Understanding Semiconductors
Episode 10
Modern metrology from Lab to Fab by Rigaku
A podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.
In this episode: Understanding transistor architecture and scaling with Suman Datta
This mini-episode is taken from episode 8, in which Markus spoke with Suman Datta, Joseph M. Pettit Chair Professor in Advanced Computing at Georgia Tech, about the future of transistors in the industry. In this clip, Suman explains how FinFETs are currently the workhorse of the industry and how the transition to nanosheet transistors could lead to better performance and lower operating voltage.
He also touches upon the challenges of delivering power to these transistors and how backside power delivery and conversion on the chip itself could mitigate these issues. Suman's passion for transistors extends beyond just the channel, gate stack, and other components; he is also exploring alternative transistors, efficient power delivery networks, and low-temperature processed transistors for integration in interconnects and memory elements.
Suman is the Joseph M Pettit Chair of Advanced Computing and Georgia Research Alliance (GRA), an Eminent Scholar, and a Professor in the School of Electrical & Computer Engineering at Georgia Tech. His research group focuses on semiconductor devices that enable new computing models such as in-memory computing, brain-inspired computing, cryogenic computing, resilient computing, etc. (source)
Visit our LinkedIn Semiconductor Metrology Solutions Showcase
Contact Markus Kuhn on LinkedIn for any potential guest requests or episode ideas.
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Host: Markus Kuhn
Ph.D. in Chemistry, University of Western Ontario, Canada BS Honors, University of Western Ontario, Canada. Markus is a semiconductor technology expert with a proven track record in developing, managing, and implementing novel metrology strategies and programs in support of advanced semiconductor process and architectural technology development. During a 25-year career with Intel and Digital Equipment Corporation, Markus was responsible for the development and implementation of a broad range of analytical capabilities to help meet semiconductor technology goals and was a key technical contributor to Intel's breakthrough strain, high K/metal gate, FinFET, and advanced memory programs. Currently, he is a Senior Director for Semiconductor Technology and a Fellow for Rigaku Corporation. His interests include the advancement of analytical capabilities for nanoscale devices, and he has a broader interest in the synergies between analytical characterization methods, machine learning, and process metrology to help enable emerging nanoscale device technologies. He has published 100+ refereed papers and holds 30+ patents relating to semiconductor technology. 
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