Understanding Semiconductors
Episode 7
Modern metrology from Lab to Fab by Rigaku
A podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges.
In this episode: Dr. Yihung Lin on machine learning, big data, and open platforms: the future of metrology
Key topics
- The future of metrology
- Machine learning + big data
- How does an analytical services company value semiconductor research and manufacturing?
In this episode of Understanding Semiconductors, Markus Speaks with Dr. Yihing, Vice President of the Analytical Service Group within Covalent Metrology. Covalent Metrology is a leading supplier of cutting-edge analytical services and enterprise metrology solutions for diverse companies doing advanced material innovations.
They discuss:
- Dr. Lin’s career journey - Intel, TSMC, etc.
- Where Dr. Lin believes metrology is heading and blending that into what role metrology currently plays in semiconductor development and manufacturing
- How does big data play into the standards in the semiconductor industry?
- The current and future of metrology
Visit our LinkedIn Semiconductor Metrology Solutions Showcase
Contact Markus Kuhn on LinkedIn for any potential guest requests or episode ideas.
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Host: Markus Kuhn
Ph.D. in Chemistry, University of Western Ontario, Canada BS Honors, University of Western Ontario, Canada. Markus is a semiconductor technology expert with a proven track record in developing, managing, and implementing novel metrology strategies and programs in support of advanced semiconductor process and architectural technology development. During a 25-year career with Intel and Digital Equipment Corporation, Markus was responsible for the development and implementation of a broad range of analytical capabilities to help meet semiconductor technology goals and was a key technical contributor to Intel's breakthrough strain, high K/metal gate, FinFET, and advanced memory programs. Currently, he is a Senior Director for Semiconductor Technology and a Fellow for Rigaku Corporation. His interests include the advancement of analytical capabilities for nanoscale devices, and he has a broader interest in the synergies between analytical characterization methods, machine learning, and process metrology to help enable emerging nanoscale device technologies. He has published 100+ refereed papers and holds 30+ patents relating to semiconductor technology. 
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