Understanding Semiconductors

Episode 8

Episode 8Modern metrology from Lab to Fab by Rigaku

A podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.

In this episode: Suman Datta on what is the next big thing in the semiconductor industry (Part 1)

Key topics

  • Suman’s career yourney
  • Today’s talent pipeline in the semiconductor industry
  • How to attract the best and brightest into electrical engineering?
  • What is the next big thing in the semiconductor industry?
  • The increasing importance of chip security, advanced bonding techniques and packaging solutions creating more complex and groundbreaking chips

Markus speaks with Suman Datta, the Joseph M Pettit Chair of Advanced Computing and Georgia Research Alliance (GRA), an Eminent Scholar, and a Professor in the School of Electrical & Computer Engineering at Georgia Tech. His research group focuses on semiconductor devices that enable new computing models such as in-memory computing, brain-inspired computing, cryogenic computing, resilient computing, etc. 

Semiconductor Menu

 

Visit our LinkedIn Semiconductor Metrology Solutions Showcase

Contact Markus Kuhn on LinkedIn for any potential guest requests or episode ideas.

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Host: Markus Kuhn

Markus KuhnPh.D. in Chemistry, University of Western Ontario, Canada BS Honors, University of Western Ontario, Canada. Markus is a semiconductor technology expert with a proven track record in developing, managing, and implementing novel metrology strategies and programs in support of advanced semiconductor process and architectural technology development. During a 25-year career with Intel and Digital Equipment Corporation, Markus was responsible for the development and implementation of a broad range of analytical capabilities to help meet semiconductor technology goals and was a key technical contributor to Intel's breakthrough strain, high K/metal gate, FinFET, and advanced memory programs. Currently, he is a Senior Director for Semiconductor Technology and a Fellow for Rigaku Corporation. His interests include the advancement of analytical capabilities for nanoscale devices, and he has a broader interest in the synergies between analytical characterization methods, machine learning, and process metrology to help enable emerging nanoscale device technologies. He has published 100+ refereed papers and holds 30+ patents relating to semiconductor technology. linkedin-icon

 

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