Understanding Semiconductors
Episode 12
Modern metrology from Lab to Fab by Rigaku
A podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.
In this episode: Semiconductor technology and geopolitics
Join Markus Kuhn for this episode of Understanding Semiconductors with Chris Miller, the historian behind Chip War: The Fight For the World's Most Critical Technology. This conversation delves deep into the world of semiconductors as these two experts dissect how technology, geopolitics, supply chain, and resources play a role in semiconductor development and manufacturing.
Explore:
- Semiconductor technology and geopolitics
- The bifurcation of the development and fabrication of semiconductors
- Global tech supply chain
- Where the technology and politics of semiconductors are headed next
Visit our LinkedIn Semiconductor Metrology Solutions Showcase
Contact Markus Kuhn on LinkedIn for any potential guest requests or episode ideas.
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Host: Markus Kuhn
Ph.D. in Chemistry, University of Western Ontario, Canada BS Honors, University of Western Ontario, Canada. Markus is a semiconductor technology expert with a proven track record in developing, managing, and implementing novel metrology strategies and programs in support of advanced semiconductor process and architectural technology development. During a 25-year career with Intel and Digital Equipment Corporation, Markus was responsible for the development and implementation of a broad range of analytical capabilities to help meet semiconductor technology goals and was a key technical contributor to Intel's breakthrough strain, high K/metal gate, FinFET, and advanced memory programs. Currently, he is a Senior Director for Semiconductor Technology and a Fellow for Rigaku Corporation. His interests include the advancement of analytical capabilities for nanoscale devices, and he has a broader interest in the synergies between analytical characterization methods, machine learning, and process metrology to help enable emerging nanoscale device technologies. He has published 100+ refereed papers and holds 30+ patents relating to semiconductor technology. 
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