptember 6 2025 - September 9 2025Nagoya, Japan
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The 86th JSAP Autumn Meeting 2025September 6 2025 - September 9 2025Tokyo, Japan
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SEMICON TaiwanSeptember 9 2025 - September 11 2025Taipei, Taiwan
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EMRS Fall meeting 2025September 14 2025 - September 17 2025Warsaw, Poland
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International Conference on Silicon Carbide and Related Materials (ICSCRM 2025)September 15 2025 - September 18 2025Busan, Korea
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SEMICON JapanDecember 1 2025 - December 2 2025Tokyo, Japan

Contact Us
Whether you are interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.