Understanding Semiconductors
Episode 11
Modern metrology from Lab to Fab by Rigaku
A podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.
In this episode: Filling the gap in semiconductors: How to nurture ideas into products
This mini-episode is taken from episode 2, how the semiconductor industry can regain the hearts and minds of innovators; in that episode, markus spoke with Todd Younkin, the President, and CEO at Semiconductor Research Corporation (SRC).
They discuss the concept of the "valley of death," where innovative ideas get stuck in the middle between research and industry. They also touch on the need for a more continuous and fluid pipeline between basic research, applied research, and early development to create a technology advantage for the US and other like-minded nations. This episode provides a fascinating insight into the world of semiconductors and the vital role played by organizations such as SRC in driving innovation forward.
Visit our LinkedIn Semiconductor Metrology Solutions Showcase
Contact Markus Kuhn on LinkedIn for any potential guest requests or episode ideas.
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Host: Markus Kuhn
Ph.D. in Chemistry, University of Western Ontario, Canada BS Honors, University of Western Ontario, Canada. Markus is a semiconductor technology expert with a proven track record in developing, managing, and implementing novel metrology strategies and programs in support of advanced semiconductor process and architectural technology development. During a 25-year career with Intel and Digital Equipment Corporation, Markus was responsible for the development and implementation of a broad range of analytical capabilities to help meet semiconductor technology goals and was a key technical contributor to Intel's breakthrough strain, high K/metal gate, FinFET, and advanced memory programs. Currently, he is a Senior Director for Semiconductor Technology and a Fellow for Rigaku Corporation. His interests include the advancement of analytical capabilities for nanoscale devices, and he has a broader interest in the synergies between analytical characterization methods, machine learning, and process metrology to help enable emerging nanoscale device technologies. He has published 100+ refereed papers and holds 30+ patents relating to semiconductor technology. 
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